Power Cycle Test Bench for Accelerated Life Testing for Reliability Assessment of SiC-MOSFET in Extreme Offshore Environment

2019 ◽  
Author(s):  
Amin Rahnama Sadat
2018 ◽  
Vol 140 (10) ◽  
Author(s):  
Zhen Hu ◽  
Zissimos P. Mourelatos

Testing of components at higher-than-nominal stress level provides an effective way of reducing the required testing effort for system reliability assessment. Due to various reasons, not all components are directly testable in practice. The missing information of untestable components poses significant challenges to the accurate evaluation of system reliability. This paper proposes a sequential accelerated life testing (SALT) design framework for system reliability assessment of systems with untestable components. In the proposed framework, system-level tests are employed in conjunction with component-level tests to effectively reduce the uncertainty in the system reliability evaluation. To minimize the number of system-level tests, which are much more expensive than the component-level tests, the accelerated life testing (ALT) design is performed sequentially. In each design cycle, testing resources are allocated to component-level or system-level tests according to the uncertainty analysis from system reliability evaluation. The component-level or system-level testing information obtained from the optimized testing plans is then aggregated to obtain the overall system reliability estimate using Bayesian methods. The aggregation of component-level and system-level testing information allows for an effective uncertainty reduction in the system reliability evaluation. Results of two numerical examples demonstrate the effectiveness of the proposed method.


2017 ◽  
Vol 11 ◽  
pp. 2178-2186 ◽  
Author(s):  
Alberto Regattieri ◽  
Francesco Piana ◽  
Mauro Gamberi ◽  
Francesco Gabriele Galizia ◽  
Andrea Casto

2010 ◽  
Vol 2010 (HITEC) ◽  
pp. 000199-000206
Author(s):  
David Shaddock ◽  
Vinayak Tilak ◽  
Tan Zhang ◽  
Rui Zhang ◽  
R. Wayne Johnson

Highly accelerated life testing (HALT) is used to quickly assess the reliability of passive components for geothermal applications operating at 300°C ambient temperature. The HALT methodology uses combined stresses to accelerate the failure of capacitors and resistors. This paper describes the test methodology, special fixture designed, and results on capacitors and resistors. Life models for the components are presented. A process to modify component terminations is presented to make them appropriate for 300°C.


Author(s):  
Zhen Hu ◽  
Zissimos P. Mourelatos

Testing of components at higher-than-nominal stress level provides an effective way of reducing the required testing effort for system reliability assessment. Due to various reasons, not all components are directly testable in practice. The missing information of untestable components poses significant challenges to the accurate evaluation of system reliability. This paper proposes a sequential accelerated life testing (SALT) design framework for system reliability assessment of systems with untestable components. In the proposed framework, system-level tests are employed in conjunction with component-level tests to effectively reduce the uncertainty in the system reliability evaluation. To minimize the number of system-level tests which are much more expensive than the component-level tests, the accelerated life testing design is performed sequentially. In each design cycle, testing resources are allocated to component-level or system-level tests according to the uncertainty analysis from system reliability evaluation. The component-level or system-level testing information obtained from the optimized testing plans are then aggregated to obtain the overall system reliability estimate using Bayesian methods. The aggregation of component-level and system-level testing information allows for an effective uncertainty reduction in the system reliability evaluation. Results of two numerical examples demonstrate the effectiveness of the proposed method.


2011 ◽  
Vol 2011 (HITEN) ◽  
pp. 000001-000006
Author(s):  
David Shaddock ◽  
Alexey Vert ◽  
Tan Zhang ◽  
Rui Zhang ◽  
R. Wayne Johnson

Highly accelerated life testing (HALT) is used to quickly assess the reliability of passive components for geothermal applications operating at 300°C ambient temperatures. The HALT methodology uses combined stresses to accelerate the failure of capacitors and resistors. This paper describes the test methodology and results on capacitors and resistors at 300°C and 350°C. Life models for the components are presented.


Author(s):  
Vanderley Vasconcelos ◽  
WELLINGTON SOARES ◽  
Antonio Carlos Lopes da Costa ◽  
Raíssa Oliveira Marques

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