scholarly journals Ion Optics for the High Performance Mass Spectrometer of Magnetic Sector Type.

1995 ◽  
Vol 43 (4) ◽  
pp. 165-176
Author(s):  
Hisashi MATSUDA
Keyword(s):  
Mass Spectrometer ◽  
High Performance ◽  
Magnetic Sector ◽  
Ion Optics ◽  
Sector Type

A High Performance Energy Analyzer for Use in Electron Scanning Microscopy

1969 ◽  
Vol 27 ◽  
pp. 14-15
Author(s):  
A. V. Crewe ◽  
M. Isaacson ◽  
D. Johnson
Keyword(s):  
High Performance ◽  
Vertical Plane ◽  
Median Plane ◽  
Electron Gun ◽  
Uniform Field ◽  
Loss Mechanism ◽  
Electron Scanning Microscopy ◽  
Sector Type ◽  
Double Focusing ◽  
Electron Energy Loss

A double focusing magnetic spectrometer has been constructed for use with a field emission electron gun scanning microscope in order to study the electron energy loss mechanism in thin specimens. It is of the uniform field sector type with curved pole pieces. The shape of the pole pieces is determined by requiring that all particles be focused to a point at the image slit (point 1). The resultant shape gives perfect focusing in the median plane (Fig. 1) and first order focusing in the vertical plane (Fig. 2).

An Energy Analyser for Contrast Enhancement in STEM

1974 ◽  
Vol 32 ◽  
pp. 434-435
Author(s):  
H.T. Pearce-Percy
Keyword(s):  
Contrast Enhancement ◽  
Bending Angle ◽  
Magnetic Sector ◽  
Conventional Design ◽  
Bending Radius ◽  
Sector Type

Recently an energy analyser of the uniform magnetic sector type has been installd in a 100KV microscope. This microscope can be used in the STEM mode. The sector is of conventional design (Fig. 1). The bending angle was chosen to be 90° for ease of construction. The bending radius (ρ) is 20 cm. and the object and image distances are 42.5 cm. and 30.0 cm. respectively.

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