scholarly journals Charge Collection Physical Modeling for Soft Error Rate Computational Simulation in Digital Circuits

10.5772/64277 ◽  
2016 ◽  
Author(s):  
Jean-Luc Autran ◽  
Daniela Munteanu ◽  
Soilihi Moindjie ◽  
Tarek Saad Saoud ◽  
Victor Malherbe ◽  
...  
Keyword(s):  
Error Rate ◽  
Physical Modeling ◽  
Digital Circuits ◽  
Computational Simulation ◽  
Soft Error ◽  
Charge Collection ◽  
Soft Error Rate

Modeling the impact of process and operation variations on the soft error rate of digital circuits

2017 ◽  
Vol 60 (12) ◽  
Author(s):  
Ruiqiang Song ◽  
Shuming Chen ◽  
Bin Liang ◽  
Yaqing Chi ◽  
Jianjun Chen
Keyword(s):  
Error Rate ◽  
Digital Circuits ◽  
Soft Error ◽  
Soft Error Rate ◽  
The Impact

Joint Effects of Aging and Process Variations on Soft Error Rate of Nano-Scale Digital Circuits

2020 ◽  
pp. 2150012
Author(s):  
Mohammad Sajjad Aghadadi ◽  
Mahdi Fazeli ◽  
Hakem Beitollahi
Keyword(s):  
Error Rate ◽  
Digital Circuits ◽  
Fault Injection ◽  
Process Variations ◽  
Aging Effect ◽  
Soft Error ◽  
Delay Model ◽  
Aging Effects ◽  
Soft Error Rate ◽  
Simulation Based

Soft errors have always been a concern in the design of digital circuits. As technology down-scales toward Nanometer sizes, emergence of aging effects, process variations, and Multiple Event Transients (METs) has made the soft error rate (SER) estimation of digital circuits very challenging. This paper intends to characterize the challenges by investigating the cross effects of theses issues in overall SER of a circuit. To this regard, we employ a simulation-based SER estimation approach in which the aging effect, process variations and METs are jointly considered in our fault injection process. In our simulation-based SER estimation approach, a statistical gate delay model is used. The fault injection results into ISCAS85 circuit benchmark reveal that the SER estimation without taking into account the aging effects, the process variations, and METs is significantly inaccurate.

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