Surface structure determination of Ga/Si (111) 3x3-R30 by Kikuchi electron holography

2001 ◽  
Author(s):  
Wai-kei So
Keyword(s):  
Surface Structure ◽  
Structure Determination ◽  
Electron Holography

Structure Determination of the Nisi2(111) Surface Using Medium Energy Ion Scattering with Monolayer Resolution

1990 ◽  
Vol 202 ◽  
Author(s):  
J. Vrijmoeth ◽  
P.M. Zagwijn ◽  
J.W.M. Frenken ◽  
J.F. van der Veen
Keyword(s):  
Surface Structure ◽  
Structure Determination ◽  
New Method ◽  
Medium Energy ◽  
Ion Scattering ◽  
Triple Layer ◽  
Medium Energy Ion Scattering

ABSTRACTThe surface structure of epitaxial NiSi2 films grown on Si (111) has been determined using a new method. The backscattering signals from subsequent Ni layers in the NiSi2 (111) surface are resolved.The topology of the NiSi2 (111) surface is concluded to be bulklike, i.e., it is terminated by a Si – Ni – Si triple layer.

Structure determination of MBE-grown GaAs(001)-2×4 surfaces by quantitative RHEED analyses

1993 ◽  
Vol 51 ◽  
pp. 1008-1009
Author(s):  
Y. Ma ◽  
S. Lordi ◽  
J. A. Eades
Keyword(s):  
Gallium Arsenide ◽  
Surface Structure ◽  
Structure Determination ◽  
Electronic Device ◽  
Mbe Growth ◽  
X Ray ◽  
Device Structures ◽  
Structure Determinations ◽  
Quantitative Analyses

The GaAs(001) surface is the most widely used gallium arsenide face in the MBE growth of multilayer electronic device structures. Various reconstructions on this face have been reported. They range from the As-rich (2×4) to the Ga-rich (4×2). The As-rich (2×4) surface is the most important one of these, since MBE growth usually starts and ends with this surface. A multislice formalism of Cowley & Moodie with a recently developed edge patching method has been applied to quantitative analyses of the RHEED patterns from MBE grown GaAs(001)-2×4 surfaces. The analyses are based on the ordering of visually estimated spot intensities of the observed RHEED patterns from the GaAs(001)-2×4 surfaces, which is similar to the approach used in early X-ray structure determinations. The surface structure has been proved to be a dimerized vacant 2×4 reconstruction with one dimer of every four missing, which is consistent with previous STM observations.

Structure Determination of the Nisi2 (111) Surface Using Medium Energy Ion Scattering with Monolayer Resolution

1990 ◽  
Vol 208 ◽  
Author(s):  
J. Vrijmoeth ◽  
P. M. Zagwijn ◽  
J. W. M. Frenken ◽  
J. F. Van Der Veen
Keyword(s):  
Surface Structure ◽  
Structure Determination ◽  
New Method ◽  
Medium Energy ◽  
Ion Scattering ◽  
Triple Layer ◽  
Medium Energy Ion Scattering

ABSTRACTThe surface structure of epitaxial Nisi2 films grown on Si(111) has been determined using a new method. The backscattering signals from subsequent Ni layers in the Nisi2 (111) surface are resolved.The topology of the Nisi2(111) surface is concluded to be bulklike, i.e., it is terminated by a Si – Ni – Si triple layer.

Surface structure determination of Cu (100) using a minicomputer

1985 ◽  
Vol 18 (4) ◽  
pp. 933-945 ◽  
Author(s):  
K Heinz ◽  
N Bickel ◽  
G Besold ◽  
K Muller
Keyword(s):  
Surface Structure ◽  
Structure Determination

Surface structure determination of Sn deposited on Pt(111) by low energy alkali ion scattering

1991 ◽  
Vol 254 (1-3) ◽  
pp. 45-57 ◽  
Author(s):  
S.H. Overbury ◽  
D.R. Mullins ◽  
M.T. Paffett ◽  
B.E. Koel
Keyword(s):  
Surface Structure ◽  
Structure Determination ◽  
Low Energy ◽  
Ion Scattering ◽  
Alkali Ion

Surface-structure determination of Sc(0001) using LEED and STM

1995 ◽  
Vol 51 (24) ◽  
pp. 17946-17951 ◽  
Author(s):  
S. S. Dhesi ◽  
R. G. White ◽  
A. J. Patchett ◽  
M. P. Evans ◽  
M. H. Lee ◽  
...  
Keyword(s):  
Surface Structure ◽  
Structure Determination

scholarly journals Surface structure determination of black phosphorus using photoelectron diffraction

2016 ◽  
Vol 93 (3) ◽  
Author(s):  
Luis Henrique de Lima ◽  
Lucas Barreto ◽  
Richard Landers ◽  
Abner de Siervo
Keyword(s):  
Surface Structure ◽  
Structure Determination ◽  
Black Phosphorus ◽  
Photoelectron Diffraction
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