Designing a toroidal top-hat energy analyzer for low-energy electron measurement

2013 ◽  
pp. 181-192 ◽  
Author(s):  
Y. Kazama
1999 ◽  
Vol 70 (11) ◽  
pp. 4304-4307 ◽  
Author(s):  
Jeong-Young Park ◽  
S. H. Kim ◽  
Y. D. Suh ◽  
W. G. Park ◽  
Y. Kuk

2014 ◽  
Vol 85 (11) ◽  
pp. 11E113 ◽  
Author(s):  
T. Ozaki ◽  
S. Kojima ◽  
Y. Arikawa ◽  
H. Shiraga ◽  
H. Sakagami ◽  
...  

1998 ◽  
Vol 05 (06) ◽  
pp. 1199-1211 ◽  
Author(s):  
Y. Sakai ◽  
M. Kato ◽  
S. Masuda ◽  
Y. Harada ◽  
T. Ichinokawa

A low energy electron microscope (LEEM) with an energy analyzer of the Wien filter type was constructed for surface microanalyses and imaging by irradiating the specimen surface with several types of incident beams, e.g. low energy electrons, UV photons or metastable He * atoms. A retarding type Wien filter was used for the formation of electron energy filtered images and energy spectra of selected microareas by employing energy loss electron and Auger electron, photoelectron or Penning ionization spectroscopy. Several new designs and performances have been implemented in this instrument and are presented together with some applications.


Author(s):  
Chris E. Kuyatt

The use of electron energy analyzers has increased dramatically in the last few years. Monochromator-analyzer combinations have achieved resolutions of a few milli-electron volts for electron energies from a few tenths of an electron volt to tens of thousands of electron volts. Figure 1 shows an energy loss spectrum of nitrogen which is typical of the performance of low energy electron spectrometers, and illustrates the wide dynamic range of these instruments.Various energy dispersing elements have been used in electron energy analyzers, some of the most popular being cylindrical and spherical electrostatic deflectors and the Wien filter.


Author(s):  
Bertholdand Senftinger ◽  
Helmut Liebl

During the last few years the investigation of clean and adsorbate-covered solid surfaces as well as thin-film growth and molecular dynamics have given rise to a constant demand for high-resolution imaging microscopy with reflected and diffracted low energy electrons as well as photo-electrons. A recent successful implementation of a UHV low-energy electron microscope by Bauer and Telieps encouraged us to construct such a low energy electron microscope (LEEM) for high-resolution imaging incorporating several novel design features, which is described more detailed elsewhere.The constraint of high field strength at the surface required to keep the aberrations caused by the accelerating field small and high UV photon intensity to get an improved signal-to-noise ratio for photoemission led to the design of a tetrode emission lens system capable of also focusing the UV light at the surface through an integrated Schwarzschild-type objective. Fig. 1 shows an axial section of the emission lens in the LEEM with sample (28) and part of the sample holder (29). The integrated mirror objective (50a, 50b) is used for visual in situ microscopic observation of the sample as well as for UV illumination. The electron optical components and the sample with accelerating field followed by an einzel lens form a tetrode system. In order to keep the field strength high, the sample is separated from the first element of the einzel lens by only 1.6 mm. With a numerical aperture of 0.5 for the Schwarzschild objective the orifice in the first element of the einzel lens has to be about 3.0 mm in diameter. Considering the much smaller distance to the sample one can expect intense distortions of the accelerating field in front of the sample. Because the achievable lateral resolution depends mainly on the quality of the first imaging step, careful investigation of the aberrations caused by the emission lens system had to be done in order to avoid sacrificing high lateral resolution for larger numerical aperture.


2014 ◽  
Vol 59 (6) ◽  
pp. 612-621 ◽  
Author(s):  
P.V. Galiy ◽  
◽  
Ya.B. Losovyj ◽  
T.M. Nenchuk ◽  
I.R. Yarovets’ ◽  
...  

2021 ◽  
Vol 129 (5) ◽  
pp. 053303
Author(s):  
A. Abdoulanziz ◽  
C. Argentin ◽  
V. Laporta ◽  
K. Chakrabarti ◽  
A. Bultel ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document