scholarly journals Projective integration schemes for hyperbolic moment equations

2020 ◽  
Vol 0 (0) ◽  
pp. 0-0
Author(s):  
Julian Koellermeier ◽  
◽  
Giovanni Samaey
Keyword(s):  
Moment Equations ◽  
Integration Schemes ◽  
Hyperbolic Moment Equations

scholarly journals Numerical Experiments on the N-Body Problem

1971 ◽  
Vol 10 ◽  
pp. 20-34
Author(s):  
S. J. Aarseth
Keyword(s):  
Initial Conditions ◽  
Equations Of Motion ◽  
Direct Methods ◽  
Moment Equations ◽  
Qualitative Behaviour ◽  
Monte Carlo Techniques ◽  
Cluster Evolution ◽  
Integration Schemes ◽  
N Body Problem ◽  
Different Types

AbstractThis review first discusses the different types of numerical methods available for integrating the equations of motion of N-body systems. It is desirable to supplement ordinary integration schemes with special treatments of close encounters using a two-body perturbation description or introducing regularizing transformations of the co-ordinates and time. Direct methods are at present limited to the study of a few hundred particles but larger systems may be investigated using Monte Carlo techniques or the Boltzmann moment equations.N-body computations have been performed for a whole range of initial conditions and the general results are summarized. Numerical investigations have already clarified a number of important aspects of cluster evolution and the qualitative behaviour of small stellar systems is now quite well understood. Recent theoretical modifications have reduced the disagreement with experiments but further improvements are still needed.

Fixed-End Moment Equations for Continuous Prestressed Concrete Beams

PCI Journal ◽  
1966 ◽  
Vol 11 (1) ◽  
pp. 75-94
Author(s):  
Duryl M. Bailey ◽  
Phil M. Ferguson
Keyword(s):  
Prestressed Concrete ◽  
Concrete Beams ◽  
Moment Equations ◽  
Fixed End

Air Bridge Technology: A Comparison of Novel Interconnect Materials and Integration Schemes for Beyond 45 nm

2003 ◽  
Vol 766 ◽  
Author(s):  
Kenneth Foster ◽  
Joost Waeterloos ◽  
Don Frye ◽  
Steve Froelicher ◽  
Mike Mills
Keyword(s):  
Dielectric Constants ◽  
Advanced Technology ◽  
Effective Dielectric Constant ◽  
Device Performance ◽  
Interlayer Dielectric ◽  
Integration Schemes ◽  
Stepwise Reduction ◽  
Bridge Technology ◽  
Integrated Device ◽  
Compare And Contrast

AbstractThe electronics industry, in a continual drive for improved integrated device performance, is seeking increasingly lower dielectric constants (k) of the insulators that are used as interlayer dielectric (ILD) for advanced logic interconnects. As the industry continually seeks a stepwise reduction of the “effective” dielectric constant (keff), simple extendibility, leads to the consideration of the highest performance possible, namely air bridge technology. In this paper we will discuss requirements, integration schemes and properties for a novel class of materials that has been developed as part of an advanced technology probe into air bridge architecture. We will compare and contrast these potential technology offerings with other existing dense and porous ILD integration options, and show that the choice is neither trivial nor obvious.

Challenges and Benefits of Product-Like SRAM in Technology Development

2011 ◽  
Author(s):  
Felix Beaudoin ◽  
Stephen Lucarini ◽  
Fred Towler ◽  
Stephen Wu ◽  
Zhigang Song ◽  
...  
Keyword(s):  
Technology Development ◽  
Random Access ◽  
Random Access Memory ◽  
Static Random Access Memory ◽  
Development Phase ◽  
High Complexity ◽  
Access Memory ◽  
Integration Schemes ◽  
Front End

Abstract For SRAMs with high logic complexity, hard defects, design debug, and soft defects have to be tackled all at once early on in the technology development while innovative integration schemes in front-end of the line are being validated. This paper presents a case study of a high-complexity static random access memory (SRAM) used during a 32nm technology development phase. The case study addresses several novel and unrelated fail mechanisms on a product-like SRAM. Corrective actions were put in place for several process levels in the back-end of the line, the middle of the line, and the front-end of the line. These process changes were successfully verified by demonstrating a significant reduction of the Vmax and Vmin nest array block fallout, thus allowing the broader development team to continue improving random defectivity.

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