scholarly journals High-Speed Measurement Method for Molecular Orientation of Thin Films

MEMBRANE ◽  
2008 ◽  
Vol 33 (3) ◽  
pp. 124-127
Author(s):  
Daisuke Tanooka
Keyword(s):  
Thin Films ◽  
Molecular Orientation ◽  
High Speed ◽  
Measurement Method ◽  
Speed Measurement

Study of Velocity Measurement Error Analysis and Improving Velocity Measurement Accuracy on High-Speed Train

2014 ◽  
Vol 596 ◽  
pp. 468-471
Author(s):  
Tao Hou ◽  
Duo Wang Fan ◽  
Hong Xia Niu
Keyword(s):  
Measurement Error ◽  
Error Analysis ◽  
Velocity Measurement ◽  
High Speed ◽  
Measurement Method ◽  
Measurement Accuracy ◽  
Measuring System ◽  
High Speed Train ◽  
Speed Measurement ◽  
Velocity Measuring

For the problem of a big velocity measurement error,analyzed the velocity measurement error and studied the method of improving velocity measurement accuracy for the velocity measuring system of high-speed train.In this analysis and method, the speed error analysis was carried out based on understand the characteristics of the high-speed train speed sensor, and found that there is a bigger error. Then discussed the influence of large errors of the control system, and then put forward the improved M/T speed measurement method to solve the error problem. Finally, calculated velocity-measuring error for the improved M/T speed measurement method. The results show that the accuracy of speed has improved greatly. The research method can improve the accuracy to meet the requiring of train safety and smooth run.

scholarly journals Current-limiting amplifier for high speed measurement of resistive switching data

2021 ◽  
Vol 92 (5) ◽  
pp. 054701
Author(s):  
T. Hennen ◽  
E. Wichmann ◽  
A. Elias ◽  
J. Lille ◽  
O. Mosendz ◽  
...  
Keyword(s):  
Resistive Switching ◽  
High Speed ◽  
Limiting Amplifier ◽  
Speed Measurement ◽  
Current Limiting

Development of high speed measurement system for cell-scaffold interaction

2015 ◽  
Author(s):  
Yu Hirano ◽  
Masaru Kojima ◽  
Mitsuhiro Horade ◽  
Kazuto Kamiyama ◽  
Yasushi Mae ◽  
...  
Keyword(s):  
Measurement System ◽  
High Speed ◽  
Speed Measurement ◽  
Cell Scaffold

Ripple Technique; a Novel Non-Contact Wafer Emissivity and Temperature Method for RTP

1991 ◽  
Vol 224 ◽  
Author(s):  
C. Schietinger ◽  
B. Adams ◽  
C. Yarling
Keyword(s):  
Optical Fiber ◽  
Measurement Technique ◽  
Thermal Processing ◽  
High Speed ◽  
Rapid Thermal Processing ◽  
Wafer Surface ◽  
Speed Measurement ◽  
Temperature Method ◽  
Emissivity Measurement ◽  
Emissivity Measurements

AbstractA novel wafer temperature and emissivity measurement technique for rapid thermal processing (RTP) is presented. The ‘Ripple Technique’ takes advantage of heating lamp AC ripple as the signature of the reflected component of the radiation from the wafer surface. This application of Optical Fiber Thermometry (OFT) allows high speed measurement of wafer surface temperatures and emissivities. This ‘Ripple Technique’ is discussed in theoretical and practical terms with wafer data presented. Results of both temperature and emissivity measurements are presented for RTP conditions with bare silicon wafers and filmed wafers.

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