scholarly journals Contextualizing technology in the classroom via remote access: Using space exploration themes and scanning electron microscopy as tools to promote engagement in multidisciplinary geology/chemistry experiments

2018 ◽  
Vol 8 (1) ◽  
pp. 86 ◽  
Author(s):  
Brandon Rodriguez ◽  
Veronica Jaramillo ◽  
Vanessa Wolf ◽  
Esteban Bautista ◽  
Jennifer Portillo ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Low Income ◽  
Space Exploration ◽  
Remote Access ◽  
Scientific Practices ◽  
Technology In The Classroom ◽  
Minority Communities ◽  
Hands On ◽  
K 12 ◽  
Scanning Electron

A multidisciplinary science experiment was performed in K-12 classrooms focusing on the interconnection of technology with geology and chemistry. The engagement and passion for science of over eight hundred students across twenty-one classrooms, utilizing a combination of hands-on activities to study the relationships between Earth and space rock studies, followed by a remote access session wherein students remotely employed the use of a scanning electron microscope (SEM) and energy-dispersive spectroscopy (EDS) to validate their findings was investigated. Participants were from predominantly low-income minority communities, with little exposure to the themes and equipment used, despite being freely available resources.  Students indicated greatly increased interest in scientific practices and careers, as well as a better grasp of the content as a result of the lab and remote access coupling format.  

Remote-Access Scanning Electron Microscopy for K-12 Students: The Bugscope Project Nine Years On

2008 ◽  
Vol 14 (S2) ◽  
pp. 858-859 ◽  
Author(s):  
C Wallace ◽  
C Conway ◽  
AM Ray ◽  
SJ Robinson
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
New Mexico ◽  
Remote Access ◽  
K 12 ◽  
Scanning Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

scholarly journals “What Does That Hair Do?”: Remote-Access Scanning Electron Microscopy and the Bugscope Project

2008 ◽  
Vol 54 (4) ◽  
pp. 232-234
Author(s):  
Ann M. Ray ◽  
Chas Conway ◽  
Umesh Thakkar ◽  
Cate Wallace ◽  
Scott Robinson
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Remote Access ◽  
Scanning Electron

An Undergraduate Laboratory: The Effect of Nanoparticle Self Assembly on the Electrical and Mechanical Properties of Nanocomposites

2006 ◽  
Author(s):  
T. S. Creasy ◽  
J. C. Grunlan ◽  
R. B. Griffin
Keyword(s):  
Electron Microscopy ◽  
Mechanical Properties ◽  
Undergraduate Education ◽  
Self Assembly ◽  
Nanocomposite Films ◽  
Polymer Emulsion ◽  
Random Microstructure ◽  
Hands On ◽  
Undergraduate Laboratory ◽  
Scanning Electron

Recent research into the effect of nanoparticle organization on the electrical properties of nanocomposite films was used to create a hands-on laboratory for undergraduate education in nanomanufacturing. Students created two composites using solvent-based solution and polymer emulsion to show that a non-random microstructure can produce the required electrical conductivity with less added nanoparticles. Students evaluated the materials by 4-point probe and scanning electron microscopy.

scholarly journals Project ExCEL: Web-based Scanning Electron Microscopy for K-12 Education

2002 ◽  
Vol 91 (2) ◽  
pp. 203-210 ◽  
Author(s):  
L.S. CHUMBLEY ◽  
C.P. HARGRAVE ◽  
K. CONSTANT ◽  
B. HAND ◽  
T. ANDRE ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Web Based ◽  
K 12 ◽  
Scanning Electron

scholarly journals Research Grade Remote-Access Scanning Electron Microscopy: The Evolution of the Bugscope Project

2003 ◽  
Vol 9 (S02) ◽  
pp. 1258-1259
Author(s):  
Glenn Fried ◽  
Scott Robinson ◽  
Don Appleman ◽  
Ben Grosser ◽  
Daniel Weber ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Remote Access ◽  
Research Grade ◽  
Scanning Electron

scholarly journals Exploring Nanoscience and Scanning Electron Microscopy in K–12 Classrooms

2015 ◽  
Vol 23 (1) ◽  
pp. 44-47 ◽  
Author(s):  
Tonya Coffey ◽  
Gabor Zsuppan ◽  
Robert Corbin
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
K 12 ◽  
Scanning Electron

Pathogenesis of Human Hair Defects

1974 ◽  
Vol 32 ◽  
pp. 12-13
Author(s):  
P.S. Porter ◽  
T. Aoyagi ◽  
R. Matta
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Human Hair ◽  
Standard Techniques ◽  
Scanning Electron

Using standard techniques of scanning electron microscopy (SEM), over 1000 human hair defects have been studied. In several of the defects, the pathogenesis of the abnormality has been clarified using these techniques. It is the purpose of this paper to present several distinct morphologic abnormalities of hair and to discuss their pathogenesis as elucidated through techniques of scanning electron microscopy.

