Atomic Force Microscopy and X-Ray Photoelectron Spectroscopy Study on the Passive Film for Type 316L Stainless Steel

CORROSION ◽  
2001 ◽  
Vol 57 (6) ◽  
pp. 540-546 ◽  
Author(s):  
X. Y. Wang ◽  
Y. S. Wu ◽  
L. Zhang ◽  
Z. Y. Yu
2010 ◽  
Vol 46 (3) ◽  
pp. 221-225 ◽  
Author(s):  
Yu. M. Nikolenko ◽  
V. G. Kuryavyi ◽  
I. V. Sheveleva ◽  
L. A. Zemskova ◽  
V. I. Sergienko

2018 ◽  
Vol 51 (2) ◽  
pp. 246-253
Author(s):  
Dev Raj Chopra ◽  
Justin Seth Pearson ◽  
Darius Durant ◽  
Ritesh Bhakta ◽  
Anil R. Chourasia

2013 ◽  
Vol 28 (2) ◽  
pp. 68-71 ◽  
Author(s):  
Thomas N. Blanton ◽  
Debasis Majumdar

In an effort to study an alternative approach to make graphene from graphene oxide (GO), exposure of GO to high-energy X-ray radiation has been performed. X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM) have been used to characterize GO before and after irradiation. Results indicate that GO exposed to high-energy radiation is converted to an amorphous carbon phase that is conductive.


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