scholarly journals Cold-Induced Aggregation Microextraction: A Novel Sample Preparation Technique Based on Ionic Liquids for Preconcentration of Cobalt Prior to Its Determination by Fiber Optic-Linear Array Detection Spectrophotometry in Real Water Samples

10.5772/14651 ◽  
2011 ◽  
Author(s):  
Maysam Gharehbaghi ◽  
Farzaneh Shemirani ◽  
Malihe Davudabadi ◽  
Majid Baghdadi
Keyword(s):  
Ionic Liquids ◽  
Sample Preparation ◽  
Water Samples ◽  
Fiber Optic ◽  
Linear Array ◽  
Preparation Technique ◽  
Real Water Samples ◽  
Sample Preparation Technique ◽  
Array Detection ◽  
Induced Aggregation

scholarly journals Fast Analysis of Water Samples for Trace Amount of Crystal Violet Dye Based on Solid Phase Extraction Using Nanoporous SBA-3 prior to Determination by Fiber Optic-Linear Array Detection Spectrophotometry

2013 ◽  
Vol 2013 ◽  
pp. 1-8 ◽  
Author(s):  
Azam Azarkohan ◽  
Farzaneh Shemirani ◽  
Mahrouz Alvand
Keyword(s):  
Standard Deviation ◽  
Relative Standard Deviation ◽  
Crystal Violet ◽  
Water Samples ◽  
Fiber Optic ◽  
Linear Array ◽  
Solid Phase ◽  
Relative Standard ◽  
Separation And Preconcentration ◽  
Array Detection

A solid phase preconcentration procedure using SBA-3 nanosorbent for the fast separation and preconcentration of crystal violet (CV) in water samples by fiber optic-linear array detection spectrophotometry (FO-LADS) is presented. Experimental parameters including pH, sample volume, amount of sorbent, type, volume, and concentration of eluent that affect the recovery of crystal violet have been optimized. Under optimized experimental conditions, analytical parameters including limit of detection, linear working range, and relative standard deviation have also been determined. A preconcentration factor of 200 was achieved in this method. In the initial solution, the detection limit for CV was found as 1.3 μg L−1. Under optimal conditions maximum adsorption capacity was obtained as 344.83 mg g−1. Also, the relative standard deviation was less than ±1.3% (n=5). The presented procedure was applied to the determination of crystal violet in water samples (fish, fish farming water, and river water) with good results.

SEM evaluation of the TEM cold-stage double-film specimen

1984 ◽  
Vol 42 ◽  
pp. 272-273
Author(s):  
Jayesh Bellare
Keyword(s):  
Spatial Distribution ◽  
Sample Preparation ◽  
Sample Thickness ◽  
Specimen Preparation ◽  
Preparation Technique ◽  
Liquid Sample ◽  
Thin Specimen ◽  
Sample Preparation Technique ◽  
Cold Stage ◽  
Film Specimen

Seeing is believing, but only after the sample preparation technique has received a systematic study and a full record is made of the treatment the sample gets.For microstructured liquids and suspensions, fast-freeze thermal fixation and cold-stage microscopy is perhaps the least artifact-laden technique. In the double-film specimen preparation technique, a layer of liquid sample is trapped between 100- and 400-mesh polymer (polyimide, PI) coated grids. Blotting against filter paper drains excess liquid and provides a thin specimen, which is fast-frozen by plunging into liquid nitrogen. This frozen sandwich (Fig. 1) is mounted in a cooling holder and viewed in TEM.Though extremely promising for visualization of liquid microstructures, this double-film technique suffers from a) ireproducibility and nonuniformity of sample thickness, b) low yield of imageable grid squares and c) nonuniform spatial distribution of particulates, which results in fewer being imaged.

Introduction of a Novel Sample Preparation Technique for the Failure Analysis of Silicon Integrated Photonics Modules

2019 ◽  
Author(s):  
Pradip Sairam Pichumani ◽  
Fauzia Khatkhatay
Keyword(s):  
Sample Preparation ◽  
Failure Analysis ◽  
Silicon Photonics ◽  
Cmos Technology ◽  
Single Step ◽  
Oxide Semiconductor ◽  
Disruptive Technology ◽  
Preparation Technique ◽  
Test Vehicle ◽  
Sample Preparation Technique

Abstract Silicon photonics is a disruptive technology that aims for monolithic integration of photonic devices onto the complementary metal-oxide-semiconductor (CMOS) technology platform to enable low-cost high-volume manufacturing. Since the technology is still in the research and development phase, failure analysis plays an important role in determining the root cause of failures seen in test vehicle silicon photonics modules. The fragile nature of the test vehicle modules warrants the development of new sample preparation methods to facilitate subsequent non-destructive and destructive analysis methods. This work provides an example of a single step sample preparation technique that will reduce the turnaround time while simultaneously increasing the scope of analysis techniques.

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