scholarly journals Oxide Ceramic Functional Thin Layer Processing by Thermal and Laser Sintering of Green Layers

10.5772/53257 ◽  
2013 ◽  
Author(s):  
Guido Falk ◽  
Katrin Klein ◽  
Christoph Rivinius
Keyword(s):  
Thin Layer ◽  
Laser Sintering ◽  
Oxide Ceramic

Processing of Non-Oxide Ceramic Matrix Composites: An Overview

2006 ◽  
Vol 50 ◽  
pp. 64-74 ◽  
Author(s):  
Roger R. Naslain
Keyword(s):  
Shear Stress ◽  
Thin Layer ◽  
Ceramic Matrix Composites ◽  
Ceramic Matrix ◽  
Oxide Ceramic ◽  
Matrix Composites ◽  
The Matrix ◽  
Low Shear Stress ◽  
Compliant Material ◽  
Low Shear

Ceramic matrix composites (CMCs) comprise a fiber reinforcement embedded in a ceramic matrix, the two main constituents being bonded through an interphase, which is a thin layer of a compliant material with a low shear stress, arresting and deflecting the matrix microcracks formed under load. Non-oxide CMCs, such as C/C ; C/SiC or SiC/SiC, are fabricated from a suitable precursor of the matrix, following a gaseous (CVI-process), a liquid (PIP and RMI processes) or a slurry (SI-HPS) routes. Each of these routes is briefly depicted focusing on fundamental aspects and its advantages and drawbacks discussed. Possible extensions of the processes to new composites are suggested. Finally, a comparison of these techniques, in terms of processability and composites properties is presented.

Applications of Photoelectron Microscopy

1976 ◽  
Vol 34 ◽  
pp. 506-507
Author(s):  
William J. Baxter
Keyword(s):  
Electron Microscopy ◽  
Thermal Decomposition ◽  
Chemical Composition ◽  
Ultraviolet Radiation ◽  
Thin Layer ◽  
Edge Effects ◽  
Electron Optics ◽  
Surface Layers ◽  
Crystalline Orientation ◽  
Fluorescent Screen

In this form of electron microscopy, photoelectrons emitted from a metal by ultraviolet radiation are accelerated and imaged onto a fluorescent screen by conventional electron optics. image contrast is determined by spatial variations in the intensity of the photoemission. The dominant source of contrast is due to changes in the photoelectric work function, between surfaces of different crystalline orientation, or different chemical composition. Topographical variations produce a relatively weak contrast due to shadowing and edge effects.Since the photoelectrons originate from the surface layers (e.g. ∼5-10 nm for metals), photoelectron microscopy is surface sensitive. Thus to see the microstructure of a metal the thin layer (∼3 nm) of surface oxide must be removed, either by ion bombardment or by thermal decomposition in the vacuum of the microscope.

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