In situ Matrix Removal Studies and Determination of Trace Mn, Cr, and Cu in High Purity Tantalum Pentaoxide by Electrothermal Vaporization-Inductively Coupled Plasma Mass Spectrometry
1997 ◽
Vol 12
(4)
◽
pp. 421-428
◽
1997 ◽
Vol 353
(2-3)
◽
pp. 173-180
◽
2006 ◽
Vol 21
(3)
◽
pp. 311
◽
1998 ◽
Vol 53
(6-8)
◽
pp. 1079-1085
◽
2000 ◽
Vol 55
(9)
◽
pp. 1481-1489
◽