scholarly journals Magnetic Field Mapping using Off-Axis Electron Holography in the Transmission Electron Microscope

10.3791/61907 ◽  
2020 ◽  
Author(s):  
Fengshan Zheng ◽  
András Kovács ◽  
Thibaud Denneulin ◽  
Jan Caron ◽  
Teresa Weßels ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Electron Holography ◽  
Field Mapping ◽  
Magnetic Field Mapping ◽  
Transmission Electron

Reconstruction of electron holograms recorded in a non-FEG, non-biprism TEM

1995 ◽  
Vol 53 ◽  
pp. 618-619
Author(s):  
Z.L. Wang
Keyword(s):  
Electron Microscope ◽  
Single Crystal ◽  
Experimental Technique ◽  
Transmission Electron Microscope ◽  
The Other ◽  
Electron Holography ◽  
Transmission Electron ◽  
Coherent Sources ◽  
Imaging Theory ◽  
Normal Specimen

An experimental technique for performing electron holography using a non-FEG, non-biprism transmission electron microscope (TEM) has been introduced by Ru et al. A double stacked specimens, one being a single crystal foil and the other the specimen, are loaded in the normal specimen position in TEM. The single crystal, which is placed onto the specimen, is responsible to produce two beams that are equivalent to two virtual coherent sources illuminating the specimen beneath, thus, permitting electron holography of the specimen. In this paper, the imaging theory of this technique is described. Procedures are introduced for digitally reconstructing the holograms.

Characterization of JEOL 3000f TEM Equipped for Electron Holography

2000 ◽  
Vol 6 (S2) ◽  
pp. 228-229
Author(s):  
M. A. Schofield ◽  
Y. Zhu
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Design Of Experiment ◽  
Electron Holography ◽  
Fringe Spacing ◽  
Interference Fringes ◽  
Transmission Electron ◽  
Careful Design

Quantitative off-axis electron holography in a transmission electron microscope (TEM) requires careful design of experiment specific to instrumental characteristics. For example, the spatial resolution desired for a particular holography experiment imposes requirements on the spacing of the interference fringes to be recorded. This fringe spacing depends upon the geometric configuration of the TEM/electron biprism system, which is experimentally fixed, but also upon the voltage applied to the biprism wire of the holography unit, which is experimentally adjustable. Hence, knowledge of the holographic interference fringe spacing as a function of applied voltage to the electron biprism is essential to the design of a specific holography experiment. Furthermore, additional instrumental parameters, such as the coherence and virtual size of the electron source, for example, affect the quality of recorded holograms through their effect on the contrast of the holographic fringes.

A Simple Method of the Electric/Magnetic Field Observation by a Conventional Transmission Electron Microscope

2005 ◽  
Vol 475-479 ◽  
pp. 4029-4034 ◽  
Author(s):  
Katsuhiro Sasaki ◽  
Hiroyasu Saka
Keyword(s):  
Magnetic Field ◽  
Electron Microscope ◽  
Field Distribution ◽  
Transmission Electron Microscope ◽  
Electrostatic Field ◽  
Field Observation ◽  
Simple Method ◽  
Transmission Electron ◽  
Novel Method ◽  
Conventional Transmission Electron Microscope

A novel method to observe the electrostatic field distribution with a conventional transmission electron microscope has been developed. The method allows measurements of a potential difference less than 1V/µm. This method can be performed in any kind of conventional transmission electron microscope and applied to the observation of the electric/magnetic field at the level of a specimen.

Aberration Correction and Electron Holography

2010 ◽  
Vol 16 (4) ◽  
pp. 434-440 ◽  
Author(s):  
Hannes Lichte ◽  
Martin Linck ◽  
Dorin Geiger ◽  
Michael Lehmann
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Fine Tuning ◽  
Electron Holography ◽  
Aberration Correction ◽  
Quantitative Interpretation ◽  
A Posteriori ◽  
Atomic Structures ◽  
Basic Reason ◽  
Transmission Electron

AbstractElectron holography has been shown to allow a posteriori aberration correction. Therefore, an aberration corrector in the transmission electron microscope does not seem to be needed with electron holography to achieve atomic lateral resolution. However, to reach a signal resolution sufficient for detecting single light atoms and very small interatomic fields, the aberration corrector has turned out to be very helpful. The basic reason is the optimized use of the limited number of “coherent” electrons that are provided by the electron source, as described by the brightness. Finally, quantitative interpretation of atomic structures benefits from the holographic facilities of fine-tuning of the aberration coefficients a posteriori and from evaluating both amplitude and phase.

Low Voltage Point Projection Microscopy and Time of Flight Stm - Two New Microscopies

1994 ◽  
Vol 332 ◽  
Author(s):  
J.C.H. Spence ◽  
W. Qian ◽  
W. Lo ◽  
S. Mo ◽  
U. Knipping ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Transmission Electron Microscope ◽  
Low Voltage ◽  
Time Of Flight ◽  
Atomic Clusters ◽  
Electron Holography ◽  
Transmission Electron ◽  
Point Projection ◽  
Projection Field

ABSTRACTThe design of a low voltage point-projection field-emission transmission electron microscope is described and images showing 0.7nm resolution at 100 volts are given. A scheme for low voltage reflection electron holography from bulk samples in UHV is outlined. A new STM is described which allows atomic clusters to be transferred onto the tip, then introduced into a time-of-flight analyser for species identification.

Sign in / Sign up

Export Citation Format

Share Document