scholarly journals ND morphological contour interpolation

2016 ◽  
Author(s):  
Dženan Zukić ◽  
Jared Vicory ◽  
Matthew Mccormick ◽  
Laura Wisse ◽  
Guido Gerig ◽  
...  
Keyword(s):  
Test Data ◽  
Execution Time ◽  
Manual Segmentation ◽  
New Class ◽  
Contour Interpolation ◽  
Transition Sequence ◽  
Input And Output ◽  
Limited Degree ◽  
Regression Tests

This document describes a new class, itk::MorphologicalContourInterpolator, which implements a method proposed by Albu et al. in 2008. Interpolation is done by first determining correspondence between shapes on adjacent segmented slices by detecting overlaps, then aligning the corresponding shapes, generating transition sequence of one-pixel dilations and taking the median as result. Recursion is employed if the original segmented slices are separated by more than one empty slice.This class is n-dimensional, and supports inputs of 3 or more dimensions. `Slices’ are n-1-dimensional, and can be both automatically detected and manually set. The class is efficient in both memory used and execution time. It requires little memory in addition to allocation of input and output images. The implementation is multi-threaded, and processing one of the test inputs takes around 1-2 seconds on a quad-core processor.The class is tested to operate on both itk::Image and itk::RLEImage. Since all the processing is done on extracted slices, usage of itk::RLEImage for input and/or output affects performance to a limited degree.This class is implemented to ease manual segmentation in ITK-SNAP (www.itksnap.org). The class, along with test data and automated regression tests is packaged as an ITK remote module https://github.com/KitwareMedical/ITKMorphologicalContourInterpolation.

scholarly journals RLEImage: run-length encoded memory compression scheme for an itk::Image

2016 ◽  
Author(s):  
Dženan Zukić ◽  
Matthew Mccormick ◽  
Guido Gerig ◽  
Paul Yushkevich
Keyword(s):  
Image Processing ◽  
Test Data ◽  
Compression Scheme ◽  
Run Length ◽  
Memory Compression ◽  
New Class ◽  
Quantitative Results ◽  
Image Processing Algorithms ◽  
Processing Algorithms ◽  
Regression Tests

This document describes a new class, itk::RLEImage, which uses run-length encoding to reduce the memory needed for storage of label maps. This class is accompanied by all the iterators to make it a dropin replacement for itk::Image. By changing the image typedef to itk::RLEImage, many ITK image processing algorithms build without modification and with minimal performance overhead. However, it is not possible if the user code uses GetBufferPointer() or otherwise assumes a linear pixel layout.This class is implemented to reduce the memory use of ITK-SNAP (www.itksnap.org), so ITKSNAP is the base for measuring the quantitative results.The class, accompanying iterator specializations, automated regression tests, and test data are all packaged as an ITK remote module https://github.com/KitwareMedical/ITKRLEImage.

scholarly journals DEVELOPMENT OF A NEW REGRESSION TESTING APPROACH WITH SEMI-AUTOMATIC TEST SELECTION FOR AUDITING AN IMS DATABASE

2020 ◽  
Vol 20 (4) ◽  
pp. 55-63
Author(s):  
A.N. Ruchay ◽  
Keyword(s):  
Execution Time ◽  
Regression Testing ◽  
Automatic Test ◽  
Test Selection ◽  
Testing Approach ◽  
Selection For ◽  
Regression Tests ◽  
Fine Tune ◽  
Selection Of

This work is devoted to the development of a new regression testing approach with semi-automatic test selection. Unlike previous works, the proposed approach is based on semi-auto-matic selection of tests taking into account various important factors, such as execution time, the required number of test executions, manual priority of tests, the result of previous tests, and test functionality. This allows you to fine-tune the sequence of regression tests in semi-automat-ic mode.DOI: 10.14529/secur200405

Confidence-based reliability assessment considering limited numbers of both input and output test data

2018 ◽  
Vol 57 (5) ◽  
pp. 2027-2043 ◽  
Author(s):  
Min-Yeong Moon ◽  
Hyunkyoo Cho ◽  
K. K. Choi ◽  
Nicholas Gaul ◽  
David Lamb ◽  
...  
Keyword(s):  
Test Data ◽  
Reliability Assessment ◽  
Input And Output

scholarly journals Generating Big Numbers for Testing Multi-Digit Arithmetic Algorithms

