Ultra-Deepwater Blowout Well Control and Abandonment Operations Through Relief Well Under Capping and Containment Scenario After Worst Case Discharge

2015 ◽  
Author(s):  
F. Terra ◽  
A. Lage ◽  
T. Yoiti ◽  
Z. Yuan ◽  
D. Bueno
Keyword(s):  
2014 ◽  
Vol 2014 (1) ◽  
pp. 300323
Author(s):  
Michael Drieu ◽  
Jameson R. Wendell

The development of a Source Control Emergency Response Plan is one of the best ways in which an operator can ensure that the goals of their regional or project-specific Source Control emergency preparedness efforts will be met, if needed. Procedures for handling emergencies are absolutely essential to ensure the protection of life, property, and the environment. This Source Control Emergency Response Plan (SCERP) is based on decades of conventional and subsea well control experience to ensure that the planning efforts and to develop Source Control Emergency Response Planning (SCERP) through field deployment of the system in order to cap a subsea well. The aforementioned experience covers many years of source control, well control and intervention operations in conceivable operational settings and in a variety of geographic locations. The equipment and procedures specified in this SCERP address a “worst case” scenario involving a loss of well control, necessitating the immediate mobilization of intervention equipment and personnel. The primary objective of the SCERP is to establish a process for responding to and safely managing source-control emergencies using a standard, uniform approach. This process includes the following information:emergency contact information and resourcesresponse managementsource-control operational overview with strategic methodologiesorganizational staffing recommendationscheck list to guide groups and unit leaders andkey resource identification The SCERP is not intended to replace sound judgment. Modification of the mobilization plan and intervention strategy may be necessary, depending on circumstances. Subsea source-control events require common sense and professional judgment on the part of the person(s) in charge of operations, and no operation should be undertaken if it involves unreasonable risk to personnel. Additional, a Logistics Plan must be developed to support operations by identifying mobilization guidelines from the stored location for the capping stack and other support equipment necessary to secure the well. Disembarkation of the equipment clearly offering various options with estimated timelines for transporting the equipment by air, ground and sea should also be outlined to ensure equipment arrives timely and safely. Locating vessels and rigs meeting operational requirements will help ensure well incidents are managed and executed within incident-command and other expectations.


2015 ◽  
Vol 27 ◽  
pp. 122-129 ◽  
Author(s):  
Zhaoguang Yuan ◽  
Yahya Hashemian ◽  
Daniel Morrell

Author(s):  
J.D. Geller ◽  
C.R. Herrington

The minimum magnification for which an image can be acquired is determined by the design and implementation of the electron optical column and the scanning and display electronics. It is also a function of the working distance and, possibly, the accelerating voltage. For secondary and backscattered electron images there are usually no other limiting factors. However, for x-ray maps there are further considerations. The energy-dispersive x-ray spectrometers (EDS) have a much larger solid angle of detection that for WDS. They also do not suffer from Bragg’s Law focusing effects which limit the angular range and focusing distance from the diffracting crystal. In practical terms EDS maps can be acquired at the lowest magnification of the SEM, assuming the collimator does not cutoff the x-ray signal. For WDS the focusing properties of the crystal limits the angular range of acceptance of the incident x-radiation. The range is dependent upon the 2d spacing of the crystal, with the acceptance angle increasing with 2d spacing. The natural line width of the x-ray also plays a role. For the metal layered crystals used to diffract soft x-rays, such as Be - O, the minimum magnification is approximately 100X. In the worst case, for the LEF crystal which diffracts Ti - Zn, ˜1000X is the minimum.


2008 ◽  
Author(s):  
Sonia Savelli ◽  
Susan Joslyn ◽  
Limor Nadav-Greenberg ◽  
Queena Chen

Author(s):  
Akira YAMAWAKI ◽  
Hiroshi KAMABE ◽  
Shan LU
Keyword(s):  

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