scholarly journals IR and electrochemical synthesis and characterization of thin films of PEDOT grown on platinum single crystal electrodes in [EMMIM]Tf2N ionic liquid

2015 ◽  
Vol 11 ◽  
pp. 348-357 ◽  
Author(s):  
Andrea P Sandoval ◽  
Marco F Suárez-Herrera ◽  
Juan M Feliu

Thin films of PEDOT synthesized on platinum single electrodes in contact with the ionic liquid 1-ethyl-2,3-dimethylimidazolium triflimide ([EMMIM]Tf2N) were studied by cyclic voltammetry, chronoamperometry, infrared spectroscopy and atomic force microscopy. It was found that the polymer grows faster on Pt(111) than on Pt(110) or Pt(100) and that the redox reactions associated with the PEDOT p-doping process are much more reversible in [EMMIM]Tf2N than in acetonitrile. Finally, the ion exchange and charge carriers’ formation during the p-doping reaction of PEDOT were studied using in situ FTIR spectroscopy.

2014 ◽  
Vol 13 (1) ◽  
Author(s):  
Corneliu Sergiu Stan ◽  
Marcel Popa ◽  
Marius Olariu ◽  
Marius Sebastian Secula

AbstractThis paper reports the synthesis and investigation of a polymer composite based on poly(4-styrenesulfonic acid) (PSSA) and polyaniline (PANI) directly obtained in an aqueous PSSA medium, with improved conductivity and solubility in polar solvents. The oxidative polymerization reaction of aniline takes place in-situ with PSSA as protonating agent. The synthesis was tested at three PSSA/PANI molar ratios, an intense green colored aqueous composite solution being obtained in each case. For comparison purposes, commercially available polyaniline and PSSA were also investigated. PSSA-PANI composites, PANI and PSSA were investigated through thermal analysis, Fourier Transform Infrared Spectroscopy (FTIR) and Raman spectroscopy. Thin films of PSSA/PANI complex were spin coated on glass substrates which were further investigated through Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). Also, thin films of PSSA-PANI were deposited on interdigitated electrodes for dielectric measurements.


1999 ◽  
Vol 353 (1-2) ◽  
pp. 194-200 ◽  
Author(s):  
C. Coupeau ◽  
J.F. Naud ◽  
F. Cleymand ◽  
P. Goudeau ◽  
J. Grilhé

2013 ◽  
Vol 22 ◽  
pp. 85-93
Author(s):  
Shuang Yi Liu ◽  
Min Min Tang ◽  
Ai Kah Soh ◽  
Liang Hong

In-situ characterization of the mechanical behavior of geckos spatula has been carried out in detail using multi-mode AFM system. Combining successful application of a novel AFM mode, i.e. Harmonix microscopy, the more detail elastic properties of spatula is brought to light. The results obtained show the variation of the mechanical properties on the hierarchical level of a seta, even for the different locations, pad and stalk of the spatula. A model, which has been validated using the existing experimental data and phenomena as well as theoretical predictions for geckos adhesion, crawling and self-cleaning of spatulae, is proposed in this paper. Through contrast of adhesive and craw ability of the gecko on the surfaces with different surface roughness, and measurement of the surface adhesive behaviors of Teflon, the most effective adhesion of the gecko is more dependent on the intrinsic properties of the surface which is adhered.


2018 ◽  
Vol 2018 ◽  
pp. 1-5 ◽  
Author(s):  
Hee-Youb Song ◽  
Soon-Ki Jeong

Interfacial reactions strongly influence the performance of lithium-ion batteries, with the main interfacial reaction between graphite and propylene carbonate- (PC-) based electrolytes corresponding to solvent cointercalation. Herein, the redox reactions of solvated lithium ions occurring at the graphite interface in 1 M·LiClO4/PC were probed by chronopotentiometry, in situ atomic force microscopy (AFM), and in situ Raman spectroscopy. The obtained results revealed that high coulombic efficiency (97.5%) can be achieved at high current density, additionally showing the strong influence of charge capacity on the above redox reactions. Moreover, AFM imaging indicated the occurrence of solvent cointercalation during the first reduction, as reflected by the presence of hills and blisters on the basal plane of highly oriented pyrolytic graphite subjected to the above process.


Nano Letters ◽  
2012 ◽  
Vol 12 (8) ◽  
pp. 4110-4116 ◽  
Author(s):  
P. T. Araujo ◽  
N. M. Barbosa Neto ◽  
H. Chacham ◽  
S. S. Carara ◽  
J. S. Soares ◽  
...  

2021 ◽  
Vol 22 (12) ◽  
pp. 6472
Author(s):  
Beata Kaczmarek-Szczepańska ◽  
Marcin Wekwejt ◽  
Olha Mazur ◽  
Lidia Zasada ◽  
Anna Pałubicka ◽  
...  

This paper concerns the physicochemical properties of chitosan/phenolic acid thin films irradiated by ultraviolet radiation with wavelengths between 200 and 290 nm (UVC) light. We investigated the preparation and characterization of thin films based on chitosan (CTS) with tannic (TA), caffeic (CA) and ferulic acid (FA) addition as potential food-packaging materials. Such materials were then exposed to the UVC light (254 nm) for 1 and 2 h to perform the sterilization process. Different properties of thin films before and after irradiation were determined by various methods such as Fourier transform infrared spectroscopy (FTIR), scanning electron microscopy (SEM), atomic force microscopy (AFM), differential scanning calorimeter (DSC), mechanical properties and by the surface free energy determination. Moreover, the antimicrobial activity of the films and their potential to reduce the risk of contamination was assessed. The results showed that the phenolic acid improving properties of chitosan-based films, short UVC radiation may be used as sterilization method for those films, and also that the addition of ferulic acid obtains effective antimicrobial activity, which have great benefit for food packing applications.


1995 ◽  
Vol 378 ◽  
Author(s):  
Art J. Nelson ◽  
K. Sinha ◽  
John Moreland

AbstractSynchrotron radiation soft x-ray photoemission spectroscopy was used to investigate the development of the electronic structure at the CdS/Cu2Se heterojunction interface. Cu2−xSe layers were deposited on GaAs (100) by molecular beam epitaxy from Cu2Se sources. Raman spectra reveal a strong peak at 270 cm−1, indicative of the Cu2−xSe phase. Atomic force microscopy reveals uniaxial growth in a preferred (100) orientation. CdS overlayers were then deposited in-situ, at room temperature, in steps on these epilayers. Photoemission measurements were acquired after each growth in order to observe changes in the valence band electronic structure as well as changes in the Se3d and Cd4d core lines. The results were used to correlate the interfacial chemistry with the electronic structure and to directly determine the CdS/Cu2−xSe and heterojunction valence band discontinuity and the consequent heterojunction band diagram. These results are compared to the valence band offset (ΔEv) for the CdS/CuInSe2 heterojunction interface.


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