Application of 3S Technology in the Third National Land Survey

2020 ◽  
Keyword(s):  
The Third ◽  
3S Technology ◽  
Land Survey

A deep learning training method of water identification based on the Third National Land Survey data

2021 ◽  
Author(s):  
Zhida Chen ◽  
Chuan Lin ◽  
ChangLei Cao ◽  
Guang Gao ◽  
Liangzhong Ying
Keyword(s):  
Deep Learning ◽  
Survey Data ◽  
Training Method ◽  
The Third ◽  
Land Survey

scholarly journals Key Technology Research on Quality Inspection and Evaluation of Orthoimage Used in China's National Land Survey

2019 ◽  
Vol 2 ◽  
pp. 1-5
Author(s):  
Yaoling Shang ◽  
Yousong Zhao ◽  
Wei Ma ◽  
Xuan Wu ◽  
Jindong Wang ◽  
...  
Keyword(s):  
Sampling Strategy ◽  
Quality Inspection ◽  
Land Resources ◽  
Technology Research ◽  
Key Technology ◽  
The Third ◽  
The Status ◽  
Inspection Process ◽  
Land Survey ◽  
Production Characteristics

<p><strong>Abstract.</strong> The third national land survey is based on orthoimages with the results of the second national land survey to investigate the land classification, area and ownership of the national land in order to comprehensively understand the status of land use and land resources changes, and to improve the level of delicacy management for national nature resources. Therefore, an important task to ensure the completion of the third national land survey is to the develop a set of technical methods applicable to the quality inspection on orthoimage of the third national land survey.</p><p>In view of the inapplicability of the existing inspection standards and technical methods of traditional basic surveying and mapping results on the orthoimage quality inspection of the third national land survey, The paper analyzes the orthoimage production characteristics and quality need of the third national land survey, improves the inspection quality elements, sampling strategy, inspection methods, evaluation methods and quality problem handling based on the existing inspection standards and technical methods by pilot, and puts forward the corresponding inspection standards and technical methods to promote the quality inspection of orthoimage on the third national land survey.</p><p>Compared with the traditional method, the application of this method in 2865 inspection of county-level’s orthoimage of the third national land survey which covers the whole china, shows that, its inspection index is more reasonable, the inspection process is more scientific, the inspection efficiency is more efficient, and the direct cost of inspection is saved by 31%.</p>

Development of a Wastewater Network Model Using ArcGIS Based Automated Tool

2020 ◽  
Vol 49 ◽  
pp. 173-180
Author(s):  
Hesham Ezz ◽  
Nagwan G. Mostafa
Keyword(s):  
Network Analysis ◽  
Network Model ◽  
Input Data ◽  
Network Planning ◽  
The Third ◽  
Third Phase ◽  
Land Survey ◽  
Automated Tool

In this study a wastewater network model is developed using ArcGIS based automated tool that integrates with AutoCAD and SewerCAD. The developed model consists of three main phases. The AutoCAD phase where input data like served area, land survey, and network planning are prepared in DWG form. Then, the ArcGIS processes the DWG input data and generates output shapefiles required to build a SewerCAD network in the third phase. The shapefiles include all defined parameters required to start network analysis like pipelines layout, manholes’ locations, elevations, assigned populations and sanitary loads. Also, The model provides an unserved area option which allows the model user to eliminate a specific unsewered zone(s) from the predefined served area. The model helps network designers saving time and minimizing efforts since building wastewater networks in SewerCAD becomes a matter of minutes not hours. The model is applied on a wastewater network of an Egyptian village.

