Analyzing the Efficient Test Order for Integration Testing

Reena Dadhich

doi:10.5121/acij.2012.3405

Analyzing the Efficient Test Order for Integration Testing

Advanced Computing An International Journal ◽

10.5121/acij.2012.3405 ◽

2012 ◽

Vol 3 (4) ◽

pp. 35-42

Author(s):

Reena Dadhich

Keyword(s):

Integration Testing ◽

Efficient Test ◽

Test Order

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An investigation of strategies for finding test order during Integration testing of object Oriented applications

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10.1109/icm2cs.2009.5397936 ◽

2009 ◽

Cited By ~ 7

Author(s):

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S. Sabharwal ◽

P. Sidhu

Keyword(s):

Object Oriented ◽

Integration Testing ◽

Test Order

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10.1109/qsic.2005.64 ◽

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H.W. Schmidt ◽

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Keyword(s):

Integration Testing ◽

Test Order

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10.1109/ase.2009.84 ◽

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Keyword(s):

Software Component ◽

Integration Testing ◽

Component Integration ◽

Automated Test ◽

Test Order

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10.1109/cmpsac.1997.625079 ◽

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Author(s):

Kuo-Chung Tai ◽

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Keyword(s):

Object Oriented ◽

Integration Testing ◽

Test Order

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Case Medical Research ◽

10.31525/ct1-nct03966534 ◽

2019 ◽

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Keyword(s):

Blood Test ◽

Test Order

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10.21236/ada165328 ◽

1985 ◽

Author(s):

Peter H. Gill

Keyword(s):

Integration Testing

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Cited By ~ 1

Author(s):

Shyue-Kung Lu ◽

Huai-Min Li ◽

Masaki Hashizume ◽

Jin-Hua Hong ◽

Zheng-Ru Tsai

Keyword(s):

Test Length ◽

Reduction Techniques ◽

Efficient Test ◽

Length Reduction

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Author(s):

Camila Pereira Sales ◽

Valdivino Alexandre de Santiago Júnior

Keyword(s):

Integration Testing ◽

Software Integration ◽

Support Software

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2020 IEEE International Test Conference (ITC) ◽

10.1109/itc44778.2020.9325250 ◽

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Author(s):

Soham Roy ◽

Spencer K. Millican ◽

Vishwani D. Agrawal

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Machine Intelligence ◽

Test Pattern Generation ◽

Efficient Test

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Author(s):

Subhajit Chatterjee ◽

Surajit Kumar Roy ◽

Chandan Giri ◽

Hafizur Rahaman

Keyword(s):

Peak Power ◽

Test Time ◽

Test Scheduling ◽

3D Ics ◽

Efficient Test

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