3D Models for High Resolution Images: Examples with Quickbird, IKONOS, and EROS

2002 ◽  
Author(s):  
Th Toutin ◽  
R Chénier ◽  
Y Carbonneau
Keyword(s):  
High Resolution ◽  
3D Models ◽  
High Resolution Images

scholarly journals A Practical Methodology for Generating High-Resolution 3D Models of Open-Pit Slopes Using UAVs: Flight Path Planning and Optimization

2020 ◽  
Vol 12 (14) ◽  
pp. 2283
Author(s):  
Rushikesh Battulwar ◽  
Garrett Winkelmaier ◽  
Jorge Valencia ◽  
Masoud Zare Naghadehi ◽  
Bijan Peik ◽  
...  
Keyword(s):  
Genetic Algorithm ◽  
High Resolution ◽  
Power Consumption ◽  
Fitness Function ◽  
Empirical Studies ◽  
3D Models ◽  
Open Pit ◽  
High Resolution Imagery ◽  
High Resolution Images ◽  
Using Data

High-resolution terrain models of open-pit mine highwalls and benches are essential in developing new automated slope monitoring systems for operational optimization. This paper presents several contributions to the field of remote sensing in surface mines providing a practical framework for generating high-resolution images using low-trim Unmanned Aerial Vehicles (UAVs). First, a novel mobile application was developed for autonomous drone flights to follow mine terrain and capture high-resolution images of the mine surface. In this article, case study is presented showcasing the ability of developed software to import area terrain, plan the flight accordingly, and finally execute the area mapping mission autonomously. Next, to model the drone’s battery performance, empirical studies were conducted considering various flight scenarios. A multivariate linear regression model for drone power consumption was derived from experimental data. The model has also been validated using data from a test flight. Finally, a genetic algorithm for solving the problem of flight planning and optimization has been employed. The developed power consumption model was used as the fitness function in the genetic algorithm. The designed algorithm was then validated using simulation studies. It is shown that the offered path optimization can reduce the time and energy of high-resolution imagery missions by over 50%. The current work provides a practical framework for stability monitoring of open-pit highwalls while achieving required energy optimization and imagery performance.

The 3D Virtual Campus Modeling Based on High Resolution Images from Remote Sensors

2012 ◽  
Vol 170-173 ◽  
pp. 2844-2847
Author(s):  
Zhen Zhi Wu ◽  
Hong Yan Wen ◽  
Gui Wen Lan
Keyword(s):  
Information System ◽  
High Resolution ◽  
3D Visualization ◽  
3D Models ◽  
Management Information ◽  
Remote Sensors ◽  
University Of Technology ◽  
Virtual Reconstruction ◽  
Remotely Sensed Image ◽  
High Resolution Images

With the high resolution remotely sensed image and an old map of the Pingfeng campus of Guilin University of Technology, 3D virtual reconstruction, roaming and buildings management of the campus were accomplished by the usage of ArcGIS to get basic geographic information, applying SketchUp to create 3D models and ArcEngine to develop a management information system. This method takes full advantage of existing data sources and can quickly build a 3D visualization information system.

scholarly journals Image-based techniques for the survey of mosaics in the St Mark's Basilica in Venice

2018 ◽  
Vol 9 (19) ◽  
pp. 1 ◽  
Author(s):  
Andrea Adami ◽  
Francesco Fassi ◽  
Luigi Fregonese ◽  
Mario Piana
Keyword(s):  
High Resolution ◽  
Large Scale ◽  
Three Dimensional ◽  
3D Models ◽  
Information Modeling ◽  
Complex Objects ◽  
Multi Scale ◽  
Building Information ◽  
Technological Developments ◽  
High Resolution Images

