scholarly journals Effect of Glass Composition on the Thermal Expansion of Relict Crystals of RuO<sub>2</sub> in Doped Lead-Silicate Glasses (Thick Film Resistors)

2011 ◽  
Vol 02 (07) ◽  
pp. 651-653 ◽  
Author(s):  
Gulmurza Abdurakhmanov
Keyword(s):  
Thermal Expansion ◽  
Thick Film ◽  
Glass Composition ◽  
Silicate Glasses ◽  
Lead Silicate

Thermal expansion of lead silicate glasses

1981 ◽  
Vol 16 (3) ◽  
pp. 599-603 ◽  
Author(s):  
R. D. Greenough ◽  
P. Dentschuk ◽  
S. B. Palmer
Keyword(s):  
Thermal Expansion ◽  
Silicate Glasses ◽  
Lead Silicate

Structure of lead silicate glasses and its correlation with photoelastic properties

2020 ◽  
Author(s):  
A. Khanna ◽  
A. Kaur ◽  
M. Fábián ◽  
Hirdesh ◽  
A. Kaur
Keyword(s):  
Silicate Glasses ◽  
Lead Silicate

29Si NMR study on the structure of lead-silicate glasses

1984 ◽  
Vol 64 (1-2) ◽  
pp. 287-290 ◽  
Author(s):  
Takamitsu Fujiu ◽  
Makoto Ogino
Keyword(s):  
Silicate Glasses ◽  
Lead Silicate ◽  
29Si Nmr ◽  
Nmr Study

Electron spin resonance studies of reduced and unreduced lead silicate glasses

1973 ◽  
Vol 13 (8) ◽  
pp. 1057-1060 ◽  
Author(s):  
Clayton Wilson Bates ◽  
Daniel Leniart ◽  
Emil Straka
Keyword(s):  
Electron Spin Resonance ◽  
Electron Spin ◽  
Silicate Glasses ◽  
Lead Silicate ◽  
Spin Resonance

Thermal Expansion and Laser Trim Stability of Ruthenium Based Thick Film Resistors on Alumina and on Multilayer Dielectric

1982 ◽  
Vol 1 (1) ◽  
pp. 24-27 ◽  
Author(s):  
I. Taitl
Keyword(s):  
Thermal Expansion ◽  
Thick Film ◽  
Chemical Structure ◽  
Coefficient Of Thermal Expansion ◽  
Ruthenium Dioxide ◽  
Theoretical Conclusion ◽  
Film Resistor ◽  
Thick Film Resistor ◽  
The Relationship ◽  
Multilayer Dielectric

Fired resistors exhibit variations which are minimised by abrasive and laser trimming. The latter may cause unstable behaviour which is further aggravated by thermal shock. The chemical structure of a thick film resistor is analysed with respect to mechanical stress, and the theoretical conclusion that the coefficient of thermal expansion of the resistor should be equal to or smaller than that of the substrate is verified experimentally. The thermal behaviour of ruthenium dioxide is examined and a range of CTE values are determined for materials of varying chemical composition. The relationship between CTE and post laser trimming stability is demonstrated on four thick film resistors which differ in thermal expansion. It is pointed out that formulations with high metallic content can absorb tensile stress by elastic deformation, thus minimising the formation or propagation of laser induced cracks.

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