2021 ◽  
pp. 39-56
Author(s):  
Andrii Tereshchenko ◽  
Valeriy Zadiraka
Keyword(s):  
Distributed Systems ◽  
Test Data ◽  
Input Data ◽  
Arithmetic Operations ◽  
Data Dependencies ◽  
Input And Output ◽  
The Difference ◽  
Time Required ◽  
Two Parameters

Introduction. The emergence of new parallel computational systems, such as multi-core processors, clusters, distributed systems, is due to the solution of various applied problems in various fields. The difference between devices for which parallel algorithms are implemented causes a variety of existing methods for parallelizing the calculation of multi-digit arithmetic operations. There is a problem of developing universal algorithms for implementing multi-digit arithmetic operations that are efficiently performed on various devices and on various systems. Very often it is not possible to develop a new algorithm, since at this stage there is still no test data with which it is possible to analyze the result of calculation. Therefore, the task of preparing test data and results is no less important than the development of the algorithm itself. The quality of the prepared data determines the quality of the implemented algorithm and the time required to find and eliminate errors in the algorithm-program and its implementation. In this paper, some simple dependencies are given, using which you can visually check the correctness of the calculation of multi-digit operations of addition, subtraction, multiplication, multiplication by modulo and exponentiation by modulo. Simple algorithms for generating input and output multi-digit data are presented. Using dependencies allows to check the integrity of the output when delegating computations to distributed systems such as cloud computing. The purpose of the article is to show simple dependencies between the input data and the results of performing multi-digit operations of addition, subtraction, multiplication, multiplication by modulo and exponentiation by modulo. For the given dependencies, methods for generating input and output multi-digit numbers are shown, which can be used to check the correctness of the calculation of multi-digit operations, which significantly saves the time required for preparing test data. Dependencies are provided in a generic way, which allows you to generate input data and results for devices that operate on words of different lengths (8, 16, 32, 64, 128, 256, etc. bits). Results. The dependences between the input data and the results of performing multi-digit operations are analyzed. The provided dependencies are proved in the form of lemmas. The dependencies are presented in a general form, since to generate multi-digit sequences, it is needed to set two parameters: N – the number of digits in the multi-digit value and n – the length of the digits in bits. The examples show the generation of input data and results for various multi-digit operations. Conclusions. The paper presents dependencies that are easy to remember and use for visual verification of the results of multi-digit calculations without using additional or special software or hardware, which allows to devote the saved time to developing new or more efficient modifications of multi-digit algorithms. Keywords: multi-digit arithmetic, parallel computational model.

scholarly journals Test Suite Minimization using Hybrid Algorithm for GA generated Test Cases

2013 ◽  
Vol 6 (1) ◽  
pp. 279-286 ◽  
Author(s):  
Mrs. P Maragathavalli ◽  
S. Kanmani
Keyword(s):  
Test Data ◽  
Execution Time ◽  
Hybrid Algorithm ◽  
Mutant Gene ◽  
Test Suite ◽  
Test Cases ◽  
Testing Time ◽  
Test Data Generation ◽  
Data Generation ◽  
Minimization Procedure

Software testing and retesting occurs continuously during the software development lifecycle to detect errors as early as possible. As the software evolves the size of test suites also grows. When the no of test cases generated are more, obviously size of the test suite will also be more.  So the testing time is to be minimized by reducing the execution time of the algorithm used for test data generation and also by introducing minimization procedure for test suite reduction. Due to limited resources and timing constraints for testing, test suite minimization techniques are needed to eliminate redundant test cases as possible. By considering multiple objectives rather than the coverage alone, the test cases are being generated which satisfies the testing requirements. Most of the existing techniques are code-based. In this article we present an approach by modifying an existing heuristic for test suite minimization.  Genetic algorithm has been used for random test data generation and the output of GA is given to the minimization procedure for reducing the total no of generated test cases, collectively named as Hybrid Algorithm (HA). The results are satisfactory and show significant improvements in reducing test suite size with minimum execution time. Experiments have been done for simple to medium complexity java programs taken from SIR and execution time is reduced to 5,685ms for a test set. The results are compared with existing method Mutant Gene Algorithm and size of test suite is minimized upto 13.6% using Hybrid Algorithm.

scholarly journals Towards the boundary between easy and hard control problems in multicast Clos networks

2015 ◽  
Vol 63 (3) ◽  
pp. 739-744
Author(s):  
P. Obszarski ◽  
A. Jastrzębski ◽  
M. Kubale
Keyword(s):  
Edge Coloring ◽  
Sharp Contrast ◽  
Control Problems ◽  
Routing Problems ◽  
New Class ◽  
Clos Networks ◽  
Input And Output ◽  
Np Complete ◽  
Polynomially Solvable

