Microchemistry of ZnO Varistors

1992 ◽  
Vol 50 (2) ◽  
pp. 1694-1695
Author(s):  
K. K. Soni ◽  
J. Hwang ◽  
V. P. Dravid ◽  
T. O. Mason ◽  
R. Levi-Setti
Keyword(s):  
Grain Boundaries ◽  
Multiple Roles ◽  
Grain Boundary Engineering ◽  
Ion Microprobe ◽  
Dopant Distribution ◽  
Important Ingredient ◽  
Zno Varistor ◽  
Zno Varistors ◽  
Zno Powder ◽  
The University

ZnO varistors are made by mixing semiconducting ZnO powder with powders of other metal oxides e.g. Bi2O3, Sb2O3, CoO, MnO2, NiO, Cr2O3, SiO2 etc., followed by conventional pressing and sintering. The non-linear I-V characteristics of ZnO varistors result from the unique properties that the grain boundaries acquire as a result of dopant distribution. Each dopant plays important and sometimes multiple roles in improving the properties. However, the chemical nature of interfaces in this material is formidable mainly because often trace amounts of dopants are involved. A knowledge of the interface microchemistry is an essential component in the ‘grain boundary engineering’ of materials. The most important ingredient in this varistor is Bi2O3 which envelopes the ZnO grains and imparts high resistance to the grain boundaries. The solubility of Bi in ZnO is very small but has not been experimentally determined as a function of temperature.In this study, the dopant distribution in a commercial ZnO varistor was characterized by a scanning ion microprobe (SIM) developed at The University of Chicago (UC) which offers adequate sensitivity and spatial resolution.

Aspects of high-resolution imaging with a scanning ion microprobe

1986 ◽  
Vol 44 ◽  
pp. 750-751
Author(s):  
R. Levi-Setti ◽  
J. M. Chabala ◽  
Y. L. Wang
Keyword(s):  
Metal Ion ◽  
Secondary Ion Mass Spectrometry ◽  
Chromatic Aberration ◽  
Ion Source ◽  
Ion Microprobe ◽  
Emission Pattern ◽  
Intrinsic Resolution ◽  
Resolution Imaging ◽  
20 Nm ◽  
Secondary Ion

We have shown the feasibility of 20 nm lateral resolution in both topographic and elemental imaging using probes of this size from a liquid metal ion source (LMIS) scanning ion microprobe (SIM). This performance, which approaches the intrinsic resolution limits of secondary ion mass spectrometry (SIMS), was attained by limiting the size of the beam defining aperture (5μm) to subtend a semiangle at the source of 0.16 mr. The ensuing probe current, in our chromatic-aberration limited optical system, was 1.6 pA with Ga+ or In+ sources. Although unique applications of such low current probes have been demonstrated,) the stringent alignment requirements which they imposed made their routine use impractical. For instance, the occasional tendency of the LMIS to shift its emission pattern caused severe misalignment problems.

Imaging of Al-Li-Cu alloys with a Scanning Ion Microprobe

1990 ◽  
Vol 48 (2) ◽  
pp. 314-315
Author(s):  
K.K. Soni ◽  
D.B. Williams ◽  
J.M. Chabala ◽  
R. Levi-Setti ◽  
D.E. Newbury
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Equilibrium Phase ◽  
Icosahedral Symmetry ◽  
Ion Microprobe ◽  
X Ray ◽  
Cu Alloys ◽  
Two Phases ◽  
The University ◽  
Secondary Ion

In contrast to the inability of x-ray microanalysis to detect Li, secondary ion mass spectrometry (SIMS) generates a very strong Li+ signal. The latter’s potential was recently exploited by Williams et al. in the study of binary Al-Li alloys. The present study of Al-Li-Cu was done using the high resolution scanning ion microprobe (SIM) at the University of Chicago (UC). The UC SIM employs a 40 keV, ∼70 nm diameter Ga+ probe extracted from a liquid Ga source, which is scanned over areas smaller than 160×160 μm2 using a 512×512 raster. During this experiment, the sample was held at 2 × 10-8 torr.In the Al-Li-Cu system, two phases of major importance are T1 and T2, with nominal compositions of Al2LiCu and Al6Li3Cu respectively. In commercial alloys, T1 develops a plate-like structure with a thickness <∼2 nm and is therefore inaccessible to conventional microanalytical techniques. T2 is the equilibrium phase with apparent icosahedral symmetry and its presence is undesirable in industrial alloys.

Fluidized Catalytic Cracking Catalyst Microstructure as Determined by A Scanning Ion Microprobe

1990 ◽  
Vol 48 (2) ◽  
pp. 302-303
Author(s):  
J.K. Lampert ◽  
G.S. Koermer ◽  
J.M. Macaoy ◽  
J.M. Chabala ◽  
R. Levi-Setti
Keyword(s):  
Catalytic Cracking ◽  
Secondary Ion Mass Spectrometry ◽  
Fuel Oil ◽  
Ion Microprobe ◽  
Fluidized Catalytic Cracking ◽  
Ion Probe ◽  
Silica Alumina ◽  
Resolution Imaging ◽  
The University ◽  
High Spatial Resolution Imaging

We have used high spatial resolution imaging secondary ion mass spectrometry (SIMS) to differentiate mineralogical phases and to investigate chemical segregations in fluidized catalytic cracking (FCC) catalyst particles. The oil industry relies on heterogeneous catalysis using these catalysts to convert heavy hydrocarbon fractions into high quality gasoline and fuel oil components. Catalyst performance is strongly influenced by catalyst microstructure and composition, with different chemical reactions occurring at specific types of sites within the particle. The zeolitic portions of the particle, where the majority of the oil conversion occurs, can be clearly distinguished from the surrounding silica-alumina matrix in analytical SIMS images.The University of Chicago scanning ion microprobe (SIM) employed in this study has been described previously. For these analyses, the instrument was operated with a 40 keV, 10 pA Ga+ primary ion probe focused to a 30 nm FWHM spot. Elemental SIMS maps were obtained from 10×10 μm2 areas in times not exceeding 524s.

Microanalysis of precipitates in aluminum-lithium alloys with a scanning ion microprobe

1989 ◽  
Vol 37 (1) ◽  
pp. 78-94 ◽  
Author(s):  
D.B. Williams ◽  
R. Levi-Setti ◽  
J.M. Chabala ◽  
Y.L. Wang ◽  
D.E. Newbury
Keyword(s):  
Ion Microprobe ◽  
Aluminum Lithium ◽  
Aluminum Lithium Alloys ◽  
Lithium Alloys

Ion microprobe for studying cluster ion decay reactions

1990 ◽  
Vol 15 (10) ◽  
pp. 587-590 ◽  
Author(s):  
A. D. Bekkerman ◽  
N. Kh. Dzhemilev ◽  
V. M. Rotstein
Keyword(s):  
Ion Microprobe ◽  
Cluster Ion
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