scholarly journals Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor

2013 ◽  
Vol 4 ◽  
pp. 10-19 ◽  
Author(s):  
Julian Stirling ◽  
Gordon A Shaw
Keyword(s):  
Mathematical Model ◽  
Atomic Force Microscopy ◽  
Dynamic Properties ◽  
Force Spectroscopy ◽  
Lateral Component ◽  
Force Microscopy ◽  
Atomic Force

In qPlus atomic force microscopy the tip length can in principle approach the length of the cantilever. We present a detailed mathematical model of the effects this has on the dynamic properties of the qPlus sensor. The resulting, experimentally confirmed motion of the tip apex is shown to have a large lateral component, raising interesting questions for both calibration and force-spectroscopy measurements.

Going Vertical To Improve the Accuracy of Atomic Force Microscopy Based Single-Molecule Force Spectroscopy

ACS Nano ◽  
2017 ◽  
Vol 12 (1) ◽  
pp. 198-207 ◽  
Author(s):  
Robert Walder ◽  
William J. Van Patten ◽  
Ayush Adhikari ◽  
Thomas T. Perkins
Keyword(s):  
Atomic Force Microscopy ◽  
Single Molecule ◽  
Force Spectroscopy ◽  
Single Molecule Force Spectroscopy ◽  
Force Microscopy ◽  
Atomic Force

Dynamic-force spectroscopy measurement with precise force control using atomic-force microscopy probe

2006 ◽  
Vol 100 (7) ◽  
pp. 074315 ◽  
Author(s):  
Osamu Takeuchi ◽  
Takaaki Miyakoshi ◽  
Atsushi Taninaka ◽  
Katsunori Tanaka ◽  
Daichi Cho ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Control ◽  
Force Spectroscopy ◽  
Dynamic Force ◽  
Atomic Force Microscopy Probe ◽  
Dynamic Force Spectroscopy ◽  
Force Microscopy ◽  
Spectroscopy Measurement ◽  
Atomic Force

scholarly journals Atomic Force Microscopy as a Tool for the Investigation of Living Cells

Medicina ◽  
2013 ◽  
Vol 49 (4) ◽  
pp. 25 ◽  
Author(s):  
Inga Morkvėnaitė-Vilkončienė ◽  
Almira Ramanavičienė ◽  
Arūnas Ramanavičius
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscopy ◽  
High Resolution ◽  
Force Spectroscopy ◽  
Living Cells ◽  
Fixation Method ◽  
Cell Preparation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Cell Fixation

Atomic force microscopy is a valuable and useful tool for the imaging and investigation of living cells in their natural environment at high resolution. Procedures applied to living cell preparation before measurements should be adapted individually for different kinds of cells and for the desired measurement technique. Different ways of cell immobilization, such as chemical fixation on the surface, entrapment in the pores of a membrane, or growing them directly on glass cover slips or on plastic substrates, result in the distortion or appearance of artifacts in atomic force microscopy images. Cell fixation allows the multiple use of samples and storage for a prolonged period; it also increases the resolution of imaging. Different atomic force microscopy modes are used for the imaging and analysis of living cells. The contact mode is the best for cell imaging because of high resolution, but it is usually based on the following: (i) image formation at low interaction force, (ii) low scanning speed, and (iii) usage of “soft,” low resolution cantilevers. The tapping mode allows a cell to behave like a very solid material, and destructive shear forces are minimized, but imaging in liquid is difficult. The force spectroscopy mode is used for measuring the mechanical properties of cells; however, obtained results strongly depend on the cell fixation method. In this paper, the application of 3 atomic force microscopy modes including (i) contact, (ii) tapping, and (iii) force spectroscopy for the investigation of cells is described. The possibilities of cell preparation for the measurements, imaging, and determination of mechanical properties of cells are provided. The applicability of atomic force microscopy to diagnostics and other biomedical purposes is discussed.

High-speed atomic force microscopy: Imaging and force spectroscopy

FEBS Letters ◽  
2014 ◽  
Vol 588 (19) ◽  
pp. 3631-3638 ◽  
Author(s):  
Frédéric Eghiaian ◽  
Felix Rico ◽  
Adai Colom ◽  
Ignacio Casuso ◽  
Simon Scheuring
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
Force Spectroscopy ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging
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