QUALITY CONTROL OF POSITIONAL ACCURACY OF 1:10000 ORTHOPHOTO PRODUCTS IN THE THIRD NATIONAL LAND SURVEY

2020 ◽  
Vol XLII-3/W10 ◽  
pp. 525-528
Author(s):  
X. Ma ◽  
Q. Q. Yan ◽  
X. Wu
Keyword(s):  
Quality Control ◽  
Mean Square Error ◽  
Quality Inspection ◽  
Mean Square ◽  
Positional Accuracy ◽  
The Third ◽  
Land Survey ◽  
Image Edge ◽  
Important Test

Abstract. The third national land survey is based on the orthophotos products. Only by providing 1:10000 orthophoto products that meet the quality requirements can the third national land survey be carried out smoothly, and the third national land survey products can be guaranteed to be accurate and reliable. Positional accuracy as an important quality element of 1:10000 orthophoto products is a key factor affecting the quality of 1:10000 orthophoto products, and directly affects the quality of the third national land survey products.This paper introduces the content of the positional accuracy quality inspection in the 1:10000 orthophoto products of the third national land survey.The mean square error in plane position and the image edge match are two important test entries in the quality control of positional accuracy . The paper specifically elaborates on the quality control of the above two important test entries. The quality control indexes of mean square error in plane position and the image edge match are introduced in detail, and the quality inspection method and quality evaluation method of position accuracy are proposed. And, the main quality problems found in the positional accuracy checking are illustrated by way of case analysis. At the same time, the cause analysis was carried out for these specific quality problems, and corresponding improvement suggestions were also proposed.This paper provides technical support and reference for the quality inspection of 1:10000 orthophoto products, and also has some positive effects on quality improvement.

scholarly journals Research on the application of GIS technology in the spatial status grooming of village areas

2021 ◽  
Vol 293 ◽  
pp. 03003
Author(s):  
Song Hao
Keyword(s):  
Land Use ◽  
Spatial Planning ◽  
Current Situation ◽  
Base Period ◽  
Gis Technology ◽  
Farmland Protection ◽  
The Third ◽  
Ecological Protection ◽  
Land Survey ◽  
Application Of Gis

The preparation of five levels and three categories of territorial spatial planning includes many aspects, and this article mainly deals with one of the levels and categories: detailed territorial spatial planning of village areas; it focuses on the preliminary work of planning preparation: the current situation combing of village territorial spatial areas. The article firstly outlines the basic application of GIS technology in the current situation combing; then introduces the relevant contents of the Third National Land Survey. Finally, with actual cases, we focus on the significant role played by GIS technology in the integration of land use data in the base period of village territorial space, the location of permanent basic farmland indicators, the location of ecological protection red line, and the statistics of conflicting patches of ecological environmental protection and basic farmland protection.

scholarly journals OVERALL QUALITY CONTROL OF 1:10000 ORTHOPHOTO PRODUCTS IN THE THIRD NATIONAL LAND SURVEY

2020 ◽  
Vol XLII-3/W10 ◽  
pp. 1301-1305
Author(s):  
Q. Q. Yan ◽  
Y. S. Zhao ◽  
C. Liu ◽  
X. Ma ◽  
X. Wu
Keyword(s):  
Quality Control ◽  
Control Method ◽  
National Level ◽  
The Third ◽  
Depth Analysis ◽  
Land Survey ◽  
Survey Results ◽  
Data Source ◽  
Orthographic Image ◽  
Orthophoto Images

Abstract. Orthographic image is an important reference data source for the third national land survey, as well as the positioning benchmark and statistical basis of the national land survey, which determines the accuracy of the third national land survey results and the progress of follow-up work, and is also an important component of the third national land survey results. In order to ensure that the production of 1:10000 high-resolution orthophoto images meets the needs of the third national land survey work, and meets the relative requirements to the production of orthophoto products, it is really necessary to carry out quality control of orthophoto products.Based on the checking and accepting of 1:10000 orthophoto images at the national level, this paper discusses the quality control method of 1:10000 orthophoto products from the overall inspection. First of all, this paper studies and analyzes the key nodes of quality control in the overall inspection and clarifies the quality control requirements of each quality control key node;On the basis of carefully sorting out the typical problems found in the overall inspection of orthophoto products, carry out in-depth analysis of the causes and give corresponding solutions.This paper provides a technical reference for the quality inspection of other scale orthophoto products, and also provides a solution to the quality improvement of 1:10000 orthophoto products.

