scholarly journals Processing and Characterization of Alumina/ Chromium Carbide Ceramic Nanocomposite

10.5772/17899 ◽  
2011 ◽  
Author(s):  
Jow-Lay Huang ◽  
Pramoda Nayak
Keyword(s):  
Chromium Carbide ◽  
Ceramic Nanocomposite

Preparation and Characterization of Chromium Containing amorphous Hydrogenated Carbon Films (A-C:H/Cr)

1995 ◽  
Vol 388 ◽  
Author(s):  
R. Gampp ◽  
P. Gantenbein ◽  
P. Oelhafen
Keyword(s):  
Chromium Carbide ◽  
Photoelectron Spectroscopy ◽  
Chemical Vapor ◽  
Carbon Films ◽  
Rf Plasma ◽  
Silicon Substrates ◽  
Amorphous Hydrogenated Carbon ◽  
High Chemical Stability

AbstractChromium containing amorphous hydrogenated carbon films (a-C:H/Cr) were prepared in a process that combines rf plasma activated chemical vapor deposition of methane and magnetron sputtering of a chromium target. During the deposition the silicon substrates were kept at 200°C and dc biased at -200 V in order to obtain films with high chemical stability which is required for the application as solar selective surfaces. the films with different Cr concentrations (5 to 49 at.%) were characterized by in situ x-ray photoelectron spectroscopy (XPS). Up to 40 at.%, chromium proves to be built into the cermet-like films in the form of chromium carbide clusters. above 40 at.%, chromium is partly metallic. a modification of the a-C:H matrix in the vicinity of the chromium carbide clusters has been observed.

Formation and characterization of chromium carbide films deposited using a 90° bend magnetic filtered cathodic vacuum arc system

2006 ◽  
Vol 200 (16-17) ◽  
pp. 5052-5057 ◽  
Author(s):  
Chun-Chun Lin ◽  
Wei-Jen Hsieh ◽  
Jain-Hong Lin ◽  
Uei-Shin Chen ◽  
Xing-Jian Guo ◽  
...  
Keyword(s):  
Chromium Carbide ◽  
Vacuum Arc ◽  
Filtered Cathodic Vacuum Arc

Advances in Automatic TEM Based Orientation Mapping

2005 ◽  
Vol 105 ◽  
pp. 37-42 ◽  
Author(s):  
Jean-Jacques Fundenberger ◽  
Adam Morawiec ◽  
Emmanuel Bouzy
Keyword(s):  
Spatial Resolution ◽  
Chromium Carbide ◽  
Tial Alloy ◽  
Acquisition Time ◽  
Fine Grain ◽  
Current State ◽  
Orientation Mapping ◽  
Fully Lamellar ◽  
Low Symmetry

The paper is an account of TEM based automatic orientation mapping summarizing more than two years of using the system. Following a brief introduction of the system elements, some representative applications are described. We focus on the characterization of fine-grain materials, mapping of low symmetry materials (metastable chromium carbide) and semi-automatic analysis of misorientations in a fully lamellar polycrystalline (g+a2) TiAl alloy. Moreover, the current state of the TEM based system is discussed and compared to EBSD systems. In particular, the issues of spatial resolution, accuracy, map acquisition time, reliability are considered.

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