Investigation of the Contact Resistance Between Amorphous Silicon-Zinc-Tin-Oxide Thin Film Transistors and Different Electrodes Using the Transmission Line Method
2016 ◽
Vol 17
(1)
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pp. 46-49
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2020 ◽
Vol 21
(6)
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pp. 612-616
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2015 ◽
Vol 16
(3)
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pp. 139-141
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2018 ◽
Vol 4
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pp. 1800032
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2017 ◽
Vol 13
(5)
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pp. 406-411
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2014 ◽
Vol 292
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pp. 915-920
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2013 ◽
Vol 42
(8)
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pp. 2470-2477
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