scholarly journals Spectroscopic Ellipsometry Study of the Dielectric Function of Cu(In<sub>1–x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub> Bulk Compounds: Identification of Optical Transitions

2017 ◽  
Vol 07 (04) ◽  
pp. 99-110
Author(s):  
Dayane Habib ◽  
Georges El Haj Moussa
Keyword(s):  
Dielectric Function ◽  
Spectroscopic Ellipsometry ◽  
Optical Transitions

Determination and Critical Assessment of the Optical Properties of Common Substrate Materials Used in III-V Nitride Heterostructures with Vacuum Ultraviolet Spectroscopic Ellipsometry

2001 ◽  
Vol 693 ◽  
Author(s):  
N.V. Edwards ◽  
O.P.A. Lindquist ◽  
L.D. Madsen ◽  
S. Zollner ◽  
K. Järrehdahl ◽  
...  
Keyword(s):  
Optical Properties ◽  
Dielectric Function ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Vacuum Ultraviolet ◽  
Critical Assessment ◽  
Optical Transitions ◽  
Common Substrate ◽  
Materials Used

AbstractAs a first step toward enabling the in-line metrology of III-V nitride heterostructure and materials, we present the optical constants of the two common substrate materials over an unprecendented spectral range. Vacuum Ultraviolet spectroscopic ellipsometry (VUVSE) was used to obtain the optical constants for Al2O3 and the ordinary and extra-ordinary component of the dielectric function for both 4H- and 6H-SiC. The results are discussed in the context of anisotropy, polytypism, bandstructure, optical transitions, and preparation/characterization of abrupt surfaces, where appropriate.

Dielectric function of thin polypyrrole and Prussian blue films by spectroscopic ellipsometry

1983 ◽  
Vol 6 ◽  
pp. 309-316 ◽  
Author(s):  
H. Arwin ◽  
D.E. Aspnes ◽  
R. Bjorklund ◽  
I. Lundström
Keyword(s):  
Prussian Blue ◽  
Dielectric Function ◽  
Spectroscopic Ellipsometry

Dielectric function and optical transitions of silicon nanocrystals between 0.6 eV and 6.5 eV

2008 ◽  
Vol 205 (4) ◽  
pp. 845-848 ◽  
Author(s):  
M. Mansour ◽  
A. En Naciri ◽  
L. Johann ◽  
J. J. Grob ◽  
M. Stchakovsky
Keyword(s):  
Dielectric Function ◽  
Silicon Nanocrystals ◽  
Optical Transitions

Effects of alloying on the optical properties of organic–inorganic lead halide perovskite thin films

2016 ◽  
Vol 4 (33) ◽  
pp. 7775-7782 ◽  
Author(s):  
Paul F. Ndione ◽  
Zhen Li ◽  
Kai Zhu
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Optical Transitions ◽  
Inorganic Perovskite ◽  
Inorganic Lead ◽  
Halide Perovskite ◽  
Lead Halide

Spectroscopic ellipsometry analysis of optical transitions and optical constants in hybrid organic–inorganic perovskite alloys.

Dielectric function of ZnTe nanocrystals by spectroscopic ellipsometry

2009 ◽  
Vol 20 (30) ◽  
pp. 305702 ◽  
Author(s):  
F Ahmed ◽  
A En Naciri ◽  
J J Grob ◽  
M Stchakovsky ◽  
L Johann
Keyword(s):  
Dielectric Function ◽  
Spectroscopic Ellipsometry

Measurement of the dielectric function spectra of low dielectric constant using the spectroscopic ellipsometry

2003 ◽  
Author(s):  
Masahiro Horie ◽  
Kamil Postava ◽  
Tomuo Yamaguchi ◽  
Kumiko Akashika ◽  
Hideki Hayashi ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Dielectric Function ◽  
Spectroscopic Ellipsometry ◽  
Low Dielectric Constant ◽  
Low Dielectric

Dielectric function and magneto-optical Voigt constant of Cu2O: A combined spectroscopic ellipsometry and polar magneto-optical Kerr spectroscopy study

2011 ◽  
Vol 84 (19) ◽  
Author(s):  
Francisc Haidu ◽  
Michael Fronk ◽  
Ovidiu D. Gordan ◽  
Camelia Scarlat ◽  
Georgeta Salvan ◽  
...  
Keyword(s):  
Dielectric Function ◽  
Spectroscopic Ellipsometry ◽  
Spectroscopy Study
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