<p>This article aims to critically examine the entire methodology of very large scale (1:1) surveying and documentation of mosaic surfaces. The term ‘survey’ should be read in its broadest and most complete and sense, including the phases of measurement and data processing as well as management and use of these data for the purposes of preservation and maintenance. The case study presented here took place at St Mark’s Basilica (<em>Basilica di San Marco</em>), in Venice, where mosaic flooring, wall and vault decorations have been surveyed on two separate occasions. These two experiences shared a common goal (a full-scale survey of the mosaic decorations) but differed in terms of the methodologies used, chiefly due to the technological developments of recent years. All this, therefore, lends itself to a methodological reflection and critique of the ways in which surveying technology has evolved over time. It enables to conduct surveys that would, just a few years ago, have been inconceivable due to their size and complexity. This article describes in detail current surveying processes, which includes the use of a multi-scale “image-based” approach, “re-topology” methods such as non-uniform rational B-spline (NURBS) and a tailor-made Building Information Modeling (BIM) system. This system allows the direct use of a three-dimensional (3D) model of the Basilica within the maintenance process of the monument itself with the options to georeferencing information, extract basic metric data and catalogue all its mosaics.</p><p><strong>Highlights:</strong></p><ul><li><p>Modern digital photogrammetric techniques enable the acquisition of very complex objects, not only in terms of form but also in terms of material.</p></li><li><p>To obtain high resolution orthophotos, it is necessary to accurately take care of all the stages of the process: photographic acquisition, surveying, modelling and orthographic reprojection.</p></li><li><p>High resolution images and detailed 3D models can benefit from a complex BIM system for the management of all data.</p></li></ul>

FeXIV Line Emission Polarization of the July 11, 1991 Solar Corona

1994 ◽  
Vol 144 ◽  
pp. 541-547
Author(s):  
J. Sýkora ◽  
J. Rybák ◽  
P. Ambrož
Keyword(s):  
High Resolution ◽  
Solar Corona ◽  
Emission Line ◽  
Solar Eclipse ◽  
White Light ◽  
Preliminary Analysis ◽  
Line Emission ◽  
Total Solar Eclipse ◽  
Degree Of Polarization ◽  
High Resolution Images

AbstractHigh resolution images, obtained during July 11, 1991 total solar eclipse, allowed us to estimate the degree of solar corona polarization in the light of FeXIV 530.3 nm emission line and in the white light, as well. Very preliminary analysis reveals remarkable differences in the degree of polarization for both sets of data, particularly as for level of polarization and its distribution around the Sun’s limb.

Remarks on the application of backscattered electron imaging (BEI) to the scanning electron microscopy (SEM) of biological structures

1983 ◽  
Vol 41 ◽  
pp. 484-487
Author(s):  
Etienne de Harven
Keyword(s):  
High Resolution ◽  
Incident Beam ◽  
Spot Size ◽  
Primary Electron ◽  
Critical Point Drying ◽  
Cell Shapes ◽  
High Resolution Images ◽  
Backscattered Electron ◽  
Electron Imaging ◽  
Scanning Electron

Biological ultrastructures have been extensively studied with the scanning electron microscope (SEM) for the past 12 years mainly because this instrument offers accurate and reproducible high resolution images of cell shapes, provided the cells are dried in ways which will spare them the damage which would be caused by air drying. This can be achieved by several techniques among which the critical point drying technique of T. Anderson has been, by far, the most reproducibly successful. Many biologists, however, have been interpreting SEM micrographs in terms of an exclusive secondary electron imaging (SEI) process in which the resolution is primarily limited by the spot size of the primary incident beam. in fact, this is not the case since it appears that high resolution, even on uncoated samples, is probably compromised by the emission of secondary electrons of much more complex origin.When an incident primary electron beam interacts with the surface of most biological samples, a large percentage of the electrons penetrate below the surface of the exposed cells.

Field Emission SEM Equipped With Noise Compensator

1973 ◽  
Vol 31 ◽  
pp. 302-303
Author(s):  
S. Saito ◽  
H. Todokoro ◽  
S. Nomura ◽  
T. Komoda
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Low Contrast ◽  
Probe Current ◽  
High Resolution Images ◽  
Scanning Electron

Field emission scanning electron microscope (FESEM) features extremely high resolution images, and offers many valuable information. But, for a specimen which gives low contrast images, lateral stripes appear in images. These stripes are resulted from signal fluctuations caused by probe current noises. In order to obtain good images without stripes, the fluctuations should be less than 1%, especially for low contrast images. For this purpose, the authors realized a noise compensator, and applied this to the FESEM.Fig. 1 shows an outline of FESEM equipped with a noise compensator. Two apertures are provided gust under the field emission gun.

