scholarly journals Manipulation of gold colloidal nanoparticles with atomic force microscopy in dynamic mode: influence of particle–substrate chemistry and morphology, and of operating conditions

2011 ◽  
Vol 2 ◽  
pp. 85-98 ◽  
Author(s):  
Samer Darwich ◽  
Karine Mougin ◽  
Akshata Rao ◽  
Enrico Gnecco ◽  
Shrisudersan Jayaraman ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Operating Conditions ◽  
Critical Parameters ◽  
Dynamic Mode ◽  
Ambient Conditions ◽  
Force Microscopy ◽  
Substrate Structure ◽  
Atomic Force ◽  
Nanoscale Interactions ◽  
Lower Mobility

One key component in the assembly of nanoparticles is their precise positioning to enable the creation of new complex nano-objects. Controlling the nanoscale interactions is crucial for the prediction and understanding of the behaviour of nanoparticles (NPs) during their assembly. In the present work, we have manipulated bare and functionalized gold nanoparticles on flat and patterned silicon and silicon coated substrates with dynamic atomic force microscopy (AFM). Under ambient conditions, the particles adhere to silicon until a critical drive amplitude is reached by oscillations of the probing tip. Beyond that threshold, the particles start to follow different directions, depending on their geometry, size and adhesion to the substrate. Higher and respectively, lower mobility was observed when the gold particles were coated with methyl (–CH3) and hydroxyl (–OH) terminated thiol groups. This major result suggests that the adhesion of the particles to the substrate is strongly reduced by the presence of hydrophobic interfaces. The influence of critical parameters on the manipulation was investigated and discussed viz. the shape, size and grafting of the NPs, as well as the surface chemistry and the patterning of the substrate, and finally the operating conditions (temperature, humidity and scan velocity). Whereas the operating conditions and substrate structure are shown to have a strong effect on the mobility of the particles, we did not find any differences when manipulating ordered vs random distributed particles.

Chromic Polydiacetylene Single Crystals: Atomic Force Microscopy Studies

1995 ◽  
Vol 413 ◽  
Author(s):  
V. Shivshankar ◽  
C. Sung ◽  
J. Kumar ◽  
S. K. Tripathy ◽  
D. J. Sandman
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Single Crystals ◽  
Ambient Conditions ◽  
Free Standing ◽  
Force Microscopy ◽  
Sensor Performance ◽  
Atomic Force ◽  
Variable Surface

ABSTRACTWe have studied the surface morphology of free standing single crystals of thermochromic polydiacetylenes (PDAs), namely, ETCD and IPUDO (respectively, the ethyl and isopropyl urethanes of 5,7-dodecadiyn-1,12-diol), by Atomic Force Microscopy (AFM) under ambient conditions. Micron scale as well as molecularly resolved images were obtained. The micron scale images indicate a variable surface, and the molecularly resolved images show a well defined 2-D lattice that is interpreted in terms of molecular models and known crystallographic data. Thereby information about surface morphology, which is crucial to potential optical device or chromic sensor performance is available. We also report the observation of a “macroscopic shattering” of the IPUDO monomer crystal during in-situ UV polymerization studies.

Conducting Polymer nanoComposites (CPC): Nanocharacterisation of layer by layer sprayed PMMA-CNT vapour sensors by Atomic force Microscopy in current Sensing Mode (CS-AFM)

2008 ◽  
Vol 1143 ◽  
Author(s):  
Bijandra Kumar ◽  
Mickaël Castro ◽  
Jianbo Lu ◽  
Jean-François Feller
Keyword(s):  
Atomic Force Microscopy ◽  
Spray Deposition ◽  
Dynamic Mode ◽  
Layer By Layer ◽  
Initial State ◽  
Contact Mode ◽  
Current Sensing ◽  
Multi Wall Carbon Nanotubes ◽  
Force Microscopy ◽  
Atomic Force

ABSTRACTOrganic vapour sensors based on poly (methylmethacrylate)-multi-wall carbon nanotubes (PMMA-CNT) conductive polymer nanocomposite (CPC) were developed via layer by layer technique by spray deposition. CPC Sensors were exposed to three different classes of solvents (chloroform, methanol and water) and their chemo-electrical properties were followed as a function of CNTcontent in dynamic mode. Detection time was found to be shorter than that necessary for full recovery of initial state. CNT real three dimensional network has been visualized by Atomic force microscopy in a field assisted intermittent contact mode. More interestingly real conductive network system and electrical ability of CPC have been explored by current-sensing atomic force microscopy (CS-AFM). Realistic effect of voltage on electrical conductivity has been found linear.

Atomic Force Microscopy

2021 ◽  
pp. 379-400
Author(s):  
C. Julian Chen
Keyword(s):  
Atomic Force Microscopy ◽  
Entire Range ◽  
Tunneling Current ◽  
Vibrational Amplitude ◽  
Dynamic Mode ◽  
Dynamic Force ◽  
Force Detection ◽  
Static Mode ◽  
Force Microscopy ◽  
Atomic Force

This chapter discusses atomic force microscopy (AFM), focusing on the methods for atomic force detection. Although the force detection always requires a cantilever, there are two types of modes: the static mode and the dynamic mode. The general design and the typical method of manufacturing of the cantilevers are discussed. Two popular methods of static force detection are presented. The popular dynamic-force detection method, the tapping mode is described, especially the methods in liquids. The non-contact AFM, which has achieved atomic resolution in the weak attractive force regime, is discussed in detail. An elementary and transparent analysis of the principles, including the frequency shift, the second harmonics, and the average tunneling current, is presented. It requires only Newton’s equation and Fourier analysis, and the final results are analyzed over the entire range of vibrational amplitude. The implementation is briefly discussed.

