AFM Application in III-Nitride Materials and Devices

Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale ◽

10.5772/37527 ◽

2012 ◽

Cited By ~ 1

Author(s):

Z. Chen ◽

L.W. Su ◽

J.Y. Shi ◽

X.L. Wang ◽

C.L. Tang ◽

...

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