The Critical Point Drying Method Applied to Scanning Electron Microscopy of L-929 Cells

1970 ◽  
Vol 28 ◽  
pp. 278-279
Author(s):  
Charles TurnbiLL ◽  
Delbert E. Philpott
Keyword(s):  
Electron Microscopy ◽  
Carbon Dioxide ◽  
Surface Tension ◽  
Critical Point ◽  
Freeze Drying ◽  
Attractive Alternative ◽  
Crystal Formation ◽  
Critical Point Drying ◽  
Time Required ◽  
Scanning Electron

The advent of the scanning electron microscope (SCEM) has renewed interest in preparing specimens by avoiding the forces of surface tension. The present method of freeze drying by Boyde and Barger (1969) and Small and Marszalek (1969) does prevent surface tension but ice crystal formation and time required for pumping out the specimen to dryness has discouraged us. We believe an attractive alternative to freeze drying is the critical point method originated by Anderson (1951; for electron microscopy. He avoided surface tension effects during drying by first exchanging the specimen water with alcohol, amy L acetate and then with carbon dioxide. He then selected a specific temperature (36.5°C) and pressure (72 Atm.) at which carbon dioxide would pass from the liquid to the gaseous phase without the effect of surface tension This combination of temperature and, pressure is known as the "critical point" of the Liquid.

Ultrastructural Analysis of the Salivary Glands of Gromphadorhina Portentosa (Schaum)

1977 ◽  
Vol 35 ◽  
pp. 638-639
Author(s):  
P.J. Dailey
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Salivary Glands ◽  
Secretory Vesicles ◽  
The Past ◽  
Transmission Electron ◽  
Means Of Transmission ◽  
Gromphadorhina Portentosa ◽  
Scanning Electron ◽  
Topographical Relief

The structure of insect salivary glands has been extensively investigated during the past decade; however, none have attempted scanning electron microscopy (SEM) in ultrastructural examinations of these secretory organs. This study correlates fine structure by means of SEM cryofractography with that of thin-sectioned epoxy embedded material observed by means of transmission electron microscopy (TEM).Salivary glands of Gromphadorhina portentosa were excised and immediately submerged in cold (4°C) paraformaldehyde-glutaraldehyde fixative1 for 2 hr, washed and post-fixed in 1 per cent 0s04 in phosphosphate buffer (4°C for 2 hr). After ethanolic dehydration half of the samples were embedded in Epon 812 for TEM and half cryofractured and subsequently critical point dried for SEM. Dried specimens were mounted on aluminum stubs and coated with approximately 150 Å of gold in a cold sputtering apparatus.Figure 1 shows a cryofractured plane through a salivary acinus revealing topographical relief of secretory vesicles.

Two- or three-way observations of the identical cell elements within the same sections by LM, TEM and/or SEM

1978 ◽  
Vol 36 (2) ◽  
pp. 82-83 ◽  
Author(s):  
Nakazo Watari ◽  
Yasuaki Hotta ◽  
Yoshio Mabuchi
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Fine Structure ◽  
Light Microscopy ◽  
Thin Sections ◽  
Transmission Electron ◽  
Identical Cell ◽  
Electron Microscopes ◽  
Scanning Electron

It is very useful if we can observe the identical cell elements within the same sections by light microscopy (LM), transmission electron microscopy (TEM) and/or scanning electron microscopy (SEM) sequentially, because, the cell fine structure can not be indicated by LM, while the color is; on the other hand, the cell fine structure can be very easily observed by EM, although its color properties may not. However, there is one problem in that LM requires thick sections of over 1 μm, while EM needs very thin sections of under 100 nm. Recently, we have developed a new method to observe the same cell elements within the same plastic sections using both light and transmission (conventional or high-voltage) electron microscopes.In this paper, we have developed two new observation methods for the identical cell elements within the same sections, both plastic-embedded and paraffin-embedded, using light microscopy, transmission electron microscopy and/or scanning electron microscopy (Fig. 1).

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