How to measure energy dissipation in dynamic mode atomic force microscopy

1999 ◽  
Vol 140 (3-4) ◽  
pp. 376-382 ◽  
Author(s):  
B. Anczykowski ◽  
B. Gotsmann ◽  
H. Fuchs ◽  
J.P. Cleveland ◽  
V.B. Elings
Keyword(s):  
Atomic Force Microscopy ◽  
Energy Dissipation ◽  
Dynamic Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

Direct Writing on Phosphate Glass Using Atomic Force Microscopy for Rapid Fabrication of Nanostructures

2016 ◽  
Author(s):  
Shama F. Barna ◽  
Kyle E. Jacobs ◽  
Glennys A. Mensing ◽  
Placid M. Ferreira
Keyword(s):  
Atomic Force Microscopy ◽  
Ion Beam ◽  
Soft Materials ◽  
Constant Current ◽  
Silver Nanostructures ◽  
Direct Writing ◽  
Ambient Conditions ◽  
Commercial Development ◽  
Force Microscopy ◽  
Atomic Force

Rapid and cost effective fabrication of nanostructures is critical for experimental exploration and translation of results for commercial development. While conventional techniques such as E-beam or Focused Ion beam lithography serve some prototyping needs for nano-scale experimentations, cost and rate considerations prohibit use for manufacturing. Specialized lithographic processes [e.g. nanosphere lithography or interference lithography] are also powerful tools in creating nanostructures but provide limited shapes, positioning and size control of nanostructures. In this work, we demonstrated a liquid-free and mask-less electrochemical writing approach using atomic force microscopy (AFM) that is capable of making arbitrary shapes of silver nanostructures in seconds on a solid state super-ionic (AgI)x (AgPO3)(1−x) glass. Under ambient conditions. silver is extracted selectively on super-ionic (AgI)x (AgPO3)(1−x) glass surface by negatively biasing an AFM probe relative to an Ag film counter electrode. Both voltage controlled and current controlled writings demonstrated localized extraction of silver. The current controlled approach is shown to be the preferred writing approach to make repeatable and uniform patterns of silver on (AgI)x AgPO3(1−x), where x represents the mole fraction of AgI in the mixture and the control parameter that tunes the conductivity of the sample. We demonstrated current controlled printing of silver on two different compositions of the material (i.e. (AgI)0.125 (AgPO3 )0.875 and (AgI)0.25(AgPO3)0.75 ). Depending on the magnitude of the constant current and tip speed, line-width of the silver pattern can be ∼150 nm. The length of these patterns are limited to the maximum distance the tip can be moved using the AFM position controls. The substrate being optically transparent allows the use of this writing technique for rapid prototyping plasmonic devices. By using the patterned substrate as a template for replica molding of soft materials such as polydimethylsiloxane (PDMS), this writing technique can also be utilized for high throughput nano-channel fabrication in biofluidics and microfluidics devices.

scholarly journals High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approach

2017 ◽  
Vol 8 ◽  
pp. 1563-1570 ◽  
Author(s):  
Juan Ren ◽  
Qingze Zou
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
Interaction Force ◽  
Dynamic Mode ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging ◽  
Mode Tm ◽  
Mode Atomic Force Microscopy

Adaptive multiloop-mode (AMLM) imaging to substantially increase (over an order of magnitude) the speed of tapping-mode (TM) imaging is tested and evaluated through imaging three largely different heterogeneous polymer samples in experiments. It has been demonstrated that AMLM imaging, through the combination of a suite of advanced control techniques, is promising to achieve high-speed dynamic-mode atomic force microscopy imaging. The performance, usability, and robustness of the AMLM in various imaging applications, however, is yet to be assessed. In this work, three benchmark polymer samples, including a PS–LDPE sample, an SBS sample, and a Celgard sample, differing in feature size and stiffness of two orders of magnitude, are imaged using the AMLM technique at high-speeds of 25 Hz and 20 Hz, respectively. The comparison of the images obtained to those obtained by using TM imaging at scan rates of 1 Hz and 2 Hz showed that the quality of the 25 Hz and 20 Hz AMLM imaging is at the same level of that of the 1 Hz TM imaging, while the tip–sample interaction force is substantially smaller than that of the 2 Hz TM imaging.

scholarly journals Drive-amplitude-modulation atomic force microscopy: From vacuum to liquids

2012 ◽  
Vol 3 ◽  
pp. 336-344 ◽  
Author(s):  
Miriam Jaafar ◽  
David Martínez-Martín ◽  
Mariano Cuenca ◽  
John Melcher ◽  
Arvind Raman ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Amplitude Modulation ◽  
Frequency Modulation ◽  
Driving Force ◽  
Oscillation Amplitude ◽  
Dynamic Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Modulation Mode ◽  
Feedback Scheme

We introduce drive-amplitude-modulation atomic force microscopy as a dynamic mode with outstanding performance in all environments from vacuum to liquids. As with frequency modulation, the new mode follows a feedback scheme with two nested loops: The first keeps the cantilever oscillation amplitude constant by regulating the driving force, and the second uses the driving force as the feedback variable for topography. Additionally, a phase-locked loop can be used as a parallel feedback allowing separation of the conservative and nonconservative interactions. We describe the basis of this mode and present some examples of its performance in three different environments. Drive-amplutide modulation is a very stable, intuitive and easy to use mode that is free of the feedback instability associated with the noncontact-to-contact transition that occurs in the frequency-modulation mode.

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