scholarly journals Simulating Contact Instability in Soft Thin Films through Finite Element Techniques

10.5772/65357 ◽  
2016 ◽  
Author(s):  
Jayati Sarkar ◽  
Hemalatha Annepu ◽  
Satish Kumar Mishra
Keyword(s):  
Thin Films ◽  
Finite Element

Extraction of the Coefficient of Thermal Expansion of Thin Films from Buckled Membranes

1998 ◽  
Vol 546 ◽  
Author(s):  
V. Ziebartl ◽  
O. Paul ◽  
H. Baltes
Keyword(s):  
Thin Films ◽  
Finite Element ◽  
Thermal Expansion ◽  
Silicon Nitride ◽  
Excellent Agreement ◽  
Energy Minimization ◽  
Coefficient Of Thermal Expansion ◽  
Temperature Dependent ◽  
Minimization Method ◽  
Energy Minimization Method

AbstractWe report a new method to measure the temperature-dependent coefficient of thermal expansion α(T) of thin films. The method exploits the temperature dependent buckling of clamped square plates. This buckling was investigated numerically using an energy minimization method and finite element simulations. Both approaches show excellent agreement even far away from simple critical buckling. The numerical results were used to extract Cα(T) = α0+α1(T−T0 ) of PECVD silicon nitride between 20° and 140°C with α0 = (1.803±0.006)×10−6°C−1, α1 = (7.5±0.5)×10−9 °C−2, and T0 = 25°C.

scholarly journals A finite element model for martensitic thin films

CALCOLO ◽  
2006 ◽  
Vol 43 (3) ◽  
pp. 197-215 ◽  
Author(s):  
Pavel Bělík ◽  
Mitchell Luskin
Keyword(s):  
Thin Films ◽  
Finite Element ◽  
Finite Element Model ◽  
Element Model

scholarly journals Correlation between nanomechanical and piezoelectric properties of thin films: An experimental and finite element study

2013 ◽  
Vol 90 ◽  
pp. 148-151 ◽  
Author(s):  
Hussein Nili ◽  
Guang Cheng ◽  
T.A. Venkatesh ◽  
Sharath Sriram ◽  
Madhu Bhaskaran
Keyword(s):  
Thin Films ◽  
Finite Element ◽  
Piezoelectric Properties ◽  
Finite Element Study ◽  
Element Study

Analytical and 3D Finite Element Study of the Deflection of an Elastic Cantilever Bilayer Plate

2010 ◽  
Vol 78 (1) ◽  
Author(s):  
M. Chekchaki ◽  
V. Lazarus ◽  
J. Frelat
Keyword(s):  
Thin Films ◽  
Finite Element ◽  
Three Dimensional ◽  
Analytical Formula ◽  
Mechanical Stresses ◽  
Linear Elastic ◽  
Wide Range ◽  
Finite Element Calculations ◽  
Analytical Formulas ◽  
Three Dimensional Elasticity

The mechanical system considered is a bilayer cantilever plate. The substrate and the film are linear elastic. The film is subjected to isotropic uniform prestresses due for instance to volume variation associated with cooling, heating, or drying. This loading yields deflection of the plate. We recall Stoney’s analytical formula linking the total mechanical stresses to this deflection. We also derive a relationship between the prestresses and the deflection. We relax Stoney’s assumption of very thin films. The analytical formulas are derived by assuming that the stress and curvature states are uniform and biaxial. To quantify the validity of these assumptions, finite element calculations of the three-dimensional elasticity problem are performed for a wide range of plate geometries, Young’s and Poisson’s moduli. One purpose is to help any user of the formulas to estimate their accuracy. In particular, we show that for very thin films, both formulas written either on the total mechanical stresses or on the prestresses, are equivalent and accurate. The error associated with the misfit between our theorical study and numerical results are also presented. For thicker films, the observed deflection is satisfactorily reproduced by the expression involving the prestresses and not the total mechanical stresses.

Hybrid spectral/finite element analysis of dynamic delamination of patterned thin films

2008 ◽  
Vol 75 (14) ◽  
pp. 4217-4233 ◽  
Author(s):  
Phuong Tran ◽  
Soma Sekhar V. Kandula ◽  
Philippe H. Geubelle ◽  
Nancy R. Sottos
Keyword(s):  
Thin Films ◽  
Finite Element Analysis ◽  
Finite Element ◽  
Element Analysis ◽  
Spectral Finite Element
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