The Influence of Finite Element Modelling Parameters on the Stress Distribution in Bolted Glass Connections

2009 ◽  
Author(s):  
M. Overend ◽  
I. Maniatis
Keyword(s):  
Finite Element ◽  
Stress Distribution ◽  
Finite Element Modelling ◽  
Element Modelling

Finite-element modelling of two-disc shrink fit assembly and an evaluation of material pairs of discs

2010 ◽  
Vol 225 (2) ◽  
pp. 263-273 ◽  
Author(s):  
F Ozturk
Keyword(s):  
Finite Element ◽  
Stress Distribution ◽  
Finite Element Modelling ◽  
The Finite Element Method ◽  
Uniform Stress ◽  
Element Modelling ◽  
Hollow Shaft ◽  
Complex Shapes ◽  
Shrink Fit ◽  
Good Agreement

In this study, a two-disc shrink fit assembly was modelled in two dimension using ABAQUS/Standard to determine the interfacial pressures with respect to the interferences. Steel—steel and steel—aluminium material pairs were considered. Inner disc of the assembly was considered as hollow and solid shafts, respectively. The results indicate that the finite-element results were in good agreement with the analytical results. In the hollow shaft assembly, both the hollow shaft and the outer disc had non-uniform stress distribution. In the solid shaft assembly, uniform stress distribution for the solid shaft and non-uniform stress distribution for the outer disc were determined. It was pointed out that same pressure can be obtained by different interference with different material pairs. If the assembly has complex shapes, the finite-element method gives more comprehensive and accurate results than the analytical method.

Micro-Raman Analysis of a Micromachined 3C-SiC Cantilever

2012 ◽  
Vol 717-720 ◽  
pp. 525-528 ◽  
Author(s):  
Nicolò Piluso ◽  
R. Anzalone ◽  
Massimo Camarda ◽  
A. Severino ◽  
Giuseppe D'Arrigo ◽  
...  
Keyword(s):  
Finite Element ◽  
Stress Distribution ◽  
Thin Layer ◽  
Strain Field ◽  
Strain Distribution ◽  
Finite Element Modelling ◽  
Raman Analysis ◽  
Element Modelling ◽  
Sic Film

In this work, Raman microscopy is used to study the stress distribution on 3C-SiC cantilevers. Also we compare the strain distribution observed on the microstructure, using the shift of the transverse optical (TO) mode in micro-Raman maps, with the values predicted using a recent analytic theory [1]. Along the width of the cantilever is observed a reduction of stress ascribed to the etching processes that removes a thin layer of the interface between the 3C-SiC film and the substrate close to the edge of the microstructure. It is possible to show that this variation can be ascribed to a non-linearity of the strain field along the 3C-SiC film thickness. Also, helped by Finite Element Modelling (FEM), we determined the stress tensor along the cantilever. This result shows that, for a complete stress description of the cantilevers, it is necessary taking into account the role of diagonal and off-diagonal stress tensorial components.

Sign in / Sign up

Export Citation Format

Share Document