scholarly journals HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY STUDY OF CRYSTALLOGRAPHY AND MORPHOLOGY OF TiC PRECIPITATES IN ARGON IRRADIATED 18Cr10NiTi STEEL

2021 ◽  
pp. 26-31
Author(s):  
A.S. Kalchenko ◽  
S.A. Karpov ◽  
G.D. Tolstolutskaya
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Bubble Formation ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Surrounding Matrix ◽  
Transmission Electron ◽  
Diffraction Patterns ◽  
Relationship Of

This work encompasses identification of the crystal structure and analysis of the TiC precipitates in 18Cr-10Ni-Ti austenitic stainless steel under Ar-ions irradiation. High resolution transmission electron microscopy (HRTEM) and energy dispersive spectroscopy (EDS) are used. Orientation relationship of TiC particles in surrounding matrix are indicated by HRTEM and diffraction patterns. The size of the precipitates is found to be critical: the coherency of TiC is kept at the interfaces when the precipitate is in the stage of nucleation, whereas the growth of precipitate up to 10 nm can lead to the loss of coherency in the austenitic steel. The findings suggest that the incoherent precipitate-matrix interface is an important point defect sink and contributes to inert gas bubble formation at elevated irradiation temperatures.

High-Resolution Transmission Electron Microscopy Study of Metallic Spin-Glass/Amorphous Silicon Multilayers

1995 ◽  
Vol 382 ◽  
Author(s):  
David A. Howell ◽  
Martin A. Crimp ◽  
Lilian M. Hoines ◽  
J. Bass
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Spin Glass ◽  
Amorphous Silicon ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Degree Of Crystallinity ◽  
Multilayer Systems ◽  
Transmission Electron

ABSTRACTHigh-resolution transmission electron microscopy has been used to investigate the structure and growth behavior of three separate multilayer systems composed of spin-glass alloys(AuFe.03,CuMn.15, and AgMn.09) alternating with amorphous silicon. Each of the three systems was fabricated with two different sample configurations. The first consisted of bilayers with 3 nm spinglass alloy and 7 nm amorphous siliconlayers. The second consisted of 7 nm spin-glass alloy and 7 nm amorphous silicon layers. HRTEM images of ion-milled cross-sectioned samples revealed variations in the degree of crystallinity of the spin-glass material. Variations in the amount and symmetry of interlayer formation were also observed. Systematic studies of such variations should help to explain differences in their measured spin-glass properties.

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