scholarly journals Charge compensation of insulators in secondary ion mass spectrometry (SIMS) analysis.

1984 ◽  
Vol 32 (4) ◽  
pp. 345-356 ◽  
Author(s):  
Yoshikazu Homma ◽  
Yoshikazu Ishii ◽  
Masaharu Oshima
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Charge Compensation ◽  
Ion Mass Spectrometry ◽  
Sims Analysis ◽  
Secondary Ion

Fundamentals of Secondary Ion Mass Spectrometry

MRS Bulletin ◽  
1987 ◽  
Vol 12 (6) ◽  
pp. 40-47 ◽  
Author(s):  
W. Katz ◽  
J.G. Newman
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Current Understanding ◽  
Ion Mass Spectrometry ◽  
Sims Analysis ◽  
Secondary Ion

AbstractThis article presents an overview of our current understanding of the fundamental factors underlying Secondary Ion Mass Spectrometry (SIMS). Included is a discussion of the sputtering process and possible mechanisms which produce ejected ions. Presently available instrumentation for SIMS analysis is discussed and some examples of SIMS analysis are also given.

Further use of Secondary Ion Mass Spectrometry in the Study of Graphite Morphology Control TN Cast Irons

1984 ◽  
Vol 34 ◽  
Author(s):  
S. E. Franklin ◽  
R. A. Stark
Keyword(s):  
Mass Spectrometry ◽  
Cast Iron ◽  
Secondary Ion Mass Spectrometry ◽  
Current Paper ◽  
Cast Irons ◽  
Preliminary Results ◽  
Graphite Morphology ◽  
Ion Mass Spectrometry ◽  
Sims Analysis ◽  
Secondary Ion

ABSTRACTIn a previous publication, preliminary results obtained using secondary ion mass spectrometry to determine selective elemental distributions in cast iron were reported. These results were used to tentatively assign possible roles to the important solutes in controlling the graphite morphology. The current paper is a continuation of this work and presents the most recent results of the SIMS analysis.

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