scholarly journals In-Situ Analysis of Optoelectronic Properties of Semiconductor Nanostructures and Defects in Transmission Electron Microscopes

10.5772/14813 ◽  
2011 ◽  
Author(s):  
Yutaka Ohno ◽  
Ichiro Yonenega ◽  
Seiji Take
Keyword(s):  
Semiconductor Nanostructures ◽  
Optoelectronic Properties ◽  
In Situ Analysis ◽  
Transmission Electron ◽  
Electron Microscopes

Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface

1996 ◽  
Vol 54 ◽  
pp. 384-385
Author(s):  
M.A. O’Keefe ◽  
J. Taylor ◽  
D. Owen ◽  
B. Crowley ◽  
K.H. Westmacott ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
User Interface ◽  
Transmission Electron Microscope ◽  
High Voltage ◽  
Materials Science ◽  
Transmission Electron ◽  
On Line ◽  
Electron Microscopes

Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential that suitable standards be developed and followed. Two such standards have been proposed for a high-level protocol language for on-line access, and we have proposed a rational graphical user interface. The user interface we present here is based on experience gained with a full-function materials science application providing users of the National Center for Electron Microscopy with remote on-line access to a 1.5MeV Kratos EM-1500 in situ high-voltage transmission electron microscope via existing wide area networks. We have developed and implemented, and are continuing to refine, a set of tools, protocols, and interfaces to run the Kratos EM-1500 on-line for collaborative research. Computer tools for capturing and manipulating real-time video signals are integrated into a standardized user interface that may be used for remote access to any transmission electron microscope equipped with a suitable control computer.

In-Situ Electrochemical Transmission Electron Microscopy for Battery Research

2014 ◽  
Vol 20 (2) ◽  
pp. 484-492 ◽  
Author(s):  
B. Layla Mehdi ◽  
Meng Gu ◽  
Lucas R. Parent ◽  
Wu Xu ◽  
Eduard N. Nasybulin ◽  
...  
Keyword(s):  
Electron Beam ◽  
Silicon Nanowires ◽  
Electrochemical Processes ◽  
Transmission Electron ◽  
Experimental Parameters ◽  
Scanning Transmission ◽  
Electrode Interface ◽  
Electron Microscopes

AbstractThe recent development of in-situ liquid stages for (scanning) transmission electron microscopes now makes it possible for us to study the details of electrochemical processes under operando conditions. As electrochemical processes are complex, care must be taken to calibrate the system before any in-situ/operando observations. In addition, as the electron beam can cause effects that look similar to electrochemical processes at the electrolyte/electrode interface, an understanding of the role of the electron beam in modifying the operando observations must also be understood. In this paper we describe the design, assembly, and operation of an in-situ electrochemical cell, paying particular attention to the method for controlling and quantifying the experimental parameters. The use of this system is then demonstrated for the lithiation/delithiation of silicon nanowires.

scholarly journals Computer-Controlled Polishing System For Preparing Multiple Pre-FIB TEM Specimens

2007 ◽  
Vol 15 (6) ◽  
pp. 38-39
Author(s):  
D. J. MacMahon ◽  
E. Raz-Moyal
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Product Yield ◽  
Interface Layer ◽  
Ex Situ ◽  
Advantages And Disadvantages ◽  
Transmission Electron ◽  
Invaluable Tool ◽  
Electron Microscopes

Semiconductor manufacturers are increasingly turning to Transmission Electron Microscopes (TEMs) to monitor product yield and process control, analyze defects, and investigate interface layer morphology. To prepare TEM specimens, Focused Ion Beam (FIB) technology is an invaluable tool, yielding a standard milled TEM lamella approximately 15 μm wide, 5 μm deep and ~100 nm thick. Several techniques have been developed to extract these tiny objects from a large wafer and view it in the TEM. These techniques, including ex-situ lift-out, H-bar, and in-situ lift-out, have different advantages and disadvantages, but all require painstaking preparation of one specimen at a time.

