scholarly journals Manufacturing of diffractive elements in fused silica using high repetition rate femtosecond Yb:KGW laser pulses

2010 ◽  
Vol 50 (1) ◽  
pp. 129-134 ◽  
Author(s):  
D. Paipulas ◽  
V. Kudriašov ◽  
K. Kuršelis ◽  
M. Malinauskas ◽  
V. Sirutkaitis
Keyword(s):  
Repetition Rate ◽  
Laser Pulses ◽  
High Repetition Rate ◽  
Fused Silica ◽  
High Repetition

scholarly journals High repetition-rate wakefield electron source generated by few-millijoule, 30 fs laser pulses on a density downramp

2013 ◽  
Vol 15 (5) ◽  
pp. 053016 ◽  
Author(s):  
Z-H He ◽  
B Hou ◽  
J A Nees ◽  
J H Easter ◽  
J Faure ◽  
...  
Keyword(s):  
Repetition Rate ◽  
Laser Pulses ◽  
High Repetition Rate ◽  
Electron Source ◽  
High Repetition ◽  
Fs Laser

scholarly journals High-Repetition-Rate Femtosecond Laser Processing of Acrylic Intra-Ocular Lenses

Polymers ◽  
2020 ◽  
Vol 12 (1) ◽  
pp. 242 ◽  
Author(s):  
Daniel Sola ◽  
Rafael Cases
Keyword(s):  
Femtosecond Laser ◽  
Repetition Rate ◽  
Laser Processing ◽  
Refractive Index Change ◽  
Laser Pulses ◽  
Processing Parameters ◽  
High Repetition Rate ◽  
Femtosecond Laser Pulses ◽  
Periodic Patterns ◽  
High Repetition

The study of laser processing of acrylic intra-ocular lenses (IOL) by using femtosecond laser pulses delivered at high-repetition rate is presented in this work. An ultra-compact air-cooled femtosecond diode laser (HighQ2-SHG, Spectra-Physics) delivering 250 fs laser pulses at the fixed wavelength of 520 nm with a repetition rate of 63 MHz was used to process the samples. Laser inscription of linear periodic patterns on the surface and inside the acrylic substrates was studied as a function of the processing parameters as well as the optical absorption characteristics of the sample. Scanning Electron Microscopy (SEM) Energy Dispersive X-ray Spectroscopy (EDX), and micro-Raman Spectroscopy were used to evaluate the compositional and microstructural changes induced by the laser radiation in the processed areas. Diffractive characterization was used to assess 1st-order efficiency and the refractive index change.

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