Deep-nanometer-scale terahertz spectroscopy using a transistor geometry with metal nanogap electrodes

2021 ◽  
Vol 2 (0) ◽  
pp. 1
Author(s):  
Ya Zhang ◽  
Shaoqing Du ◽  
Kazuhiko Hirakawa
Keyword(s):  
Terahertz Spectroscopy ◽  
Nanometer Scale ◽  
Nanogap Electrodes

Analyzing reactions of single mechanoenzyme molecules by light microscopy

1992 ◽  
Vol 50 (1) ◽  
pp. 426-427
Author(s):  
Jeff Gelles
Keyword(s):  
Image Processing ◽  
Reaction Mechanisms ◽  
Transient State ◽  
Nanometer Scale ◽  
Reaction Intermediates ◽  
Enzyme Molecule ◽  
Directed Movement ◽  
Enzyme Molecules ◽  
Individual Enzyme ◽  
Single Reaction

Mechanoenzymes are enzymes which use a chemical reaction to power directed movement along biological polymer. Such enzymes include the cytoskeletal motors (e.g., myosins, dyneins, and kinesins) as well as nucleic acid polymerases and helicases. A single catalytic turnover of a mechanoenzyme moves the enzyme molecule along the polymer a distance on the order of 10−9 m We have developed light microscope and digital image processing methods to detect and measure nanometer-scale motions driven by single mechanoenzyme molecules. These techniques enable one to monitor the occurrence of single reaction steps and to measure the lifetimes of reaction intermediates in individual enzyme molecules. This information can be used to elucidate reaction mechanisms and determine microscopic rate constants. Such an approach circumvents difficulties encountered in the use of traditional transient-state kinetics techniques to examine mechanoenzyme reaction mechanisms.

Microstructural characterization of sol-gel coating on PET films

1994 ◽  
Vol 52 ◽  
pp. 886-887
Author(s):  
R. T. Chen ◽  
R.A. Norwood
Keyword(s):  
Ion Beam ◽  
Sol Gel ◽  
Industrial Applications ◽  
Hard Coatings ◽  
Nanometer Scale ◽  
Ion Beam Sputtering ◽  
Process Technology ◽  
Refractive Index Measurement ◽  
Organically Modified ◽  
Pet Films

Sol-gel processing has been used to control the structure of a material on a nanometer scale in preparing advanced ceramics and glasses. Film coating using the sol-gel process was also found to be a viable process technology in applications such as optical, porous, antireflection and hard coatings. In this study, organically modified silicate (Ormosil) coatings are applied to PET films for various industrial applications. Sol-gel materials are known to exhibit nanometer scale structures which havepreviously been characterized by small-angle X-ray scattering (SAXS), neutron scattering and light scattering. Imaging of the ultrafine sol-gel structures has also been performed using an ultrahigh resolution replica/TEM technique. The objective of this study was to evaluate the ultrafine structures inthe sol gel coatings using a direct imaging technique: atomic force microscopy (AFM). In addition, correlation of microstructures with processing parameters, coating density and other physical properties will be discussed.The materials evaluated are organically modified silicate coatings on PET film substrates. Refractive index measurement by the prism coupling method was used to assess density of the sol-gel coating.AFM imaging was performed on a Nanoscope III AFM (by Digital Instruments) using constant force mode. Solgel coating samples coated with a thin layer of Ft (by ion beam sputtering) were also examined by STM in order to confirm the structures observed in the contact type AFM. In addition, to compare the previous results, sol-gel powder samples were also prepared by ultrasonication followed by Pt/Au shadowing and examined using a JEOL 100CX TEM.

High resolution terahertz spectroscopy for analytical applications

2020 ◽  
Vol 63 (7) ◽  
pp. 708-720 ◽  
Author(s):  
V L Vaks ◽  
V A Anfertev ◽  
V Yu Balakirev ◽  
S A Basov ◽  
E G Domracheva ◽  
...  
Keyword(s):  
High Resolution ◽  
Terahertz Spectroscopy ◽  
Analytical Applications

Nanometer-scale spontaneous vibrations in a deployable truss under mechanical loading

AIAA Journal ◽  
2002 ◽  
Vol 40 ◽  
pp. 2070-2076
Author(s):  
L. M. R. Hardaway ◽  
L. D. Peterson
Keyword(s):  
Mechanical Loading ◽  
Nanometer Scale

Continuous-wave Terahertz Spectroscopy System Based on Photodiodes

PIERS Online ◽  
2010 ◽  
Vol 6 (4) ◽  
pp. 390-394 ◽  
Author(s):  
Tadao Nagatsuma ◽  
Akira Kaino ◽  
Shintaro Hisatake ◽  
Katsuhiro Ajito ◽  
Ho-Jin Song ◽  
...  
Keyword(s):  
Continuous Wave ◽  
Terahertz Spectroscopy ◽  
Spectroscopy System

Applications of Nanotechnology for Textile Products: A Review

2018 ◽  
Vol 1 (3) ◽  
pp. 15-22
Author(s):  
Nemailal Tarafder
Keyword(s):  
Textile Industry ◽  
Industrial Revolution ◽  
Nanometer Scale ◽  
Cotton Industry ◽  
Future Success ◽  
The Future ◽  
Properties Of Materials ◽  
Textile Products

The fundamentals of nanotechnology lie in the fact that the properties of materials drastically change when their dimensions are reduced to nanometer scale. Nanotextiles can be produced by a variety of methods. The use of nanotechnology in the textile industry has increased rapidly due to its unique and valuable properties. Changed or improved properties with nanotechnology can provide new or enhanced functionalities. Nanotechnology is a growing interdisciplinary technology and seen as a new industrial revolution. The future success of nanotechnology in textile applications lies in the areas where new principles will be combined into durable and multi-functional textile systems without compromising the inherent properties. The advances in nanotechnology have created enormous opportunities and challenges for the textile industry, including the cotton industry.

Failure Analysis and Defect Inspection of Electronic Devices by High-Resolution Cathodoluminescence

2017 ◽  
Author(s):  
C. Monachon ◽  
M.S. Zielinski ◽  
D. Gachet ◽  
S. Sonderegger ◽  
S. Muckenhirn ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Electronic Materials ◽  
Electronic Devices ◽  
Optical Emission ◽  
Large Field ◽  
Nanometer Scale ◽  
Defect Analysis ◽  
Defect Inspection ◽  
Spectrally Resolved ◽  
Non Destructive

Abstract Quantitative cathodoluminescence (CL) microscopy is a new optical spectroscopy technique that measures electron beam-induced optical emission over large field of view with a spatial resolution close to that of a scanning electron microscope (SEM). Correlation of surface morphology (SE contrast) with spectrally resolved and highly material composition sensitive CL emission opens a new pathway in non-destructive failure and defect analysis at the nanometer scale. Here we present application of a modern CL microscope in defect and homogeneity metrology, as well as failure analysis in semiconducting electronic materials

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