In situ high-resolution Transmission electron microscopy of interphase boundary motion in metallic alloys

1991 ◽  
Vol 49 ◽  
pp. 450-451
Author(s):  
James M. Howe
Keyword(s):  
High Resolution ◽  
Interphase Boundary ◽  
Image Intensifier ◽  
Metallic Alloys ◽  
Video Cassette Recorder ◽  
Cold Stage ◽  
Transmission Electron ◽  
Electron Microscopes ◽  
Initial Results

Information provided by in situ studies is often essential for understanding microstructural evolution in solids. The recent development of intermediate-voltage high-resolution transmission electron microscopes (HRTEM) with in situ heating capabilities now provides the opportunity to perform in situ high-resolution studies of interphase boundary (IPB) motion. This paper presents initial results on in situ HRTEM studies of IPB motion in metallic alloys, in particular, during growth of Q precipitates in an Al-Cu-Mg-Ag alloy and Pd3Si crystals in an amorphous Pd-Si alloy.Samples of an Al-4Cu-0.5Mg-0.5Ag (wt.%) alloy were aged for 24 hr at 250°C and electropolished in a HNO3/methanol solution; samples of an amorphous Pd80Si20 (at.%) ribbon were ion milled in a liquid-nitrogen cold-stage at 6 kV, 0.3 mA and 15° tilt. The samples were examined at 400 kV in a JEOL 4000EX microscope equipped with a UHP40X hot-stage pole piece and double-tilt holder at temperatures of 200-400°C. Images were recorded on a Sony BetaCam video cassette recorder connected to a Gatan fiber-optically coupled TV camera with an image intensifier. A 35 mm camera was used to obtain photographs directly from the TV monitor during playback of the video cassettes.

Applications of In-situ Sample Preparation and Modeling of SEM-STEM Imaging

2008 ◽  
Author(s):  
R.J. Young ◽  
A. Buxbaum ◽  
B. Peterson ◽  
R. Schampers
Keyword(s):  
Sample Preparation ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Dual Beam ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Preparation Techniques

Abstract Scanning transmission electron microscopy with scanning electron microscopes (SEM-STEM) has become increasing used in both SEM and dual-beam focused ion beam (FIB)-SEM systems. This paper describes modeling undertaken to simulate the contrast seen in such images. Such modeling provides the ability to help understand and optimize imaging conditions and also support improved sample preparation techniques.

In situ analysis of optoelectronic properties of dislocations in ZnO in TEM observations

2009 ◽  
Vol 206 (8) ◽  
pp. 1904-1911 ◽  
Author(s):  
Yutaka Ohno ◽  
Toshinori Taishi ◽  
Ichiro Yonenaga
Keyword(s):  
Optoelectronic Properties ◽  
In Situ Analysis

An Environmental Transmission Electron Microscope for in situ Synthesis and Characterization of Nanomaterials

2005 ◽  
Vol 20 (7) ◽  
pp. 1695-1707 ◽  
Author(s):  
Renu Sharma
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Elevated Temperatures ◽  
Dark Field ◽  
In Situ Synthesis ◽  
Synthesis And Characterization ◽  
Transmission Electron ◽  
Electron Microscopes

The world of nanomaterials has become the real world for most applications in the area of nanotechnology. As postsynthesis handling of materials at the nanoscale level is impractical, nanomaterials must be synthesized directly as part of a device or circuit. The demands of nanotechnology have led to modifications in the design of transmission electron microscopes (TEMs) that enable in situ synthesis and characterization simultaneously. The environmental TEM (ETEM) is one such modified instrument that has often been used to follow gas–solid and/or liquid–solid interactions at elevated temperatures. Although the history and development of the ETEM, also called the controlled atmosphere or environmental cell TEM, is as old as transmission electron microscopy itself, developments in the design of medium-voltage TEMs have succeeded in bringing resolutions down to the subnanometer level. A modern ETEM equipped with a field-emission gun, energy filter or electron energy-loss spectrometer, scanning transmission electron microscopy coils, and bright-field and dark-field detectors can be a versatile tool for understanding chemical processes at the nanometer level. This article reviews the design and operations of a dedicated ETEM. Its applications range from the in situ characterization of reaction steps, such as oxidation-reduction and hydroxylation, to the in situ synthesis of nanomaterials, such as quantum dots and carbon nanotubes. Some examples of the current and the future applications for the synthesis and characterization of nanomaterials are also discussed.

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