scholarly journals Construction of High-Precision Adiabatic Calorimeter and Thermodynamic Study on Functional Materials

2018 ◽  
Author(s):  
Zhi Cheng Tan ◽  
Quan Shi ◽  
Xin Liu
Keyword(s):  
High Precision ◽  
Functional Materials ◽  
Adiabatic Calorimeter ◽  
Thermodynamic Study

A thermodynamic study of the dimerization of cyclopentadiene

1968 ◽  
Vol 21 (7) ◽  
pp. 1789 ◽  
Author(s):  
AG Turnbull ◽  
HS Hull
Keyword(s):  
Liquid Phase ◽  
Rate Constant ◽  
Vapour Pressure ◽  
Boiling Point ◽  
Strain Energy ◽  
Order Rate Constant ◽  
Adiabatic Calorimeter ◽  
Thermodynamic Study ◽  
Heats Of Formation ◽  
Kcal Mole

The heat of dimerization of cyclopentadiene to endo-dicyciopentadiene in the liquid phase at 25� was measured in an adiabatic calorimeter to be -9.22 � 0.3 kcal/mole monomer. The rate of dimerization in the liquid phase at 25� was followed with a dilatometer and the initial second-order rate constant found to be 4.99 x 10-5. mole-l min-l. The vapour pressure of endo-dicyclopentadiene, measured by a boiling point method in the range 77.5-149.6�, gave the relation (p in torr): RInp ? 11342/T -2.6505In T + 54.7855 The standard heats of formation of solid, 31.1 � 0.5 kcal/mole, and gaseous, 42.2 � 0. 6 kcal/mole, endo-dicyclopentadiene were derived, and the strain energy and dimerization equilibria discussed.

scholarly journals Editorial for the Special Issue on Self-Assembly of Polymers

Micromachines ◽  
2019 ◽  
Vol 10 (8) ◽  
pp. 519
Author(s):  
Anna S. Vikulina ◽  
Dmitry Volodkin
Keyword(s):  
High Precision ◽  
Self Assembly ◽  
Functional Materials ◽  
The Self ◽  
Special Issue

The self-assembly of polymers is a powerful tool for producing various functional materials with a high precision from nano- to macroscale [...]

scholarly journals Holography: application to high-resolution imaging

Microscopy ◽  
2020 ◽  
Author(s):  
Takeshi Kawasaki ◽  
Yoshio Takahashi ◽  
Toshiaki Tanigaki
Keyword(s):  
High Resolution ◽  
High Precision ◽  
Functional Materials ◽  
Electron Holography ◽  
High Resolution Imaging ◽  
Nanometer Resolution ◽  
Powerful Technique ◽  
Resolution Electron ◽  
Resolution Imaging ◽  
Electron Microscopes

Abstract Electron holography was invented for correcting aberrations of the lenses of electron microscopes. It was used to observe the atomic arrangements in crystals after decades of research. Then it was combined with a hardware aberration corrector to enable high-resolution and high-precision analysis. Its applications were further extended to magnetic observations with sub-nanometer resolution. High-resolution electron holography has become a powerful technique for observing electromagnetic distributions in functional materials.

Automatic measurement of SAED patterns from asbestos minerals

1988 ◽  
Vol 46 ◽  
pp. 846-847
Author(s):  
J. C. Russ ◽  
T. Taguchi ◽  
P. M. Peters ◽  
E. Chatfield ◽  
J. C. Russ ◽  
...  
Keyword(s):  
Diffraction Pattern ◽  
High Precision ◽  
Diffraction Data ◽  
Automatic Measurement ◽  
Automatic Method ◽  
Important Method ◽  
X Ray ◽  
Integrated Intensity ◽  
Asbestiform Minerals ◽  
True Center

Conventional SAD patterns as obtained in the TEM present difficulties for identification of materials such as asbestiform minerals, although diffraction data is considered to be an important method for making this purpose. The preferred orientation of the fibers and the spotty patterns that are obtained do not readily lend themselves to measurement of the integrated intensity values for each d-spacing, and even the d-spacings may be hard to determine precisely because the true center location for the broken rings requires estimation. We have implemented an automatic method for diffraction pattern measurement to overcome these problems. It automatically locates the center of patterns with high precision, measures the radius of each ring of spots in the pattern, and integrates the density of spots in that ring. The resulting spectrum of intensity vs. radius is then used just as a conventional X-ray diffractometer scan would be, to locate peaks and produce a list of d,I values suitable for search/match comparison to known or expected phases.

