scholarly journals Research of X-ray Nondestructive Detection System for High-speed running Conveyor Belt with Steel Wire Ropes

2007 ◽  
Vol 1 (3) ◽  
Author(s):  
Junfeng Wang ◽  
Changyun Miao ◽  
Yue Cui ◽  
Wei Wang ◽  
Lei Zhou
Keyword(s):  
High Speed ◽  
Detection System ◽  
Steel Wire ◽  
Conveyor Belt ◽  
Nondestructive Detection ◽  
X Ray ◽  
Wire Ropes

Study on Mechanical Automation with X-Ray Power Conveyor Belt Nondestructive Detection System Design

2013 ◽  
Vol 738 ◽  
pp. 256-259
Author(s):  
Yu Duo Wang
Keyword(s):  
System Design ◽  
Detection System ◽  
Cost Effective ◽  
Conveyor Belt ◽  
Safe Operation ◽  
Nondestructive Detection ◽  
X Ray ◽  
Fpga Chip ◽  
Design Requirements ◽  
Hardware Circuit

In order to real-time automation detection of conveyor belt running status, found the mechanical fault in time and processing, to ensure mechanical automation reliable and safe operation, to avoid major accidents. This paper designed a kind of X-ray power conveyor belt nondestructive detection system of the detector, Proposed design scheme based on FPGA + ARM detector; Adopts Xilinx companys cost-effective FPGA chip Spartan-3E and Samsung launched using 32-bit RISC microprocessor of ARM chips S3C2440A, Design the hardware circuit of detector; And has carried on the experiment and debugging, has reached the design requirements.

Research on Enhancement Technology of Conveyor Belt Fault Images Based on Fruit Fly Optimization Algorithm

2014 ◽  
Vol 8 (1) ◽  
pp. 685-689
Author(s):  
Chunqing Ye ◽  
Changyun Miao ◽  
Xianguo Li ◽  
Yanli Yang
Keyword(s):  
Optimization Algorithm ◽  
Detection System ◽  
Fruit Fly ◽  
Conveyor Belt ◽  
Recognition Algorithm ◽  
Fruit Fly Optimization Algorithm ◽  
Fruit Fly Optimization ◽  
Wire Ropes ◽  
Fault Recognition ◽  
Steel Cord

In this research, we studied the fault recognition algorithm of steel cord conveyor belt, and obtained the wire ropes image by adopting the detection system of steel cord conveyor belt, so that the fault recognition algorithm of steel cord conveyor belt was proposed based on Fruit fly optimization algorithm. As we know that the fruit fly optimization algorithm is used for fault detection of the processing steel cord conveyor belt image and for obtaining the fault image. In the MATLAB environment, the algorithm process was designed and verified in terms of the effectiveness and accuracy. The experimental results show that with fast speed and high accuracy in detecting the fault image of steel cord conveyor belt rapidly and accurately, and in classifying scratch from fracture the proposed algorithm is suitable for the fault recognition of steel cord conveyor belt automatically.

Scanning x-ray fluorescence microscopy and principal component analysis

1992 ◽  
Vol 50 (2) ◽  
pp. 1752-1753
Author(s):  
Brian Cross
Keyword(s):  
Principal Component Analysis ◽  
Fluorescence Microscopy ◽  
Spatial Resolution ◽  
High Speed ◽  
Image Acquisition ◽  
Principal Component ◽  
Fluorescence Microscope ◽  
Acquisition Rate ◽  
X Ray ◽  
Speed Up

A relatively new entry, in the field of microscopy, is the Scanning X-Ray Fluorescence Microscope (SXRFM). Using this type of instrument (e.g. Kevex Omicron X-ray Microprobe), one can obtain multiple elemental x-ray images, from the analysis of materials which show heterogeneity. The SXRFM obtains images by collimating an x-ray beam (e.g. 100 μm diameter), and then scanning the sample with a high-speed x-y stage. To speed up the image acquisition, data is acquired "on-the-fly" by slew-scanning the stage along the x-axis, like a TV or SEM scan. To reduce the overhead from "fly-back," the images can be acquired by bi-directional scanning of the x-axis. This results in very little overhead with the re-positioning of the sample stage. The image acquisition rate is dominated by the x-ray acquisition rate. Therefore, the total x-ray image acquisition rate, using the SXRFM, is very comparable to an SEM. Although the x-ray spatial resolution of the SXRFM is worse than an SEM (say 100 vs. 2 μm), there are several other advantages.

PHAX-SCAN: Functional integration of a Scanning Electron Microscope and an energy-dispersive x-ray analyser

1989 ◽  
Vol 47 ◽  
pp. 56-57
Author(s):  
Marc H. Peeters ◽  
Max T. Otten
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
Functional Integration ◽  
Energy Dispersive ◽  
X Rays ◽  
X Ray ◽  
High Speed Analysis ◽  
Scanning Electron

Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.

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