Electrostatic Discharge, Electrical Overstress, and Latchup in VLSI Microelectronics

Emerging Micro - and Nanotechnologies ◽

10.5772/intechopen.89855 ◽

2020 ◽

Author(s):

Steven H. Voldman

Keyword(s):

Electrostatic Discharge ◽

Electrical Overstress

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Wiley Series in Electrostatic Discharge ( ESD ) and Electrical Overstress ( EOS )

The ESD Handbook ◽

10.1002/9781119233091.app4 ◽

2021 ◽

pp. 1055-1056

Keyword(s):

Electrostatic Discharge ◽

Electrical Overstress

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Electrical Overstress / Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347)

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) ◽

10.1109/eosesd.1998.737011 ◽

1998 ◽

Keyword(s):

Electrostatic Discharge ◽

Electrical Overstress

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Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) ◽

10.1109/eosesd.2000.890020 ◽

2000 ◽

Keyword(s):

Electrostatic Discharge ◽

Electrical Overstress

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System and Component Failure from Electrical Overstress and Electrostatic Discharge

System of System Failures ◽

10.5772/intechopen.72677 ◽

2018 ◽

Author(s):

Steven H. Voldman

Keyword(s):

Electrostatic Discharge ◽

Component Failure ◽

Electrical Overstress

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15th Annual Electrical Overstress/Electrostatic Discharge Symposium

Journal of Electrostatics ◽

10.1016/0304-3886(92)90010-q ◽

1992 ◽

Vol 29 (1) ◽

pp. 97-98

Keyword(s):

Electrostatic Discharge ◽

Electrical Overstress

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Foreword Special Section on Electrical Overstress/Electrostatic Discharge (EOS/ESD)

IEEE Transactions on Electronics Packaging Manufacturing ◽

10.1109/tepm.2005.857126 ◽

2005 ◽

Vol 28 (3) ◽

pp. 205-205 ◽

Cited By ~ 1

Author(s):

C. Russ

Keyword(s):

Electrostatic Discharge ◽

Special Section ◽

Electrical Overstress

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Electrostatic Discharge (ESD) and Electrical Overstress (EOS) — The state of the art for methods of failure analysis, and testing in components and systems

2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ◽

10.1109/ipfa.2016.7564251 ◽

2016 ◽

Author(s):

Steven H. Voldman

Keyword(s):

Failure Analysis ◽

Electrostatic Discharge ◽

State Of The Art ◽

The State ◽

Electrical Overstress

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Electrical Overstress/Electrostatic Discharge Symposium Proceedings

10.1109/eosesd.1995 ◽

1995 ◽

Keyword(s):

Electrostatic Discharge ◽

Electrical Overstress

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2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

10.1109/eos/esd36304.2015 ◽

2015 ◽

Keyword(s):

Electrostatic Discharge ◽

Electrical Overstress

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Characteristics of Tunnel Field-effect Transistors under Power-on Electrostatic Discharge and Electrical Overstress Conditions

Sensors and Materials ◽

10.18494/sam.2020.2542 ◽

2020 ◽

Vol 32 (5) ◽

pp. 1889

Author(s):

Zhaonian Yang ◽

Pan Mao ◽

Yue Zhang ◽

Ningmei Yu ◽

Juin J. Liou

Keyword(s):

Field Effect ◽

Electrostatic Discharge ◽

Field Effect Transistors ◽

Electrical Overstress

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