scholarly journals Size Distribution of Zinc-Cesium and Cadmium-Cesium Positive Cluster Ions Using Secondary Ion Mass Spectrometry.

1996 ◽  
Vol 44 (1) ◽  
pp. 29-37 ◽  
Author(s):  
Hiroyuki ITO ◽  
Toru SAKURAI ◽  
Takekiyo MATSUO ◽  
Hisashi MATSUDA ◽  
Toshio ICHIHARA ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Size Distribution ◽  
Secondary Ion Mass Spectrometry ◽  
Cluster Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

MASS SPECTRA AND DISSOCIATION PATTERNS OF TELLURIUM CLUSTERS USING POSITIVE AND NEGATIVE SECONDARY-ION MASS SPECTROMETRY

1996 ◽  
Vol 03 (01) ◽  
pp. 577-582 ◽  
Author(s):  
H. ITO ◽  
T. SAKURAI ◽  
T. MATSUO ◽  
T. ICHIHARA ◽  
I. KATAKUSE
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Cluster Ions ◽  
Mass Spectrometers ◽  
Scanning Method ◽  
Ion Mass Spectrometry ◽  
Cluster Ion ◽  
Sector Type ◽  
Fragmentation Patterns ◽  
Secondary Ion

Size distribution of positive and negative tellurium clusters in the size range from 2 to 56 atoms was investigated by secondary-ion mass spectrometry (SIMS). Cluster ions were produced by the 12-keV Xe+ ions bombardment of a sample tellurium sheet and were mass-analyzed using sector-type double-focusing mass spectrometers. It was found that a discontinuous variation of cluster-ion intensity appeared at specific numbers of n. These numbers were 5, 8, 12, 15, 19, and 23 for positive clusters and 6, 10, 13, and 16 for negative clusters. The dissociation pattern was also investigated by an acceleration-voltage scanning method. It was found that Te2, Te5, and Te6 fragmentation events occurred at a large probability. Observation of specific fragmentation patterns suggested the existence of nonsequential fragment channels.

Cluster ions in the secondary ion mass spectrometry of choline and acetylcholine halides

1990 ◽  
Vol 25 (2) ◽  
pp. 109-114 ◽  
Author(s):  
Mamoru Ohashi ◽  
Takashi Lino ◽  
Tomoyuki Takahashi ◽  
Michiaki Yoneda ◽  
Soichiro Kyushin ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Cluster Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Secondary Ion Mass Spectrometry with Gas Cluster Ion Beams

2000 ◽  
Vol 647 ◽  
Author(s):  
Noriaki Toyoda ◽  
Jiro Matsuo ◽  
Takaaki Aoki ◽  
Shunichi Chiba ◽  
Isao Yamada ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Md Simulations ◽  
Ion Beams ◽  
Cluster Ions ◽  
Ion Mass Spectrometry ◽  
Cluster Ion Beams ◽  
Cluster Ion ◽  
Secondary Ion

AbstractSecondary Ion Mass Spectrometry (SIMS) with Gas Cluster Ion Beams (GCIB) was studied with experiments and molecular dynamics (MD) simulations to achieve a high-resolution depth profiling. For this purpose, it is important to prevent both ion-mixing and the surface roughening due to energetic ions. As the Ar cluster ion beam shows surface smoothing effects and high secondary-ion yield in the low-energy regime, the cluster ion beam would be suitable for the primary ion beam of SIMS. From MD simulations of Ar cluster ion impact on a Si substrate, the ion-mixing is heavier than for Ar monomer ions at the same energy per atom, because the energy density at the impact point by clusters is extremely high. However, the sputtering yields with Ar cluster ions are one or two orders of magnitude higher than that with Ar monomer ions at the same energy per atom. Comparing at the ion energy where the ion-mixing depths are the same by both cluster and monomer ion impacts, cluster ions show almost ten times higher sputtering yield than Ar monomer ions. Preliminary experiment was done with a conventional SIMS detector and a mass resolution of several nm was achieved with Ar cluster ions as a primary ion beam.

Potassium Adsorption on Pt(111) and its Effect on Co Chemisorption

1986 ◽  
Vol 83 ◽  
Author(s):  
C. Michael Greenlief ◽  
Patricia L. Radloff ◽  
Sohail Akhter ◽  
J. M. White
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Cluster Ions ◽  
Function Change ◽  
Temperature State ◽  
Work Function Change ◽  
Ion Mass Spectrometry ◽  
Temperature Programmed ◽  
Lower Temperature ◽  
Secondary Ion

ABSTRACTTemperature programmed desorption (TPD) and secondary ion mass spectrometry (SIMS) have been used to study the chemisorption properties of carbon monoxide on potassium predosed Pt. SIMS cluster ions (such as K+, K2+, KO+ and KCO+) were monitored to probe, K-CO interactions. Large changes in the SIMS yields are observed as the potassium coverage is varied. The SIMS results are correlated with previous work function change and TPD studies. Temperature programmed secondary ion mass spectrometry of potassium-containing ions indicates a local interaction between potassium and CO molecules.As typically observed on transition metal surfaces, two different CO TPD states are observed. The lower temperature state shifts to higher temperatures with increasing potassium coverage and to lower temperatures with increasing CO exposure. The high temperature CO state builds in with increasing potassium coverage and is accompanied by simultaneous potassium desorption. Evidence for the occurrence of both long-range (indirect) and short-range (direct) potassium effects on adsorbed CO is presented.

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