On effects of non-systematic reflections on weak-beam images of partial dislocations

1991 ◽  
Vol 49 ◽  
pp. 688-689
Author(s):  
K. Z. Botros ◽  
S. S. Sheinin
Keyword(s):  
High Precision ◽  
Stacking Fault ◽  
Important Application ◽  
Stacking Fault Energy ◽  
Sharp Peak ◽  
Weak Beam ◽  
Partial Dislocations ◽  
Deviation Parameter ◽  
Beam Diffraction

The main features of weak beam images of dislocations were first described by Cockayne et al. using calculations of intensity profiles based on the kinematical and two beam dynamical theories. The feature of weak beam images which is of particular interest in this investigation is that intensity profiles exhibit a sharp peak located at a position very close to the position of the dislocation in the crystal. This property of weak beam images of dislocations has an important application in the determination of stacking fault energy of crystals. This can easily be done since the separation of the partial dislocations bounding a stacking fault ribbon can be measured with high precision, assuming of course that the weak beam relationship between the positions of the image and the dislocation is valid. In order to carry out measurements such as these in practice the specimen must be tilted to "good" weak beam diffraction conditions, which implies utilizing high values of the deviation parameter Sg.

Digital differential hysteresis iimage processing displays what the microscope acquires but the eye can't see

1995 ◽  
Vol 53 ◽  
pp. 642-643
Author(s):  
Klaus-Ruediger Peters
Keyword(s):  
Image Processing ◽  
Visual System ◽  
High Precision ◽  
Image Data ◽  
Processing Technology ◽  
Output Data ◽  
Contrast Resolution ◽  
Pixel Intensity ◽  
Data Reading ◽  
Hysteresis Properties

Differential hysteresis processing is a new image processing technology that provides a tool for the display of image data information at any level of differential contrast resolution. This includes the maximum contrast resolution of the acquisition system which may be 1,000-times higher than that of the visual system (16 bit versus 6 bit). All microscopes acquire high precision contrasts at a level of <0.01-25% of the acquisition range in 16-bit - 8-bit data, but these contrasts are mostly invisible or only partially visible even in conventionally enhanced images. The processing principle of the differential hysteresis tool is based on hysteresis properties of intensity variations within an image.Differential hysteresis image processing moves a cursor of selected intensity range (hysteresis range) along lines through the image data reading each successive pixel intensity. The midpoint of the cursor provides the output data. If the intensity value of the following pixel falls outside of the actual cursor endpoint values, then the cursor follows the data either with its top or with its bottom, but if the pixels' intensity value falls within the cursor range, then the cursor maintains its intensity value.

High Resolution Electron Microscopy of internal interfaces in layered materials

1990 ◽  
Vol 48 (4) ◽  
pp. 320-321
Author(s):  
Yoichi Ishida ◽  
Hideki Ichinose ◽  
Yutaka Takahashi ◽  
Jin-yeh Wang
Keyword(s):  
Grain Boundaries ◽  
Mirror Symmetry ◽  
Functional Materials ◽  
High Resolution Electron Microscopy ◽  
Layered Materials ◽  
Plane Boundary ◽  
Chemical Information ◽  
Layer Plane ◽  
High Tc ◽  
Cubic Metals

Layered materials draw attention in recent years in response to the world-wide drive to discover new functional materials. High-Tc superconducting oxide is one example. Internal interfaces in such layered materials differ significantly from those of cubic metals. They are often parallel to the layer of the neighboring crystals in sintered samples(layer plane boundary), while periodically ordered interfaces with the two neighboring crystals in mirror symmetry to each other are relatively rare. Consequently, the atomistic features of the interface differ significantly from those of cubic metals. In this paper grain boundaries in sintered high-Tc superconducting oxides, joined interfaces between engineering ceramics with metals, and polytype interfaces in vapor-deposited bicrystal are examined to collect atomic information of the interfaces in layered materials. The analysis proved that they are not neccessarily more complicated than that of simple grain boundaries in cubic metals. The interfaces are majorly layer plane type which is parallel to the compound layer. Secondly, chemical information is often available, which helps the interpretation of the interface atomic structure.

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