Application of X-Ray Diffraction Methods to the Identification of Natural and Synthetic Rubbers

1951 ◽  
Vol 24 (2) ◽  
pp. 355-365 ◽  
Author(s):  
S. Goldspiel ◽  
F. Bernstein
Keyword(s):  
Low Temperature ◽  
Geiger Counter ◽  
X Ray Diffraction ◽  
X Ray ◽  
Low Temperature Aging ◽  
Stock Types ◽  
Diffraction Patterns ◽  
Rubber Stock ◽  
Temperature Aging ◽  
Natural And Synthetic

Abstract In this paper, x-ray diffraction patterns and data for rubber compounding ingredients are presented and applied to the identification of major crystalline ingredients in several basic rubber stock types. Methods for the identification of natural and synthetic elastomers by low temperature aging and (or) stretching, using film techniques, are described. The extension of such methods to the Geiger counter x-ray spectrometer is presented and discussed.

Apparent Activation Energy in Low Temperature Aging of Y-TZP Ceramics

2010 ◽  
Vol 105-106 ◽  
pp. 100-103
Author(s):  
Qi Fei Xie ◽  
Cheng Wang ◽  
Qing Feng Zan ◽  
Li Min Dong
Keyword(s):  
Activation Energy ◽  
Low Temperature ◽  
Apparent Activation Energy ◽  
Coordinate Systems ◽  
X Ray Diffraction ◽  
X Ray ◽  
Low Temperature Aging ◽  
Diffraction Patterns ◽  
Straight Lines ◽  
Temperature Aging

Apparent activation energy in low temperature aging of two kinds of Y-TZP ceramic was studied in this paper. The ceramics were processed into small pieces, and aging in 100°C, 110°C, 120°C, 130°C and 140°C respectively. The content of monoclinic phase was calculated by X-ray diffraction patterns and the microstructure was scanned by SEM. According to MAJ law and Arrhenius formation, straight lines were fitted in coordinate systems of ln (ln (1/(1 − f )))-ln t and ln b-1/T, and the kinetic parameters of low temperature aging of Y-TZP ceramic were calculated according to these lines. The results revealed that grain size significantly affected apparent activation energy of Y-TZP ceramics.

X-ray diffraction study of low temperature aging in U–5.8 wt.%Nb

2015 ◽  
Vol 456 ◽  
pp. 41-45 ◽  
Author(s):  
Yanzhi Zhang ◽  
Xiaolin Wang ◽  
Qinying Xu ◽  
Yufei Li
Keyword(s):  
Low Temperature ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray ◽  
Low Temperature Aging ◽  
Temperature Aging

Low Temperature Preparation of y‐bA‐cU‐0 Films by Omcvd

1989 ◽  
Vol 169 ◽  
Author(s):  
Taiji Tsuruoka ◽  
Ryodo Kawasaki ◽  
Hitoshi Abe ◽  
Susumu Shibata
Keyword(s):  
Low Temperature ◽  
Deposition Rate ◽  
X Ray Diffraction ◽  
Axis Orientation ◽  
X Ray ◽  
Low Temperature Preparation ◽  
Zero Resistance ◽  
Diffraction Patterns ◽  
Temperature Preparation

AbstractBy using N2O for oxygen source, Y‐Ba‐Cu‐O films prepared at 650” C on the SrTiO3 substrates showed zero resistance at 79K. The deposition rate of Y‐Ba‐Cu‐0 films on MgO(l00) substrates by using N2O gas was nearly half of that using 02 gas. X‐ray diffraction patterns of Y‐Ba‐Cu‐0 films grown on SrTiO3(100) and MgO(l00) substrates indicate c‐axis orientation.

The Gamma to Alpha Transformation in Thin Film Alumina

1984 ◽  
Vol 41 ◽  
Author(s):  
E. M. Clausen ◽  
J. J. Hren
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Thermal History ◽  
Starting Material ◽  
X Ray Diffraction ◽  
Transition Alumina ◽  
X Ray ◽  
Aluminum Hydroxides ◽  
Transitional Forms ◽  
Diffraction Patterns

AbstractMany forms of low temperature alumina have been identified [1]. These are collectively referred to as transitional forms. The particular form depends strongly on the starting material (e.g., hydrated, thermally oxidized, alkoxide, etc.), the impurities present, and on thermal history. Although different forms of transition alumina are sometimes referred to as phases, none can be considered a true polymorph of corundum, i.e., α-alumina. Transformations from one form to another which occur upon heating are not reversible, although they are quite reproducible [2]. These different transitional structures are therefore considered to comprise different states of reordering. Figure 1 is a compendium of powder x-ray diffraction patterns from all known transitional aluminas and several aluminum hydroxides [3]. It i.s obvious that there are several crystallographic spacings which are nearly common to all forms.

Low-Temperature X-Ray Diffraction of Frozen Electrolytes

1961 ◽  
Vol 5 ◽  
pp. 48-56 ◽  
Author(s):  
H.J. Weltman
Keyword(s):  
Low Temperature ◽  
Room Temperature ◽  
Structural Changes ◽  
Polycrystalline Material ◽  
Sample Introduction ◽  
X Ray Diffraction ◽  
Strip Chart Recorder ◽  
X Ray ◽  
Chart Recorder ◽  
Diffraction Patterns

AbstractA low-temperature X-ray diffraction apparatus has been constructed to study structure and structural changes of electrolytes in the frozen state. This apparatus, which is inexpensive and easy to construct, is an attachment to a standard wide-angle diffractometer. Diffraction patterns may be obtained of various types of materials at any temperature from room temperature to −196°C with a control of ±1°C. The diffraction patterns are recorded on a strip-chart recorder as they are being obtained. Thus, this diffractometer method has several advantages over the camera methods usually employed for low-temperature X-ray diffraction work. A unique sample-introduction method is described which ensures a polycrystalline material suitable for obtaining diffraction patterns. Such patterns are shown for various concentrations of salts in water at several low temperatures, phase transformations being in evidence.

Sign in / Sign up

Export Citation Format

Share Document