Progress report on 21-cm observations at low latitude between longitudes (l 11) 0° and 66°

1967 ◽  
Vol 31 ◽  
pp. 177-179
Author(s):  
W. W. Shane
Keyword(s):  
Preliminary Report ◽  
Progress Report ◽  
Galactic Centre ◽  
Low Latitude ◽  
The Third ◽  
Introductory Lecture ◽  
Centre Region

In the course of several 21-cm observing programmes being carried out by the Leiden Observatory with the 25-meter telescope at Dwingeloo, a fairly complete, though inhomogeneous, survey of the regionl11= 0° to 66° at low galactic latitudes is becoming available. The essential data on this survey are presented in Table 1. Oort (1967) has given a preliminary report on the first and third investigations. The third is discussed briefly by Kerr in his introductory lecture on the galactic centre region (Paper 42). Burton (1966) has published provisional results of the fifth investigation, and I have discussed the sixth in Paper 19. All of the observations listed in the table have been completed, but we plan to extend investigation 3 to a much finer grid of positions.

The orbit of Pluto over a long interval of time

1966 ◽  
Vol 25 ◽  
pp. 227-229 ◽  
Author(s):  
D. Brouwer
Keyword(s):  
Periodic Orbit ◽  
Numerical Integration ◽  
Restricted Problem ◽  
Three Dimensional ◽  
The Third ◽  
Circular Restricted Problem ◽  
Resonance Relation

The paper presents a summary of the results obtained by C. J. Cohen and E. C. Hubbard, who established by numerical integration that a resonance relation exists between the orbits of Neptune and Pluto. The problem may be explored further by approximating the motion of Pluto by that of a particle with negligible mass in the three-dimensional (circular) restricted problem. The mass of Pluto and the eccentricity of Neptune's orbit are ignored in this approximation. Significant features of the problem appear to be the presence of two critical arguments and the possibility that the orbit may be related to a periodic orbit of the third kind.

Monte Carlo Algorithms for Moments of Transition Arrays

1988 ◽  
Vol 102 ◽  
pp. 79-81
Author(s):  
A. Goldberg ◽  
S.D. Bloom
Keyword(s):  
Monte Carlo ◽  
State Vector ◽  
Basis Vector ◽  
Collective State ◽  
Dispersion Characteristics ◽  
Dipole Strength ◽  
The Third ◽  
Monte Carlo Algorithms ◽  
Third Moment ◽  
Very High

AbstractClosed expressions for the first, second, and (in some cases) the third moment of atomic transition arrays now exist. Recently a method has been developed for getting to very high moments (up to the 12th and beyond) in cases where a “collective” state-vector (i.e. a state-vector containing the entire electric dipole strength) can be created from each eigenstate in the parent configuration. Both of these approaches give exact results. Herein we describe astatistical(or Monte Carlo) approach which requires onlyonerepresentative state-vector |RV&gt; for the entire parent manifold to get estimates of transition moments of high order. The representation is achieved through the random amplitudes associated with each basis vector making up |RV&gt;. This also gives rise to the dispersion characterizing the method, which has been applied to a system (in the M shell) with≈250,000 lines where we have calculated up to the 5th moment. It turns out that the dispersion in the moments decreases with the size of the manifold, making its application to very big systems statistically advantageous. A discussion of the method and these dispersion characteristics will be presented.

Probe size and 5th-order aberration

1987 ◽  
Vol 45 ◽  
pp. 134-135 ◽  
Author(s):  
Zhifeng Shao
Keyword(s):  
Electron Probe ◽  
Spherical Aberration ◽  
Wave Length ◽  
Cylindrical Symmetry ◽  
Electron Wave ◽  
Third Order ◽  
The Third ◽  
Probe Radius ◽  
Small Probe ◽  
Probe Size

A small electron probe has many applications in many fields and in the case of the STEM, the probe size essentially determines the ultimate resolution. However, there are many difficulties in obtaining a very small probe.Spherical aberration is one of them and all existing probe forming systems have non-zero spherical aberration. The ultimate probe radius is given byδ = 0.43Csl/4ƛ3/4where ƛ is the electron wave length and it is apparent that δ decreases only slowly with decreasing Cs. Scherzer pointed out that the third order aberration coefficient always has the same sign regardless of the field distribution, provided only that the fields have cylindrical symmetry, are independent of time and no space charge is present. To overcome this problem, he proposed a corrector consisting of octupoles and quadrupoles.

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