AFM Study of Rubber Compounds

2005 ◽  
Vol 78 (1) ◽  
pp. 17-27 ◽  
Author(s):  
C. C. Wang ◽  
J. B. Donnet ◽  
T. K. Wang ◽  
M. Pontier-Johnson ◽  
F. Welsh
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Black ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Carbon Blacks ◽  
Atomic Force ◽  
Rubber Compounds ◽  
Road Testing

Abstract A series of rubber compounds filled with carbon blacks and silica has been studied by atomic force microscopy (AFM). The microdispersion of carbon black aggregates in rubber compounds can be clearly observed. The surface morphology of worn treads after road testing studied by AFM is also reported.

Study on the Structures and Surface Forces of Different Carbon Blacks by Atomic Force Microscopy

2014 ◽  
Vol 496-500 ◽  
pp. 106-109 ◽  
Author(s):  
Qing Shan Fu ◽  
Jian Chen ◽  
Zu Xiao Yu ◽  
Rui Song Yang
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Black ◽  
Polymer Matrix ◽  
Dibutyl Phthalate ◽  
Surface Forces ◽  
Surface Absorption ◽  
Force Microscopy ◽  
Carbon Blacks ◽  
Atomic Force ◽  
High Structure

Carbon blacks are used universally as fillers in polymer matrix for mechanical, electronical and thermal properties improvement. Plenty of studies show that the structure and surface properties affect the function of carbon blacks in polymer matrix intensively. However, the reinforcing mechanism is still controversial. In this study, we studied the structure of three carbon blacks by Dibutyl phthalate (DBP) absorption and atomic force microscopy (AFM) and analyzed the absorption/desorption forces of the three carbon blacks surface by force-distance curves. The results show that the carbon black with relatively high structure possesses more branches and bigger aggregation morphologies and shows the highest surface absorption/desorption forces, which may increase the reaction between carbon black and polymer matrix.

Surface morphology of As-deposited and laser-damaged dielectric mirror coatings studied in-situ by atomic force microscopy

1992 ◽  
Author(s):  
Mark R. Kozlowski ◽  
Michael C. Staggs ◽  
Mehdi Balooch ◽  
Robert J. Tench ◽  
Wigbert J. Siekhaus
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Dielectric Mirror ◽  
Atomic Force

Surface morphology studies on sublimation grown GaN by atomic force microscopy

1999 ◽  
Vol 200 (3-4) ◽  
pp. 348-352 ◽  
Author(s):  
R.S Qhalid Fareed ◽  
S Tottori ◽  
K Nishino ◽  
S Sakai
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals BTEX detection with composites of ethylenevinyl acetate and nanostructured carbon

2017 ◽  
Vol 8 ◽  
pp. 982-988 ◽  
Author(s):  
Santa Stepina ◽  
Astrida Berzina ◽  
Gita Sakale ◽  
Maris Knite
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Black ◽  
Benzene Ring ◽  
Gas Sensing ◽  
Nanostructured Carbon ◽  
Force Microscopy ◽  
Atomic Force ◽  
Vapour Concentration ◽  
Benzene Toluene ◽  
Acetate Copolymer

By using a solvent-based method composites of ethylenevinyl acetate copolymer and carbon black (EVA–CB) were synthesized for sensing BTEX (benzene, toluene, ethylbenzene and xylene) vapours. The composites were characterized using atomic force microscopy (AFM) in an electroconductive mode. Gas sensing results show that EVA-CB can reproducibly detect BTEX and that the response increases linearly with vapour concentration. Compared to gas-sensing measurements of gasoline vapours, the responses with toluene and ethylbenzene are different and can be explained by varying side chains of the benzene ring.

Chromic Polydiacetylene Single Crystals: Atomic Force Microscopy Studies

1995 ◽  
Vol 413 ◽  
Author(s):  
V. Shivshankar ◽  
C. Sung ◽  
J. Kumar ◽  
S. K. Tripathy ◽  
D. J. Sandman
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Single Crystals ◽  
Ambient Conditions ◽  
Free Standing ◽  
Force Microscopy ◽  
Sensor Performance ◽  
Atomic Force ◽  
Variable Surface

ABSTRACTWe have studied the surface morphology of free standing single crystals of thermochromic polydiacetylenes (PDAs), namely, ETCD and IPUDO (respectively, the ethyl and isopropyl urethanes of 5,7-dodecadiyn-1,12-diol), by Atomic Force Microscopy (AFM) under ambient conditions. Micron scale as well as molecularly resolved images were obtained. The micron scale images indicate a variable surface, and the molecularly resolved images show a well defined 2-D lattice that is interpreted in terms of molecular models and known crystallographic data. Thereby information about surface morphology, which is crucial to potential optical device or chromic sensor performance is available. We also report the observation of a “macroscopic shattering” of the IPUDO monomer crystal during in-situ UV polymerization studies.

MICROCRACKS IN ~ 100 MeV Si7+-ION-IRRADIATED p-SILICON SURFACES

2004 ◽  
Vol 11 (03) ◽  
pp. 265-269
Author(s):  
O. P. SINHA ◽  
P. C. SRIVASTAVA ◽  
V. GANESAN
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Target Surface ◽  
Silicon Surfaces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Induced Stress

The p-silicon surfaces have been irradiated with ~ 100 MeV Si 7+ions to a fluence of 2.2×1013 ions cm -2, and surface morphology has been studied with atomic force microscopy (AFM). Interesting features of cracks of ~ 47 nm in depth and ~ 103 nm in width on the irradiated surfaces have been observed. The observed features seemed to have been caused by the irradiation-induced stress in the irradiated regions of the target surface.

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