scholarly journals Tapping Mode AFM Imaging for Functionalized Surfaces

Author(s):  
Nadine Mourougou-Candoni
2018 ◽  
Vol 26 (6) ◽  
pp. 12-17 ◽  
Author(s):  
Aleksander Labuda ◽  
Sophia Hohlbauch ◽  
Marta Kocun ◽  
F. Ted Limpoco ◽  
Nathan Kirchhofer ◽  
...  

Abstract


2013 ◽  
Vol 25 (18) ◽  
pp. 184005 ◽  
Author(s):  
Wiktoria Walczyk ◽  
Peter M Schön ◽  
Holger Schönherr

2005 ◽  
Vol 109 (23) ◽  
pp. 11493-11500 ◽  
Author(s):  
Santiago D. Solares ◽  
Maria J. Esplandiu ◽  
William A. Goddard ◽  
C. Patrick Collier

Author(s):  
Tomasz Kowalewski ◽  
Justin Legleiter

In tapping mode AFM, a cantilever is driven near its resonance frequency and intermittently strikes the sample while raster scanned across a surface. The oscillation amplitude is monitored via a feedback loop to extract topographical information of surfaces at the nanoscale. This paper deals with major factors limiting scanning speed: 1) the slow transient response of the cantilever, and 2) instabilities associated with systems with high quality factors (Q). Due to the slow transient response, the AFM has difficulty in instantly responding to steps along the surface, resulting in the need for slower scan rates. By driving the cantilever well below its resonance frequency, stability of the system is greatly improved, resulting in better feature tracking and the ability to scan at faster speeds.


2013 ◽  
Vol 4 ◽  
pp. 385-393 ◽  
Author(s):  
Daniel Kiracofe ◽  
Arvind Raman ◽  
Dalia Yablon

One of the key goals in atomic force microscopy (AFM) imaging is to enhance material property contrast with high resolution. Bimodal AFM, where two eigenmodes are simultaneously excited, confers significant advantages over conventional single-frequency tapping mode AFM due to its ability to provide contrast between regions with different material properties under gentle imaging conditions. Bimodal AFM traditionally uses the first two eigenmodes of the AFM cantilever. In this work, the authors explore the use of higher eigenmodes in bimodal AFM (e.g., exciting the first and fourth eigenmodes). It is found that such operation leads to interesting contrast reversals compared to traditional bimodal AFM. A series of experiments and numerical simulations shows that the primary cause of the contrast reversals is not the choice of eigenmode itself (e.g., second versus fourth), but rather the relative kinetic energy between the higher eigenmode and the first eigenmode. This leads to the identification of three distinct imaging regimes in bimodal AFM. This result, which is applicable even to traditional bimodal AFM, should allow researchers to choose cantilever and operating parameters in a more rational manner in order to optimize resolution and contrast during nanoscale imaging of materials.


Soft Matter ◽  
2014 ◽  
Vol 10 (32) ◽  
pp. 5945-5954 ◽  
Author(s):  
Wiktoria Walczyk ◽  
Nicole Hain ◽  
Holger Schönherr

Individual argon surface nanobubbles on highly oriented pyrolytic graphite were analysed in three different AFM imaging modes to assess the impact of the effect of different tip-sample interactions on the apparent nanobubble dimensions.


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