scholarly journals DEVELOPMENT OF A PRACTICAL AND HIGH ACCURACY SIMULATION TECHNIQUE BASED ON NUMERICAL MODAL APPROXIMATION FOR FLUID TRANSIENTS IN COMPOUND FLUID-LINE SYSTEMS

2002 ◽  
Vol 2002 (5-3) ◽  
pp. 871-876
Author(s):  
Masaaki SHINADA ◽  
Eiichi KOJIMA
Keyword(s):  
High Accuracy ◽  
Simulation Technique ◽  
Fluid Transients ◽  
Modal Approximation

Development of a New Simulation Technique Based on the Modal Approximation for Fluid Transients in Complex Pipeline Systems With Time-Variant Nonlinear Boundary Conditions

2006 ◽  
Vol 129 (6) ◽  
pp. 791-798 ◽  
Author(s):  
E. Kojima ◽  
T. Yamazaki ◽  
M. Shinada
Keyword(s):  
Boundary Conditions ◽  
Nonlinear Boundary ◽  
Safety Valve ◽  
Nonlinear Boundary Conditions ◽  
Simulation Technique ◽  
Nonlinear Relationship ◽  
Calculation Methods ◽  
Pipeline Systems ◽  
Fluid Transients ◽  
Modal Approximation

A new simulation technique called the system modal approximation method (SMA) for fluid transients in complex pipeline systems has been proposed. The superiority of this technique compared to other existing methods has been verified. Thus far, however, detailed considerations have been limited to pipelines having elementary boundary conditions. In the present paper, for the generalization of the SMA method, calculation methods are newly proposed for the case in which the boundary conditions are given by the time-variant nonlinear relationship between pressure and flow rate, such as the conditions in a safety valve, and its usefulness is verified by comparison to experimental measurements.

A New 1,000 kV Electron Microscope

1967 ◽  
Vol 25 ◽  
pp. 260-261
Author(s):  
M. Nishigaki ◽  
S. Katagiri ◽  
H. Kimura ◽  
B. Tadano
Keyword(s):  
Electron Microscope ◽  
High Voltage ◽  
Basic Research ◽  
Chromatic Aberration ◽  
High Accuracy ◽  
Biological Specimen ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron

The high voltage electron microscope has many advantageous features in comparison with the ordinary electron microscope. They are a higher penetrating efficiency of the electron, low chromatic aberration, high accuracy of the selected area diffraction and so on. Thus, the high voltage electron microscope becomes an indispensable instrument for the metallurgical, polymer and biological specimen studies. The application of the instrument involves today not only basic research but routine survey in the various fields. Particularly for the latter purpose, the performance, maintenance and reliability of the microscope should be same as those of commercial ones. The authors completed a 500 kV electron microscope in 1964 and a 1,000 kV one in 1966 taking these points into consideration. The construction of our 1,000 kV electron microscope is described below.

Determination of the Burgers vector of a dislocation in a Fe-Mn alloy by weak-beam image in HVEM

1978 ◽  
Vol 36 (1) ◽  
pp. 330-331
Author(s):  
Y. Ishida ◽  
H. Ishida ◽  
K. Kohra ◽  
H. Ichinose
Keyword(s):  
High Order ◽  
Simulation Technique ◽  
The Other ◽  
Image Simulation ◽  
Diffraction Vector ◽  
Burgers Vector ◽  
Weak Beam ◽  
Beam Image ◽  
Edge Component

IntroductionA simple and accurate technique to determine the Burgers vector of a dislocation has become feasible with the advent of HVEM. The conventional image vanishing technique(1) using Bragg conditions with the diffraction vector perpendicular to the Burgers vector suffers from various drawbacks; The dislocation image appears even when the g.b = 0 criterion is satisfied, if the edge component of the dislocation is large. On the other hand, the image disappears for certain high order diffractions even when g.b ≠ 0. Furthermore, the determination of the magnitude of the Burgers vector is not easy with the criterion. Recent image simulation technique is free from the ambiguities but require too many parameters for the computation. The weak-beam “fringe counting” technique investigated in the present study is immune from the problems. Even the magnitude of the Burgers vector is determined from the number of the terminating thickness fringes at the exit of the dislocation in wedge shaped foil surfaces.

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