Characterization of Rubber Micro-Morphology by Atomic Force Microscopy(AFM)

2003 ◽  
Vol 76 (1) ◽  
pp. 1-11 ◽  
Author(s):  
I. H. Jeon ◽  
H. Kim ◽  
S. G. Kim
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Black ◽  
Natural Rubber ◽  
Force Microscopy ◽  
Rubber Blend ◽  
Microscopy Technique ◽  
Atomic Force ◽  
Transmission Electron ◽  
Long Time ◽  
Micro Morphology

Abstract Micro-morphology of the rubber compounds, such as polymer compatibility and carbon black distribution, is one of the most important parameters affecting compound performance. Transmission Electron Microscopy (TEM) technique enables us to examine this micro-morphology, but has many difficulties. It requires high skill for sample preparation, high cost and a long time. Atomic Force Microscopy (AFM) technique is a relatively easy way for detecting these images. Through TM-AFM (Tapping Mode Atomic Force Microscopy) technique, two different polymer domains were distinguished in the unfilled rubber blend (natural rubber/ synthetic rubber blend). In order to verify the images, analogue signal (voltage) histograms for those images were analyzed by Gaussian multi-peak analysis method. Filler morphology was also examined in the filled natural rubber and filled rubber blend compounds. Silica and carbon black showed different behavior in the rubber blend. Carbon black lies predominantly in the polybutadiene rubber domain whereas silica exists in the natural rubber domain.

scholarly journals Evaluation of Mechanical Properties of Carbon Black Reinforced Natural Rubber by Atomic Force Microscopy

2006 ◽  
Vol 79 (11) ◽  
pp. 509-515 ◽  
Author(s):  
Hideyuki NUKAGA ◽  
So FUJINAMI ◽  
Hiroyuki WATABE ◽  
Ken NAKAJIMA ◽  
Toshio NISHI
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscopy ◽  
Carbon Black ◽  
Natural Rubber ◽  
Force Microscopy ◽  
Atomic Force

Structural Characterization of Natural Rubber Recent Research Advancements

2014 ◽  
Vol 1052 ◽  
pp. 231-241
Author(s):  
Long Mei Wu ◽  
Shuang Quan Liao ◽  
Peng Qu ◽  
Rong Jie Zhou ◽  
Bo Xiang Wang
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Natural Rubber ◽  
Laser Scanning Microscopy ◽  
Methylene Proton ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Rubber Particles

The micro-structure of the surface of Hevea brasiliensis latex particles has been found by the means of atomic force microscopy (AFM), confocal laser scanning microscopy (CLSM), scanning electron microscopy (SEM), transmission electron microscopy (TEM), cryogenic transmission electron microscopy (cryo-TEM), and electrokinetics over a broad range of KNO3electrolyte concentrations (4-300 mM) and pH values (1-8). Based on the atomic force microscopy analysis of the fresh natural rubber latex, it could be estimated that the protein-lipid layer is covered with the rubber particles. The molecules in the particle were labeled with fluorescent Rhodamine (RB), and were monitored by CLSM. SEM and TEM were used to observe the surface of fresh natural rubber particles and were dyed by osmium tetroxide. Fourier Transform Infrared Spectroscopy (FTIR) has been used to characterize the nitrogenous groups in natural rubber and deproteinized natural rubber (DPNR). The FTIR and1H-NMR analysis of phosphatase-treated DPNR confirmed that the presence of mono- and diphosphate terminations without phospholipids was also unlikely owing to the presence of a methylene proton signal of an isoprene unit linked to mono- and diphosphate groups. The , [η] and Higgins’ k’ of DPNR decreased after being treated with lipase.

Defect-Engineered Graded GexSi1-x Buffers on Si (001) with Extreme Low Threading Dislocation Density

1995 ◽  
Vol 378 ◽  
Author(s):  
G. Kissinger ◽  
T. Morgenstern ◽  
G. Morgenstern ◽  
H. B. Erzgräber ◽  
H. Richter
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Dislocation Density ◽  
Threading Dislocation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Dislocation Densities ◽  
Threading Dislocation Density

AbstractStepwise equilibrated graded GexSii-x (x≤0.2) buffers with threading dislocation densities between 102 and 103 cm−2 on the whole area of 4 inch silicon wafers were grown and studied by transmission electron microscopy, defect etching, atomic force microscopy and photoluminescence spectroscopy.

scholarly journals BTEX detection with composites of ethylenevinyl acetate and nanostructured carbon

2017 ◽  
Vol 8 ◽  
pp. 982-988 ◽  
Author(s):  
Santa Stepina ◽  
Astrida Berzina ◽  
Gita Sakale ◽  
Maris Knite
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Black ◽  
Benzene Ring ◽  
Gas Sensing ◽  
Nanostructured Carbon ◽  
Force Microscopy ◽  
Atomic Force ◽  
Vapour Concentration ◽  
Benzene Toluene ◽  
Acetate Copolymer

By using a solvent-based method composites of ethylenevinyl acetate copolymer and carbon black (EVA–CB) were synthesized for sensing BTEX (benzene, toluene, ethylbenzene and xylene) vapours. The composites were characterized using atomic force microscopy (AFM) in an electroconductive mode. Gas sensing results show that EVA-CB can reproducibly detect BTEX and that the response increases linearly with vapour concentration. Compared to gas-sensing measurements of gasoline vapours, the responses with toluene and ethylbenzene are different and can be explained by varying side chains of the benzene ring.

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