Temperature dependence modelling of reverse osmosis

2020 ◽  
Vol 192 ◽  
pp. 431-436
Author(s):  
G. Lakner ◽  
J. Lakner ◽  
G. Racz ◽  
M. Kłos
Keyword(s):  
Temperature Dependence ◽  
Reverse Osmosis ◽  
Dependence Modelling

Concentration dependence modelling of reverse osmosis

2020 ◽  
Vol 192 ◽  
pp. 437-443
Author(s):  
G. Lakner ◽  
J. Lakner ◽  
G. Racz ◽  
M. Kłos
Keyword(s):  
Reverse Osmosis ◽  
Concentration Dependence ◽  
Dependence Modelling

Temperature Dependence of the Critical Electron Dose for Fatty Acid Monolayers

1982 ◽  
Vol 40 ◽  
pp. 78-79
Author(s):  
Kenneth H. Downing ◽  
Robert M. Glaeser
Keyword(s):  
Electron Beam ◽  
Fatty Acid ◽  
Inelastic Scattering ◽  
Temperature Dependence ◽  
Structural Damage ◽  
Direct Result ◽  
Second Step ◽  
Strong Temperature Dependence ◽  
Electron Dose ◽  
Covalent Bonds

The structural damage of molecules irradiated by electrons is generally considered to occur in two steps. The direct result of inelastic scattering events is the disruption of covalent bonds. Following changes in bond structure, movement of the constituent atoms produces permanent distortions of the molecules. Since at least the second step should show a strong temperature dependence, it was to be expected that cooling a specimen should extend its lifetime in the electron beam. This result has been found in a large number of experiments, but the degree to which cooling the specimen enhances its resistance to radiation damage has been found to vary widely with specimen types.

Temperature Dependence of Magnetic Domains and Wall Structures

1972 ◽  
Vol 30 ◽  
pp. 496-497
Author(s):  
Sonoko Tsukahara ◽  
Tadami Taoka ◽  
Hisao Nishizawa
Keyword(s):  
Temperature Dependence ◽  
Domain Walls ◽  
Magnetic Domain ◽  
Iron Film ◽  
Objective Lens ◽  
Lorentz Microscopy ◽  
Domain Structures ◽  
Wall Structures ◽  
Crystal Films ◽  
Metallurgical Structure

The high voltage Lorentz microscopy was successfully used to observe changes with temperature; of domain structures and metallurgical structures in an iron film set on the hot stage combined with a goniometer. The microscope used was the JEM-1000 EM which was operated with the objective lens current cut off to eliminate the magnetic field in the specimen position. Single crystal films with an (001) plane were prepared by the epitaxial growth of evaporated iron on a cleaved (001) plane of a rocksalt substrate. They had a uniform thickness from 1000 to 7000 Å.The figure shows the temperature dependence of magnetic domain structure with its corresponding deflection pattern and metallurgical structure observed in a 4500 Å iron film. In general, with increase of temperature, the straight domain walls decrease in their width (at 400°C), curve in an iregular shape (600°C) and then vanish (790°C). The ripple structures with cross-tie walls are observed below the Curie temperature.

Cellulose Acetate Reverse Osmosis Membrane Structure

1972 ◽  
Vol 30 ◽  
pp. 528-529
Author(s):  
H. K. Plummer ◽  
E. Eichen ◽  
C. D. Melvin
Keyword(s):  
Cellulose Acetate ◽  
Reverse Osmosis ◽  
Membrane Structure ◽  
Freeze Drying ◽  
Dense Layer ◽  
Water Removal ◽  
Reverse Osmosis Membrane ◽  
Correct Interpretation ◽  
Electron Image ◽  
Scanning Electron

Much of the work reported in the literature on cellulose acetate reverse osmosis membranes has raised new and important questions with regard to the dense or “active” layer of these membranes. Several thickness values and structures have been attributed to the dense layer. To ensure the correct interpretation of the cellulose acetate structure thirteen different preparative techniques have been used in this investigation. These thirteen methods included various combinations of water substitution, freeze drying, freeze sectioning, fracturing, embedding, and microtomy techniques with both transmission and scanning electron microscope observations.It was observed that several factors can cause a distortion of the structure during sample preparation. The most obvious problem of water removal can cause swelling, shrinking, and folds. Improper removal of embedding materials, when used, can cause a loss of electron image contrast and, or structure which could hinder interpretation.

Temperature dependence of generation-recombination noise in p-n junctions

2002 ◽  
Vol 12 (3) ◽  
pp. 71-74
Author(s):  
J. A. Jiménez Tejada ◽  
A. Godoy ◽  
A. Palma ◽  
P. Cartujo
Keyword(s):  
Temperature Dependence
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