AbstractIn this article we study 3-stage Clos networks with multicast calls in general and 2-cast calls, in particular. We investigate various sizes of input and output switches and discuss some routing problems involved in blocking states. To express our results in a formal way we introduce a model of hypergraph edge-coloring. A new class of bipartite hypergraphs corresponding to Clos networks is studied. We identify some polynomially solvable instances as well as a number of NP-complete cases. Our results warn of possible troubles arising in the control of Clos networks even if they are composed of small-size switches in outer stages. This is in sharp contrast to classical unicast Clos networks for which all the control problems are polynomially solvable.

scholarly journals EnsemblePigDet: Ensemble Deep Learning for Accurate Pig Detection

2021 ◽  
Vol 11 (12) ◽  
pp. 5577
Author(s):  
Hanse Ahn ◽  
Seungwook Son ◽  
Heegon Kim ◽  
Sungju Lee ◽  
Yongwha Chung ◽  
...  
Keyword(s):  
Deep Learning ◽  
Test Data ◽  
Execution Time ◽  
Detection Accuracy ◽  
Practical Issue ◽  
Test Results ◽  
Monitoring Techniques ◽  
Training Images ◽  
Pig Farms ◽  
Monitoring Application

Automated pig monitoring is important for smart pig farms; thus, several deep-learning-based pig monitoring techniques have been proposed recently. In applying automated pig monitoring techniques to real pig farms, however, practical issues such as detecting pigs from overexposed regions, caused by strong sunlight through a window, should be considered. Another practical issue in applying deep-learning-based techniques to a specific pig monitoring application is the annotation cost for pig data. In this study, we propose a method for managing these two practical issues. Using annotated data obtained from training images without overexposed regions, we first generated augmented data to reduce the effect of overexposure. Then, we trained YOLOv4 with both the annotated and augmented data and combined the test results from two YOLOv4 models in a bounding box level to further improve the detection accuracy. We propose accuracy metrics for pig detection in a closed pig pen to evaluate the accuracy of the detection without box-level annotation. Our experimental results with 216,000 “unseen” test data from overexposed regions in the same pig pen show that the proposed ensemble method can significantly improve the detection accuracy of the baseline YOLOv4, from 79.93% to 94.33%, with additional execution time.

A New Class of Linkage With Synthesis Method for Exact Dwell Motion at 1-2 Limit Positions of Output Link

1996 ◽  
Author(s):  
W. J. Zhang
Keyword(s):  
Low Cost ◽  
Synthesis Method ◽  
Output Link ◽  
New Class ◽  
Operation Speed ◽  
Input And Output ◽  
Motion Types

Abstract Occasions still exist for a designer to select a purely mechanical means to realize some special motion types, such as exact dwell at limit positions of the output link. This happens particularly when the design emphasis is placed on highly reliability, high operation speed and low cost. In this paper, a new principle and synthesis method to develop a class of linkages which enable a relatively long exact dwell at 1-2 limit positions of output link are presented. It will be shown that with this new class of linkages, a longer exact dwell can be realized in comparison with those existing classes of linkages including cam mechanisms. Furthermore, a spatial input and output motion can be realized. Application of such a kind of linkage has been found in a package packing machine.

In Situ microscopy of the anodic etching of silicon

1995 ◽  
Vol 53 ◽  
pp. 232-233
Author(s):  
Frances M. Ross ◽  
Peter C. Searson
Keyword(s):  
Composite Structures ◽  
High Surface ◽  
High Surface Area ◽  
Chemical Properties ◽  
Selective Etching ◽  
Silicon On Insulator ◽  
Second Phase ◽  
Porous Layers ◽  
New Class ◽  
Porous Semiconductors

Porous semiconductors represent a relatively new class of materials formed by the selective etching of a single or polycrystalline substrate. Although porous silicon has received considerable attention due to its novel optical properties1, porous layers can be formed in other semiconductors such as GaAs and GaP. These materials are characterised by very high surface area and by electrical, optical and chemical properties that may differ considerably from bulk. The properties depend on the pore morphology, which can be controlled by adjusting the processing conditions and the dopant concentration. A number of novel structures can be fabricated using selective etching. For example, self-supporting membranes can be made by growing pores through a wafer, films with modulated pore structure can be fabricated by varying the applied potential during growth, composite structures can be prepared by depositing a second phase into the pores and silicon-on-insulator structures can be formed by oxidising a buried porous layer. In all these applications the ability to grow nanostructures controllably is critical.

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