scholarly journals Trace Element Analysis Using ECR Ion Source.

2000 ◽  
Vol 48 (2) ◽  
pp. 169-173 ◽  
Author(s):  
Takahide NAKAGAWA ◽  
Masanori KIDERA
2005 ◽  
Vol 15 (01n02) ◽  
pp. 11-17
Author(s):  
SHINTARO UEDA ◽  
TOSHIYUKI HATTORI ◽  
NORIYOSU HAYASHIZAKI ◽  
TOSHIKI HATA ◽  
KATUNORI KAWASAKI ◽  
...  

AMS is commonly used in radioisotope analysis because it can detect isotopes down to levels of 10-15 by abundance, but applications for trace element analysis are few. Therefore, we propose a new kind of AMS for trace element analysis using a linear accelerator (LINAC), an Electron Cyclotron Resonance Ion Source (ECRIS), and calibration methods with PIXE analysis. Abundance ratios of each element measured by PIXE are applied to create distribution charts of particles and charge states, and these charts are used for quantitative analysis. We report the concepts behind our AMS and calibration methods in this paper.


2019 ◽  
Vol 608 ◽  
pp. 247-262 ◽  
Author(s):  
MD Ramirez ◽  
JA Miller ◽  
E Parks ◽  
L Avens ◽  
LR Goshe ◽  
...  

Author(s):  
Daniel Araujo Goncalves ◽  
Tina McSweeney ◽  
Mirian Cristina dos Santos ◽  
Marco A. Utrera Martines ◽  
Luiz Francisco Malmonge ◽  
...  

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