scholarly journals Irradiation Effects in Optical Fibers

10.5772/39550 ◽  
2010 ◽  
Author(s):  
Sporea Dan ◽  
Agnello Simonpietro ◽  
Gelardi Franco
Keyword(s):  
Optical Fibers ◽  
Irradiation Effects

Pulsed X-ray and /spl gamma/ rays irradiation effects on polarization-maintaining optical fibers

2004 ◽  
Vol 51 (5) ◽  
pp. 2740-2746 ◽  
Author(s):  
S. Girard ◽  
J. Keurinck ◽  
Y. Ouerdane ◽  
J.-P. Meunier ◽  
A. Boukenter ◽  
...  
Keyword(s):  
Optical Fibers ◽  
Gamma Rays ◽  
Irradiation Effects ◽  
X Ray ◽  
Polarization Maintaining

Gamma and x-ray irradiation effects on different Ge and Ge/F doped optical fibers

2015 ◽  
Vol 118 (8) ◽  
pp. 085901 ◽  
Author(s):  
A. Alessi ◽  
S. Girard ◽  
I. Reghioua ◽  
M. Fanetti ◽  
D. Di Francesca ◽  
...  
Keyword(s):  
Optical Fibers ◽  
Irradiation Effects ◽  
X Ray

Temperature, H2 loading and ultra violet irradiation effects in germanosilicate optical fibers: laser spectroscopy measurements

2001 ◽  
Vol 280 (1-3) ◽  
pp. 277-280 ◽  
Author(s):  
Heru Kuswanto ◽  
François Goutaland ◽  
Abdennacer Yahya ◽  
Aziz Boukenter ◽  
Youcef Ouerdane
Keyword(s):  
Laser Spectroscopy ◽  
Optical Fibers ◽  
Ultra Violet ◽  
Irradiation Effects

scholarly journals X-ray irradiation effects on fluorine-doped germanosilicate optical fibers

2014 ◽  
Vol 4 (8) ◽  
pp. 1683 ◽  
Author(s):  
D. Di Francesca ◽  
A. Boukenter ◽  
S. Agnello ◽  
S. Girard ◽  
A. Alessi ◽  
...  
Keyword(s):  
Optical Fibers ◽  
Irradiation Effects ◽  
X Ray

Electron Irradiation Effects in Polyoxymethylene Crystals Grown Inside Trioxane Crystals

1971 ◽  
Vol 29 ◽  
pp. 78-79
Author(s):  
J. P. Colson ◽  
D. H. Reneker
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Detailed Examination ◽  
The Other ◽  
Electron Micrograph ◽  
Irradiation Effects ◽  
Threefold Axis ◽  
Typical Sample ◽  
Polymer Crystals ◽  
Chain Axis

Polyoxymethylene (POM) crystals grow inside trioxane crystals which have been irradiated and heated to a temperature slightly below their melting point. Figure 1 shows a low magnification electron micrograph of a group of such POM crystals. Detailed examination at higher magnification showed that three distinct types of POM crystals grew in a typical sample. The three types of POM crystals were distinguished by the direction that the polymer chain axis in each crystal made with respect to the threefold axis of the trioxane crystal. These polyoxymethylene crystals were described previously.At low magnifications the three types of polymer crystals appeared as slender rods. One type had a hexagonal cross section and the other two types had rectangular cross sections, that is, they were ribbonlike.

In situ TEM studies of irradiation effects for materials improvement

1991 ◽  
Vol 49 ◽  
pp. 452-453
Author(s):  
Charles W. Allen
Keyword(s):  
Nuclear Reactor ◽  
Austenitic Stainless Steels ◽  
High Energy ◽  
Point Of View ◽  
In Situ Tem ◽  
Irradiation Effects ◽  
Tem Analysis ◽  
Radiation Induced ◽  
Analytical Tools

Irradiation effects studies employing TEMs as analytical tools have been conducted for almost as many years as materials people have done TEM, motivated largely by materials needs for nuclear reactor development. Such studies have focussed on the behavior both of nuclear fuels and of materials for other reactor components which are subjected to radiation-induced degradation. Especially in the 1950s and 60s, post-irradiation TEM analysis may have been coupled to in situ (in reactor or in pile) experiments (e.g., irradiation-induced creep experiments of austenitic stainless steels). Although necessary from a technological point of view, such experiments are difficult to instrument (measure strain dynamically, e.g.) and control (temperature, e.g.) and require months or even years to perform in a nuclear reactor or in a spallation neutron source. Consequently, methods were sought for simulation of neutroninduced radiation damage of materials, the simulations employing other forms of radiation; in the case of metals and alloys, high energy electrons and high energy ions.

Defects in Crystals

1968 ◽  
Vol 26 ◽  
pp. 244-245
Author(s):  
Kenneth R. Lawless
Keyword(s):  
Electron Microscope ◽  
Point Defects ◽  
Surface Defects ◽  
Chemical Properties ◽  
Material Point ◽  
Crystal Defects ◽  
Defects In Crystals ◽  
Irradiation Effects ◽  
Normal Lattice ◽  
Line Defects

One of the most important applications of the electron microscope in recent years has been to the observation of defects in crystals. Replica techniques have been widely utilized for many years for the observation of surface defects, but more recently the most striking use of the electron microscope has been for the direct observation of internal defects in crystals, utilizing the transmission of electrons through thin samples.Defects in crystals may be classified basically as point defects, line defects, and planar defects, all of which play an important role in determining the physical or chemical properties of a material. Point defects are of two types, either vacancies where individual atoms are missing from lattice sites, or interstitials where an atom is situated in between normal lattice sites. The so-called point defects most commonly observed are actually aggregates of either vacancies or interstitials. Details of crystal defects of this type are considered in the special session on “Irradiation Effects in Materials” and will not be considered in detail in this session.

High-voltage monitoring by the fiber-optic recirculating measuring system

2020 ◽  
pp. 38-44
Author(s):  
A. V. Polyakov ◽  
M. A. Ksenofontov
Keyword(s):  
Optical Fibers ◽  
High Voltage ◽  
Optical Sensors ◽  
Electromagnetic Interference ◽  
Fiber Optic ◽  
Electric Power Industry ◽  
Measuring System ◽  
Voltage Range ◽  
External Electromagnetic Fields ◽  
Optic Communication

Optical technologies for measuring electrical quantities attract great attention due to their unique properties and significant advantages over other technologies used in high-voltage electric power industry: the use of optical fibers ensures high stability of measuring equipment to electromagnetic interference and galvanic isolation of high-voltage sensors; external electromagnetic fields do not influence the data transmitted from optical sensors via fiber-optic communication lines; problems associated with ground loops are eliminated, there are no side electromagnetic radiation and crosstalk between the channels. The structure and operation principle of a quasi-distributed fiber-optic high-voltage monitoring system is presented. The sensitive element is a combination of a piezo-ceramic tube with an optical fiber wound around it. The device uses reverse transverse piezoelectric effect. The measurement principle is based on recording the change in the recirculation frequency under the applied voltage influence. When the measuring sections are arranged in ascending order of the measured effective voltages relative to the receiving-transmitting unit, a relative resolution of 0,3–0,45 % is achieved for the PZT-5H and 0,8–1,2 % for the PZT-4 in the voltage range 20–150 kV.

POF — Polymer Optical Fibers for Data Communication

2002 ◽  
Author(s):  
Werner Daum ◽  
Jürgen Krauser ◽  
Peter E. Zamzow ◽  
Olaf Ziemann
Keyword(s):  
Optical Fibers ◽  
Data Communication ◽  
Polymer Optical Fibers
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