A Comparative Study on Relative Adherence of Metal Ceramic Porcelain with Precious and Non Precious Alloys Using Electron Spectroscopy for Chemical Analysis Technique

10.5580/7fc ◽  
2011 ◽  
Vol 4 (2) ◽  
Keyword(s):  
Chemical Analysis ◽  
Comparative Study ◽  
Electron Spectroscopy ◽  
Analysis Technique ◽  
Metal Ceramic ◽  
Chemical Analysis Technique

scholarly journals Quantitative mass spectrometry: an overview

2016 ◽  
Vol 374 (2079) ◽  
pp. 20150382 ◽  
Author(s):  
Pawel L. Urban
Keyword(s):  
Mass Spectrometry ◽  
Chemical Analysis ◽  
First Century ◽  
Quantitative Mass Spectrometry ◽  
Theme Issue ◽  
Direct Identification ◽  
Mass Spectrometers ◽  
Analysis Technique ◽  
Chemical Analysis Technique ◽  
Fragmentation Patterns

Mass spectrometry (MS) is a mainstream chemical analysis technique in the twenty-first century. It has contributed to numerous discoveries in chemistry, physics and biochemistry. Hundreds of research laboratories scattered all over the world use MS every day to investigate fundamental phenomena on the molecular level. MS is also widely used by industry—especially in drug discovery, quality control and food safety protocols. In some cases, mass spectrometers are indispensable and irreplaceable by any other metrological tools. The uniqueness of MS is due to the fact that it enables direct identification of molecules based on the mass-to-charge ratios as well as fragmentation patterns. Thus, for several decades now, MS has been used in qualitative chemical analysis. To address the pressing need for quantitative molecular measurements, a number of laboratories focused on technological and methodological improvements that could render MS a fully quantitative metrological platform. In this theme issue, the experts working for some of those laboratories share their knowledge and enthusiasm about quantitative MS. I hope this theme issue will benefit readers, and foster fundamental and applied research based on quantitative MS measurements. This article is part of the themed issue ‘Quantitative mass spectrometry’.

In Situ Analysis of Surface Contaminant Desorption during Low-Temperature Silicon Substrate Cleaning using Reflection Electron Energy Loss Spectrometry

1992 ◽  
Vol 259 ◽  
Author(s):  
Selmer S. Wong ◽  
Shouleh Nikzad ◽  
Channing C. Ahn ◽  
Aimee L. Smith ◽  
Harry A. Atwater
Keyword(s):  
Low Temperature ◽  
Energy Loss ◽  
Electron Energy ◽  
Core Loss ◽  
Temperature Dependent ◽  
Electron Energy Loss Spectrometry ◽  
Analysis Technique ◽  
Chemical Analysis Technique ◽  
Electron Energy Loss

ABSTRACTWe have employed reflection electron energy loss spectrometry (REELS), a surface chemical analysis technique, in order to analyze contaminant coverages at the submonolayer level during low-temperature in situ cleaning of hydrogen-terminated Si(100). The chemical composition of the surface was analyzed by measurements of the C K, O K and Si L2,3 core loss intensities at various stages of the cleaning. These results were quantified using SiC(100) and SiO2 as reference standards for C and O coverage. Room temperature REELS core loss intensity analysis after sample insertion reveals carbon at fractional monolayer coverage. We have established the REELS detection limit for carbon coverage to be 5±2% of a monolayer. A study of temperature-dependent hydrocarbon desorption from hydrogen-terminated Si(100) reveals the absence of carbon on the surface at temperatures greater than 200°C. This indicates the feasibility of epitaxial growth following an in situ low-temperature cleaning and also indicates the power of REELS as an in situ technique for assessment of surface cleanliness.

Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis

1981 ◽  
Vol 3 (5) ◽  
pp. 211-225 ◽  
Author(s):  
C. D. Wagner ◽  
L. E. Davis ◽  
M. V. Zeller ◽  
J. A. Taylor ◽  
R. H. Raymond ◽  
...  
Keyword(s):  
Quantitative Analysis ◽  
Chemical Analysis ◽  
Electron Spectroscopy ◽  
Sensitivity Factors

scholarly journals Electron spectroscopy for chemical analysis studies on polypeptide surfaces.

1988 ◽  
Vol 45 (5) ◽  
pp. 441-447 ◽  
Author(s):  
Kohei KUGO ◽  
Tatsuro KITAURA ◽  
Jun NISHINO
Keyword(s):  
Chemical Analysis ◽  
Electron Spectroscopy
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