Low-Loss Images in a Stem/Tem Microscope

1976 ◽  
Vol 34 ◽  
pp. 496-497 ◽  
Author(s):  
David C. Joy ◽  
Dennis M. Maher
Keyword(s):  
High Resolution ◽  
Surface Topography ◽  
Beam Direction ◽  
Low Loss ◽  
Specimen Holder ◽  
Glancing Angle ◽  
High Resolution Images ◽  
Set Up ◽  
Conventional Manner ◽  
Objective Type

High-resolution images of the surface topography of solid specimens can be obtained using the low-loss technique of Wells. If the specimen is placed inside a lens of the condenser/objective type, then it has been shown that the lens itself can be used to collect and filter the low-loss electrons. Since the probeforming lenses in TEM instruments fitted with scanning attachments are of this type, low-loss imaging should be possible.High-resolution, low-loss images have been obtained in a JEOL JEM 100B fitted with a scanning attachment and a thermal, fieldemission gun. No modifications were made to the instrument, but a wedge-shaped, specimen holder was made to fit the side-entry, goniometer stage. Thus the specimen is oriented initially at a glancing angle of about 30° to the beam direction. The instrument is set up in the conventional manner for STEM operation with all the lenses, including the projector, excited.

Effect of strain on ADF-STEM high-resolution images

1991 ◽  
Vol 49 ◽  
pp. 666-667
Author(s):  
M. Kelly ◽  
D.M. Bird
Keyword(s):  
High Resolution ◽  
Strong Influence ◽  
Intensity Variation ◽  
Dark Field ◽  
Atomic Resolution ◽  
Strain Fields ◽  
High Resolution Image ◽  
Annular Dark Field ◽  
High Resolution Images ◽  
Interesting Alternative

It is well known that strain fields can have a strong influence on the details of HREM images. This, for example, can cause problems in the analysis of edge-on interfaces between lattice mismatched materials. An interesting alternative to conventional HREM imaging has recently been advanced by Pennycook and co-workers where the intensity variation in the annular dark field (ADF) detector is monitored as a STEM probe is scanned across the specimen. It is believed that the observed atomic-resolution contrast is correlated with the intensity of the STEM probe at the atomic sites and the way in which this varies as the probe moves from cell to cell. As well as providing a directly interpretable high-resolution image, there are reasons for believing that ADF-STEM images may be less suseptible to strain than conventional HREM. This is because HREM images arise from the interference of several diffracted beams, each of which is governed by all the excited Bloch waves in the crystal.

Electron crystallographic determination of the 3-D structure of staurolite at atomic resolution

1991 ◽  
Vol 49 ◽  
pp. 540-541
Author(s):  
Kenneth H. Downing ◽  
Hu Meisheng ◽  
Hans-Rudolf Went ◽  
Michael A. O'Keefe
Keyword(s):  
High Resolution ◽  
Three Dimensional ◽  
High Resolution Electron Microscopy ◽  
Atomic Resolution ◽  
Dimensional Structure ◽  
Structure Information ◽  
Resolution Electron ◽  
Scattering Effects ◽  
High Resolution Images ◽  
Effects Of Radiation

With current advances in electron microscope design, high resolution electron microscopy has become routine, and point resolutions of better than 2Å have been obtained in images of many inorganic crystals. Although this resolution is sufficient to resolve interatomic spacings, interpretation generally requires comparison of experimental images with calculations. Since the images are two-dimensional representations of projections of the full three-dimensional structure, information is invariably lost in the overlapping images of atoms at various heights. The technique of electron crystallography, in which information from several views of a crystal is combined, has been developed to obtain three-dimensional information on proteins. The resolution in images of proteins is severely limited by effects of radiation damage. In principle, atomic-resolution, 3D reconstructions should be obtainable from specimens that are resistant to damage. The most serious problem would appear to be in obtaining high-resolution images from areas that are thin enough that dynamical scattering effects can be ignored.

Principle and practice of high-resolution imaging with a field-emission TEM

1992 ◽  
Vol 50 (1) ◽  
pp. 138-139
Author(s):  
Max T. Otten ◽  
Wim M.J. Coene
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Incidence Angle ◽  
Temporal Coherence ◽  
Energy Spread ◽  
High Resolution Imaging ◽  
Major Improvement ◽  
High Resolution Images ◽  
Resolution Imaging

High-resolution imaging with a LaB6 instrument is limited by the spatial and temporal coherence, with little contrast remaining beyond the point resolution. A Field Emission Gun (FEG) reduces the incidence angle by a factor 5 to 10 and the energy spread by 2 to 3. Since the incidence angle is the dominant limitation for LaB6 the FEG provides a major improvement in contrast transfer, reducing the information limit to roughly one half of the point resolution. The strong improvement, predicted from high-resolution theory, can be seen readily in diffractograms (Fig. 1) and high-resolution images (Fig. 2). Even if the information in the image is limited deliberately to the point resolution by using an objective aperture, the improved contrast transfer close to the point resolution (Fig. 1) is already worthwhile.

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