scholarly journals Evaluation of position sensitive detectors (position sensitive proportional counter and photo-diode array) for X-ray spectral measurement.

1991 ◽  
Vol 40 (1) ◽  
pp. 15-20
Author(s):  
Yoshiaki ITO ◽  
Kazuhiko OMOTE ◽  
Takashi SHOJI ◽  
Isao KANEDA ◽  
Yoshikazu NAKANISHI ◽  
...  
Keyword(s):  
Proportional Counter ◽  
Spectral Measurement ◽  
Diode Array ◽  
X Ray ◽  
Photo Diode ◽  
Position Sensitive ◽  
Position Sensitive Detectors

X-ray position-sensitive detectors

1986 ◽  
Vol 19 (3) ◽  
pp. 145-163 ◽  
Author(s):  
U. W. Arndt
Keyword(s):  
X Rays ◽  
Two Dimensional ◽  
Physical Processes ◽  
X Ray ◽  
General Terms ◽  
Position Sensitive ◽  
Position Sensitive Detectors

The physical processes are examined which can be used for the detection of X-rays in the range between about 3 and about 20 keV and for the positional localization of the incident photons. The criteria for choosing a detector for particular purposes are discussed in general terms. Specific examples of one- and two-dimensional detectors are then considered with particular emphasis on devices which are still in a state of development, and an attempt is made to summarize the nature, performance and suitability for different experiments of available detectors.

A new high-resolution small-angle X-ray scattering apparatus using a fine-focus rotating anode, point-focusing collimation and a position-sensitive proportional counter

1984 ◽  
Vol 17 (5) ◽  
pp. 337-343 ◽  
Author(s):  
O. Yoda
Keyword(s):  
High Resolution ◽  
Small Angle ◽  
Proportional Counter ◽  
Anisotropic Scattering ◽  
Photon Flux ◽  
X Rays ◽  
X Ray ◽  
X Ray Scattering ◽  
Position Sensitive ◽  
Ray Scattering

A high-resolution small-angle X-ray scattering camera has been built, which has the following features. (i) The point collimation optics employed allows the scattering cross section of the sample to be directly measured without corrections for desmearing. (ii) A small-angle resolution better than 0.5 mrad is achieved with a camera length of 1.6 m. (iii) A high photon flux of 0.9 photons μs−1 is obtained on the sample with the rotating-anode X-ray generator operated at 40 kV–30 mA. (iv) Incident X-rays are monochromated by a bent quartz crystal, which makes the determination of the incident X-ray intensity simple and unambiguous. (v) By rotation of the position-sensitive proportional counter around the direct beam, anisotropic scattering patterns can be observed without adjusting the sample. Details of the design and performance are presented with some applications.

scholarly journals Improving the energy resolution of bent crystal X-ray spectrometers with position-sensitive detectors

2014 ◽  
Vol 21 (4) ◽  
pp. 762-767 ◽  
Author(s):  
Ari-Pekka Honkanen ◽  
Roberto Verbeni ◽  
Laura Simonelli ◽  
Marco Moretti Sala ◽  
Ali Al-Zein ◽  
...  
Keyword(s):  
High Resolution ◽  
Internal Stress ◽  
Photon Energy ◽  
Energy Resolution ◽  
Preceding Paper ◽  
X Ray ◽  
Bent Crystal ◽  
Position Sensitive ◽  
Position Sensitive Detectors ◽  
Bent Crystals

Wavelength-dispersive high-resolution X-ray spectrometers often employ elastically bent crystals for the wavelength analysis. In a preceding paper [Honkanenet al.(2014).J. Synchrotron Rad.21, 104–110] a theory for quantifying the internal stress of a macroscopically large spherically curved analyser crystal was presented. Here the theory is applied to compensate for the corresponding decrease of the energy resolution. The technique is demonstrated with a Johann-type spectrometer using a spherically bent Si(660) analyser in near-backscattering geometry, where an improvement in the energy resolution from 1.0 eV down to 0.5 eV at 9.7 keV incident photon energy was observed.

The Use of 2-D Detector Utilizing Laser-Stimulated Luminescence for X-ray Diffraction Studies on Mechanical Behaviour of Materials

1989 ◽  
Vol 33 ◽  
pp. 389-396 ◽  
Author(s):  
Y. Yoshioka ◽  
T. Shinkai ◽  
S. Ohya
Keyword(s):  
Fracture Analysis ◽  
X Rays ◽  
Large Reduction ◽  
X Ray Diffraction ◽  
Crystalline Materials ◽  
X Ray ◽  
Material Evaluation ◽  
Position Sensitive ◽  
Diffraction Patterns ◽  
Position Sensitive Detectors

The development of linear position-sensitive detectors (PSD) has resulted in a large reduction of data acquisition times in the field of x-ray stress analysis. However, we also require two-dimensional (2-D) diffraction patterns for material evaluation. Especially, the microbeam x-ray diffraction technique gives valuable information on the structure of crystalline materials and this technique has been applied to fracture analysis by x-rays. Many kinds of 2-D PSD have been developed that have insufficient spatial resolution. So x-ray film has still been used as a 2-D detector, but it requires relatively long exposure times and then the process after exposure is very troublesome.

Study on X-Ray Stress Analysis Using a New Position-Sensitive Proportional Counter

1978 ◽  
Vol 22 ◽  
pp. 233-240 ◽  
Author(s):  
Yasuo Yoshioka ◽  
Ken-ichi Hasegawa ◽  
Koh-ichi Mochiki
Keyword(s):  
Residual Stresses ◽  
Proportional Counter ◽  
Counting Rate ◽  
Angular Resolution ◽  
Stress Measurement ◽  
Over The Counter ◽  
X Ray ◽  
Position Sensitive ◽  
The Mean ◽  
Time Required

A position-sensitive proportional counter suitable for the X-ray stress measurement has been developed and residual stresses were measured with an apparatus that uses this PSD system. The counter was designed to have a good angular resolution over the counter length for the diffracted X-ray beam and high counting rates. The mean angular resolution measured was about 0.2° in 2θ (FWHM) at 200 mm, and the maximum allowable counting rate reached about 40,000 cps.The time required for the data accumulation was shown to be 1/10 to 1/30 of the time required with a standard diffractometer.

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