In Situ Synchrotron X-Ray Diffraction Studies of CO2Corrosion of Carbon Steel with Scale Inhibitors ATMPA and PEI at 80°C

CORROSION ◽  
10.5006/0657 ◽  
2012 ◽  
Vol 68 (12) ◽  
pp. 1085-1093 ◽  
Author(s):  
M. Ko ◽  
N.J. Laycock ◽  
B. Ingham ◽  
D.E. Williams
Keyword(s):  
2021 ◽  
Vol 800 ◽  
pp. 140249
Author(s):  
Juan Macchi ◽  
Steve Gaudez ◽  
Guillaume Geandier ◽  
Julien Teixeira ◽  
Sabine Denis ◽  
...  

2018 ◽  
Vol 65 (4) ◽  
pp. 333-339 ◽  
Author(s):  
Chaolei Ban ◽  
Shuqin Zhu ◽  
Jie Ma ◽  
Fangreng Wang ◽  
Zhengfeng Jia ◽  
...  

Purpose Ni coating was electroplated on carbon steel substrate to protect carbon steel. Design/methodology/approach During electroplating, the ultrasonic irradiation (UI) (1 kHz) action was in situ used with different frequency. The influence of UI on the microstructure, mechanical and electrochemical performance of the coating was studied with scanning electron microscopy, X-ray diffraction, microhardness measurement, polarization curves and electrochemical impedance spectroscopy. Findings The results show that comparing that without UI imposition, UI during electroplating can refine the coating grain and decrease the micro-pores in the coating, resulting in improvement of the coating corrosion and hardness. Originality/value The imposition of UI action during electroplating Ni coating can remove intrinsic pores in the coating and compact the coating. The potential bimetallic cell between substrate and plating layer can be insulated to enhance the corrosion resistance of Ni coating. The imposition of UI action during electroplating Ni coating can refine Ni coating grain size and improve the coating haredness.


2010 ◽  
Vol 52 (9) ◽  
pp. 3052-3061 ◽  
Author(s):  
B. Ingham ◽  
M. Ko ◽  
G. Kear ◽  
P. Kappen ◽  
N. Laycock ◽  
...  

Author(s):  
R. E. Herfert

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.


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