A Study of Reduction of Switching Power Supply Noise under Conducted Emission Noise Standard below 150kHz

Kenichi Nishijima; Shinji Ikeda

doi:10.5416/jipe.43.81

A Study of Reduction of Switching Power Supply Noise under Conducted Emission Noise Standard below 150kHz

Journal of the Japan Institute of Power Electronics ◽

10.5416/jipe.43.81 ◽

2017 ◽

Vol 43 (0) ◽

pp. 81-88

Author(s):

Kenichi Nishijima ◽

Shinji Ikeda

Keyword(s):

Power Supply ◽

Power Supply Noise ◽

Switching Power Supply ◽

Switching Power ◽

Supply Noise ◽

Conducted Emission

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SRAM in hold-operation: Modeling the interaction of soft-errors and switching power-supply noise

2012 IEEE International Symposium on Circuits and Systems ◽

10.1109/iscas.2012.6271801 ◽

2012 ◽

Cited By ~ 1

Author(s):

Amrut Kolhapure ◽

Animesh Kumar

Keyword(s):

Power Supply ◽

Soft Errors ◽

Power Supply Noise ◽

Switching Power Supply ◽

Switching Power ◽

Supply Noise

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Study on the Effect of Switching Power Supply Noise and EFT / B Noise on the Load Side

Journal of the Japan Institute of Power Electronics ◽

10.5416/jipe.46.36 ◽

2020 ◽

Vol 46 (0) ◽

pp. 36-43

Author(s):

Kenichi Nishijima

Keyword(s):

Power Supply ◽

Power Supply Noise ◽

Switching Power Supply ◽

Switching Power ◽

Supply Noise

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Influence of Switching Power Supply Noise on the Magnetic Field Sensing of a High-Frequency Carrier-Type Magnetic Field Sensor

Journal of the Magnetics Society of Japan ◽

10.3379/jmsjmag.30.201 ◽

2006 ◽

Vol 30 (2) ◽

pp. 201-207 ◽

Cited By ~ 1

Author(s):

K. Takizawa ◽

Y. Tomita ◽

K. -I. Nishijima ◽

T. Sato ◽

K. Yamasawa ◽

...

Keyword(s):

Magnetic Field ◽

Power Supply ◽

High Frequency ◽

Magnetic Field Sensor ◽

Power Supply Noise ◽

Switching Power Supply ◽

Switching Power ◽

Supply Noise ◽

Field Sensor ◽

The Magnetic Field

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Proposal of a Switching Power Supply Noise Mitigation Technique on Industrial Power Supply Overlaid Communication System

Journal of Signal Processing ◽

10.2299/jsp.19.43 ◽

2015 ◽

Vol 19 (2) ◽

pp. 43-53

Author(s):

Hidetsugu Koga ◽

Yuhei Nagao ◽

Masayuki Kurosaki ◽

Hiroshi Ochi

Keyword(s):

Power Supply ◽

Communication System ◽

Power Supply Noise ◽

Switching Power Supply ◽

Noise Mitigation ◽

Switching Power ◽

Supply Noise ◽

Mitigation Technique

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Measurement of the source impedance of conducted emission using mode separable LISN: Conducted emission of a switching power supply

Electrical Engineering in Japan ◽

10.1002/eej.1154 ◽

2002 ◽

Vol 139 (2) ◽

pp. 72-78 ◽

Cited By ~ 2

Author(s):

Junichi Miyashita ◽

Masayuki Mitsuzawa ◽

Toshiyuki Karube ◽

Kiyohito Yamasawa ◽

Toshiro Sato

Keyword(s):

Power Supply ◽

Switching Power Supply ◽

Switching Power ◽

Source Impedance ◽

Conducted Emission

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KEK Digital Accelerator and the Next Generation of High Power Switching Power Supply

IEEJ Transactions on Fundamentals and Materials ◽

10.1541/ieejfms.132.13 ◽

2012 ◽

Vol 132 (1) ◽

pp. 13-16

Author(s):

Ken Takayama ◽

Katsuya Okamura

Keyword(s):

High Power ◽

Power Supply ◽

Switching Power Supply ◽

Next Generation ◽

Power Switching ◽

Switching Power

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AC Power Supply Noise Simulation of CMOS Microprocessor with LSI Chip-Package-Board Integrated Model

IEICE Transactions on Electronics ◽

10.1587/transele.e97.c.264 ◽

2014 ◽

Vol E97.C (4) ◽

pp. 264-271 ◽

Cited By ~ 1

Author(s):

Kumpei YOSHIKAWA ◽

Kouji ICHIKAWA ◽

Makoto NAGATA

Keyword(s):

Power Supply ◽

Integrated Model ◽

Power Supply Noise ◽

Supply Noise ◽

Noise Simulation ◽

Ac Power

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Power-Supply-Noise-Aware Timing Analysis and Test Pattern Regeneration

IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences ◽

10.1587/transfun.e99.a.2320 ◽

2016 ◽

Vol E99.A (12) ◽

pp. 2320-2327

Author(s):

Cheng-Yu HAN ◽

Yu-Ching LI ◽

Hao-Tien KAN ◽

James Chien-Mo LI

Keyword(s):

Power Supply ◽

Test Pattern ◽

Timing Analysis ◽

Power Supply Noise ◽

Supply Noise

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Research on 6V/5KA High Power HIGH Frequency Switching Power supply

2020 7th International Forum on Electrical Engineering and Automation (IFEEA) ◽

10.1109/ifeea51475.2020.00072 ◽

2020 ◽

Author(s):

Defu Zhang ◽

Cheng Liu ◽

Yongyin Qu

Keyword(s):

High Power ◽

Power Supply ◽

High Frequency ◽

Switching Power Supply ◽

Switching Power

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Power Supply Noise-Aware Scan Test Pattern Reshaping for At-Speed Delay Fault Testing of Monolithic 3D ICs *

2020 IEEE 29th Asian Test Symposium (ATS) ◽

10.1109/ats49688.2020.9301568 ◽

2020 ◽

Author(s):

Shao-Chun Hung ◽

Yi-Chen Lu ◽

Sung Kyu Lim ◽

Krishnendu Chakrabarty

Keyword(s):

Power Supply ◽

Test Pattern ◽

Power Supply Noise ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

3D Ics ◽

Scan Test ◽

Supply Noise

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